In-situ electron microscopy at high resolution [[electronic resource] /] / editor, Florian Banhart

• Pubblicazione: Hackensack, NJ, : World Scientific, c2008
• Descrizione fisica: 1 online resource (318 p.)
• Disciplina: 502.825
• Soggetto topico: Electron microscopy - Technique; High resolution electron microscopy
• Altri autori: BanhartFlorian
• Note generali: Description based upon print version of record.
• Nota di bibliografia: Includes bibliographical references and index.
• Nota di contenuto: CONTENTS; Chapter 1 Introduction to In-Situ Electron Microscopy Florian Banhart; 1. Definition and History of In-Situ Electron Microscopy; 2. Modern In-Situ Electron Microscopy; 3. The Techniques of In-Situ Electron Microscopy; 4. Limitations of in-situ Electron Microscopy and Future Demands; 5. Concept of this Book; References; Chapter 2 Observation of Dynamic Processes using Environmental Transmission or Scanning Transmission Electron Microscopy Renu Sharma; 1. Introduction; 2. Environmental Scanning/Transmission Electron Microscope; 2.1. Windowed cell; 2.2. Differential pumping systems ; 3. Experimental Planning Strategies5. Data Collection; 6. Applications; 6.1. Nanoscale characterization during synthesis; 6.1.1. Effect of the environment on nanoparticle morphology; 6.1.2. Effect of support on nanoparticle morphology; 6.1.3. Nanoparticle synthesis by de-hydroxylation; 6.1.3. Chemical vapor deposition (CVD); 6.2. Effect of environment on catalytic activity; 6.3. Effect of humidity on aerosol particles; 7. Limitations; Conclusions; Acknowledgments; References; Chapter 3 In-Situ High-Resolution Observation of Solid-Solid, Solid-Liquid and Solid-Gas Reactions Hiroyasu Saka ; 1. Introduction2. Specimen-Heating Holders; 3. Solid-Solid Reactions; 3.1. Formation of SiC via solid-state reaction and behaviour of grain boundary in SiC; 3.2. Vibration of a grain boundary and an interface; 4. Solid-Liquid Reactions; 4.1. Melting of metals with small dimensions; 4.1.1. Melting of embedded particles; 4.1.2. Melting of a wedge-shaped crystal; 4.1.3. Melting of a conical needle; 4.2. Solid-liquid interfaces; 4.2.1. Pure metals; 4.2.2. Alumina; 4.2.3. Al-Si alloy; 4.3. Wetting of liquid metals on non-metallic substrates; 4.3.1. Au liquid on Si substrate; 4.3.2. Al on Si ; 4.3.3. Size dependence of the wetting angle of liquid metals on non-metallic substrates5. Solid-Gas Reactions; 5.1. Oxidation of Si; 5.2. Three-way catalyst; 6. Conclusions and Outlook; Acknowledgments; References; Chapter 4 In-Situ Transmission Electron Microscopy: Nanoindentation and Straining Experiments Wouter A. Soer and Jeff T. De Hosson; 1. Introduction; 2. In-Situ Nanoindentation in a TEM; 2.1. Stage design; 2.2. Specimen geometry; 3. Experimental Procedure; 3.1. Specimen preparation and microstructure; 3.2. In-situ and exsitu nanoindentation experiments ; 4. Dislocation Dynamics in Al and Al-Mg Thin Films4.1. In-situ observations of dislocation propagation; 4.2. Serrated yielding in Al-Mg alloys; 4.3. Effect of solute drag on load-controlled indentation curves; 4.4. Effect of solute drag on displacement-controlled indentation; 5. Grain Boundary Dynamics in Al and Al-Mg Thin Films; 6. Superplastic Behavior of Coarse-Grained Al-Mg Alloys; 6.1. In-situ TEM straining experiments; 6.2. Dislocation substructure; 6.3. In-situ observations of substructure evolution; 7. Conclusions; Acknowledgments; References ; Chapter 5 In-Situ HRTEM Studies of Interface Dynamics During Solid-Solid Phase Transformations in Metal Alloys James M. Howe
• Sommario/riassunto: In-situ high-resolution electron microscopy is a modern and powerful technique in materials research, physics, and chemistry. In-situ techniques are hardly treated in textbooks of electron microscopy. Thus, there is a need to collect the present knowledge about the techniques and achievements of in-situ electron microscopy in one book. Since high-resolution electron microscopes are available in most modern laboratories of materials science, more and more scientists or students are starting to work on this subject.In this comprehensive volume, the most important techniques and achievements of i
• Titolo autorizzato: In-situ electron microscopy at high resolution
• ISBN: 1-61344-079-0; 981-279-734-3
• Formato: Materiale a stampa
• Livello bibliografico: Monografia
• Lingua di pubblicazione: Inglese
• Record Nr.: 9910777935403321
• Lo trovi qui: Univ. Federico II