1997 2nd International Workshop on Statistical Metrology, June 8, 1997, Kyoto

• Pubblicazione: [Place of publication not identified], : Institute of Electrical and Electronics Engineers, 1997
• Soggetto topico: Semiconductors - Statistical methods - Characterization - Congresses; Semiconductors - Measurement - Congresses; Electrical & Computer Engineering; Electrical Engineering; Engineering & Applied Sciences
• Note generali: Bibliographic Level Mode of Issuance: Monograph
• Titolo autorizzato: 1997 2nd International Workshop on Statistical Metrology, June 8, 1997, Kyoto
• Formato: Materiale a stampa
• Livello bibliografico: Monografia
• Lingua di pubblicazione: Inglese
• Record Nr.: 996217395003316
• Lo trovi qui: Univ. di Salerno