{"text_format":"2","workbook":"xls","n_sheets":1,"sheets":["report2"],"not_rendered":{"charts":0,"images":0,"macros":0,"external_links":1,"defined_names":2,"comments":0,"pivot_tables":0},"unopened":[],"bounds":{"document_bytes":16777216,"sheet_cells":100000,"run_cost":"one","rows_first":2000,"rows_last":500,"rows_between":2000,"halvings":0,"cell_chars":16384,"cell_head_chars":4096},"cells_cut":0,"cells_raw":0,"read":"whole","date_system":"1900","formulas":"cached_only"}

{"sheet":"report2","index":0,"n_rows":25,"n_cols":5,"rows_kept":25,"cut":false,"hidden":false,"merged":[[0,2,0,3],[0,4,0,5],[1,2,1,3],[1,4,1,5],[2,2,2,3],[2,4,2,5],[3,2,3,3],[4,2,4,3],[5,2,5,3],[6,2,6,3],[7,2,7,3],[10,2,10,3],[10,4,10,5],[11,2,11,3],[11,4,11,5],[12,2,12,3],[13,2,13,3],[14,2,14,3],[21,2,21,3],[22,2,22,3]],"flags":["formulas_cached_only"]}
[null,"1.","Record Nr.",null,"UNISOBE600200009583"]
[null,null,"Autore",null,"Dodds, Eric Robertson"]
[null,null,"Titolo",null,"I Greci e l'irrazionale / Eric R.Dodds ; nuova edizione italiana a cura di Riccardo Di Donato ; presentazione di Arnaldo Momigliano"]
[null,null,"Pubbl/distr/stampa",null,"Milano, : Sansoni, 2003"]
[null,null,"ISBN",null,"8838348006"]
[null,null,"Descrizione fisica",null,"408 p. ; 20 cm."]
[null,null,"Lingua di pubblicazione",null,"Italiano"]
[null,null,"Formato",null,"Materiale a stampa"]
[null,null,null,"Livello bibliografico","Monografia"]
[null,null,null,"Note generali","Traduzione di Virginia Vacca De Bosis"]
[null,"2.","Record Nr.",null,"UNINA9910872735203321"]
[null,null,"Titolo",null,"International Symposium on Quality Electronic Design : 18-21 March, 2002, San Jose, California : proceedings"]
[null,null,"Pubbl/distr/stampa",null,"[Place of publication not identified], : IEEE Computer Society, 2002"]
[null,null,"Disciplina",null,"621.39/5"]
[null,null,"Soggetti",null,"Integrated circuits - Reliability - Very large scale integration"]
[{"$nulls":4},"Integrated circuits - Design and construction - Very large scale integration"]
[{"$nulls":4},"Integrated circuits - Very large scale integration - Computer-aided design"]
[{"$nulls":4},"Integrated circuits - Very large scale integration - Quality control - Testing"]
[{"$nulls":4},"Electrical & Computer Engineering"]
[{"$nulls":4},"Engineering & Applied Sciences"]
[{"$nulls":4},"Electrical Engineering"]
[null,null,"Lingua di pubblicazione",null,"Inglese"]
[null,null,"Formato",null,"Materiale a stampa"]
[null,null,null,"Livello bibliografico","Monografia"]
[null,null,null,"Note generali","Bibliographic Level Mode of Issuance: Monograph"]