Applications of texture analysis [[electronic resource] ] : a collection of papers presented at the 15th International Conference on Textures of Materials (ICOTOM 15), June 1-6, 2008, Pittsburgh, Pennsylvania / / edited by A.D. Rollett

• Pubblicazione: Hoboken, N.J., : Wiley, c2009
• Descrizione fisica: 1 online resource (838 p.)
• Disciplina: 620.11
• Soggetto topico: Materials - Texture; Metals - Texture; Texture (Crystallography)
• Soggetto genere / forma: Electronic books.
• Classificazione: UQ 8500
• Altri autori: RollettA. D (Anthony D.)
• Note generali: "American Ceramic Society."
• Nota di bibliografia: Includes bibliographical references and index.
• Nota di contenuto: Applications of Texture Analysis; Contents; Preface; Acknowledgments; THIN FILMS (MICROELECTRONICS, HTSC; The Texture of Thin NiSi Films and Its Effect on Agglomeration; Epitaxial Substrates from Ni-Based Ternary Alloys With Cr and W; Cube Texture Formation in Ni-Pd and Ni-Pd-W Alloys For HTS Tapes; Texture of Rapidly Solidified Cu Thin Films Studied by SEM EBSD and TEM; Control of Texture in Polycrystalline Thin Films Used as DataStorage Media; Influences of Processing Parameters on Microstructures and Microtextures of Au Flip Chip Bonds During Microelectronics Packaging ; TEXTURE AT NON-AMBIENT CONDITIONSIn Situ Observation of Texture Evolution in Ti-10-2-3; Study of Texture Evolution at High Strain Rates in FCC Materials; Texture and Microstructure Development in Copper after Cryogenic Rolling and Heat Treatment; In-Situ EBSD Study of the α-γ-α Phase Transformation in a Microalloyed Steel; Texture Changes during Phase Transformations Studied In Situ With Neutron Diffraction; NOVEL TEXTURE MEASUREMENT TECHNIQUES INCLUDING 3D; Three-Dimensional FIB-OIM of Ceramic Materials; Comparison of X-Ray and EBSD Textures for Back-Annealed Al-Mg Alloys ; A New Method for Quantification of Texture Uniformity of PlateSeparating Coincident Electron Backscatter Diffraction Patterns Near Interfaces; Rapid Texture Determination Based on Two Dimensional X Ray Detector; Semiautomatic Determination of Orientations and Elastic Strain from Kossel Microdiffraction; Statistically Reliable EBSD Analysis Method of Grain Boundary Characterization; 3D Microstructures and Textures of a Plane Strain Compressed {1 10} AI-0.3% Mn Single Crystal ; Three Laws of Substructure Anisotropy of Textured Metal Materials, Revealed by X-Ray Method of Generalized Pole Figures3D-Microstructural and Texture Characterization in Different Length Scales; Local Crystal Rotations of Bulk Grains by High-Resolution EBSD during Hot PSC of AI-0.1 % Mn Polycrystals; Grain Boundary Orientations in a Fe-Mn-Cu Polycrystalline Alloy; Development of a TEM-Based Orientation Microscopy System; COMPLEX OXIDES AND OTHER COMPOUNDS; Domain Control Effect on Voltage-Strain in BaTiO3 Single Crystal; Tentative Simulation of Crystal Rotation for NaCl Structures ; INTERFACE TEXTURESGrain Boundary Patterns in Dynamically Recrystallized Quartz Aggregates; The Correlation between Grain Boundary Character and lntergranular Corrosion Susceptibility of 2124 Aluminum Alloy; Rodrigues-Frank Spaces for Misorientations and Orientation Relationships between Crystals of Any Two Crystallographic Point Groups; Origins of Texture Memory in Steels; A Grain Boundary Analysis of Cemented Tungsten Carbides using OIM; The Effect of Grain and Phase Boundary Misorientation on Nucleation during Solid-State Phase Transformations in a Co-15Fe Alloy ; Microstructural Modification in a 15Cr-1 5Ni-2.2 Mo-Ti Modified Austenitic Stainless Steel through Twin Induced Grain Boundary Engineering
• Sommario/riassunto: This volume contains papers presented at The 15th International Conference on the Texture of Materials from June 1-5th, 2008 in Pittsburgh, PA. Chapters include: Thin FilmsTexture at Non-Ambient ConditionsNovel Texture Measurement Techniques Including 3DComplex OxidesInterface TexturesRecrystallization TextureBiomaterialsTexture Effects on Damage AccumulationDigital MicrostructuresView information on Materials Processing and Texture: Ceramic Transactions, Volume 200.
• Titolo autorizzato: Applications of texture analysis
• ISBN: 1-282-11349-6; 9786612113499; 0-470-44421-5; 0-470-44420-7
• Formato: Materiale a stampa
• Livello bibliografico: Monografia
• Lingua di pubblicazione: Inglese
• Record Nr.: 9910145255803321
• Lo trovi qui: Univ. Federico II
• Serie: Ceramic transactions ; ; v. 201.