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[null,"1.","Record Nr.",null,"UNISA990001953560203316"]
[null,null,"Autore",null,"KAFKA, Franz"]
[null,null,"Titolo",null,"Le verdict / Franz Kafka ; traduit de l'allemand par Pierre Klossowski et Pierre Leyris"]
[null,null,"Pubbl/distr/stampa",null,"Lectoure : Le Capucin, copyr. 2003"]
[null,null,"ISBN",null,"2-913493-47-5"]
[null,null,"Descrizione fisica",null,"33 p. ; 16 cm"]
[null,null,"Collana",null,"Le temps des signes"]
[null,null,"Disciplina",null,"833.912"]
[null,null,"Collocazione",null,"VII.2.A. 1026(II t A 1012)"]
[null,null,"Lingua di pubblicazione",null,"Francese"]
[null,null,"Formato",null,"Materiale a stampa"]
[null,null,null,"Livello bibliografico","Monografia"]
[null,"2.","Record Nr.",null,"UNISALENTO991004372533407536"]
[null,null,"Autore",null,"Bacchetti, Fausto"]
[null,null,"Titolo",null,"Attraverso mezzo secolo : memorie di un testimone dalla politica italiana alla diplomazia internazionale / Fausto Bacchetti"]
[null,null,"Pubbl/distr/stampa",null,"Bologna : Il mulino, [1988]"]
[null,null,"ISBN",null,"8815017453"]
[null,null,"Descrizione fisica",null,"331 p. ; 22 cm"]
[null,null,"Collana",null,"Storia/memoria"]
[null,null,"Disciplina",null,"945.092"]
[null,null,"Soggetti",null,"Diplomazia - Italia"]
[{"$nulls":4},"Bacchetti, Fausto Memorie"]
[{"$nulls":4},"Bacchetti, Fausto Memorie"]
[null,null,"Lingua di pubblicazione",null,"Italiano"]
[null,null,"Formato",null,"Materiale a stampa"]
[null,null,null,"Livello bibliografico","Monografia"]
[null,"3.","Record Nr.",null,"UNINA9910821649303321"]
[null,null,"Autore",null,"Wang Xinwei <1948->"]
[null,null,"Titolo",null,"Experimental micro/nanoscale thermal transport / / Xinwei Wang"]
[null,null,"Pubbl/distr/stampa",null,"Hoboken, New Jersey, : Wiley, 2012"]
[null,null,"ISBN",null,"9781283941228"]
[{"$nulls":4},"1283941228"]
[{"$nulls":4},"9781118310199"]
[{"$nulls":4},"1118310195"]
[{"$nulls":4},"9781118310236"]
[{"$nulls":4},"1118310233"]
[{"$nulls":4},"9781118310243"]
[{"$nulls":4},"1118310241"]
[null,null,"Edizione",null,"[1st ed.]"]
[null,null,"Descrizione fisica",null,"1 online resource (280 p.)"]
[null,null,"Classificazione",null,"TEC027000"]
[null,null,"Disciplina",null,"620.1/1596"]
[null,null,"Soggetti",null,"Nanostructured materials - Thermal properties"]
[{"$nulls":4},"Heat - Transmission"]
[null,null,"Lingua di pubblicazione",null,"Inglese"]
[null,null,"Formato",null,"Materiale a stampa"]
[null,null,null,"Livello bibliografico","Monografia"]
[null,null,null,"Note generali","Description based upon print version of record."]
[null,null,null,"Nota di bibliografia","Includes bibliographical references."]
[null,null,"Nota di contenuto",null,"EXPERIMENTAL MICRO/NANOSCALE THERMAL TRANSPORT; CONTENTS; PREFACE; 1 INTRODUCTION; 1.1 Unique Feature of Thermal Transport in Nanoscale and Nanostructured Materials; 1.1.1 Thermal Transport Constrained by Material Size; 1.1.2 Thermal Transport Constrained by Time; 1.1.3 Thermal Transport Constrained by the Size of Physical Process; 1.2 Molecular Dynamics Simulation of Thermal Transport at Micro/Nanoscales; 1.2.1 Equilibrium MD Prediction of Thermal Conductivity; 1.2.2 Nonequilibrium MD Study of Thermal Transport; 1.2.3 MD Study of Thermal Transport Constrained by Time"]
[{"$nulls":4},"1.3 Boltzmann Transportation Equation for Thermal Transport Study1.4 Direct Energy Carrier Relaxation Tracking (DECRT); 1.5 Challenges in Characterizing Thermal Transport at Micro/Nanoscales; References; 2 THERMAL CHARACTERIZATION IN FREQUENCY DOMAIN; 2.1 Frequency Domain Photoacoustic (PA) Technique; 2.1.1 Physical Model; 2.1.2 Experimental Details; 2.1.3 PA Measurement of Films and Bulk Materials; 2.1.4 Uncertainty of the PA Measurement; 2.2 Frequency Domain Photothermal Radiation (PTR) Technique; 2.2.1 Experimental Details of the PTR Technique"]
[{"$nulls":4},"2.2.2 PTR Measurement of Micrometer-Thick Films2.2.3 PTR with Internal Heating of Desired Locations; 2.3 Three-Omega Technique; 2.3.1 Physical Model of the 3ù Technique for One-Dimensional Structures; 2.3.2 Experimental Details; 2.3.3 Calibration of the Experiment; 2.3.4 Measurement of Micrometer-Thick Wires; 2.3.5 Effect of Radiation on Measurement Result; 2.4 Optical Heating Electrical Thermal Sensing (OHETS) Technique; 2.4.1 Experimental Principle and Physical Model; 2.4.2 Effect of Nonuniform Distribution of Laser Beam; 2.4.3 Experimental Details and Calibration"]
[{"$nulls":4},"2.4.4 Measurement of Electrically Conductive Wires2.4.5 Measurement of Nonconductive Wires; 2.4.6 Effect of Au Coating on Measurement; 2.4.7 Temperature Rise in the OHETS Experiment; 2.5 Comparison Among the Techniques; References; 3 TRANSIENT TECHNOLOGIES IN THE TIME DOMAIN; 3.1 Transient Photo-Electro-Thermal (TPET) Technique; 3.1.1 Experimental Principles; 3.1.2 Physical Model Development; 3.1.3 Effect of Nonuniform Distribution and Finite Rising Time of the Laser Beam; 3.1.4 Experimental Setup; 3.1.5 Technique Validation; 3.1.6 Thermal Characterization of SWCNT Bundles and Cloth Fibers"]
[{"$nulls":4},"3.2 Transient Electrothermal (TET) Technique3.2.1 Physical Principles of the TET Technique; 3.2.2 Methods for Data Analysis to Determine the Thermal Diffusivity; 3.2.3 Effect of Nonconstant Electrical Heating; 3.2.4 Experimental Details; 3.2.5 Technique Validation; 3.2.6 Measurement of SWCNT Bundles; 3.2.7 Measurement of Polyester Fibers; 3.2.8 Measurement of Micro/Submicroscale Polyacrylonitrile Wires; 3.3 Pulsed Laser-Assisted Thermal Relaxation Technique; 3.3.1 Experimental Principles; 3.3.2 Physical Model for the PLTR Technique; 3.3.3 Methods to Determine the Thermal Diffusivity"]
[{"$nulls":4},"3.3.4 Experimental Setup and Technique Validation"]
[null,null,null,"Sommario/riassunto","\"This book covers the new technologies on micro/nanoscale thermal characterization developed in the Micro/Nanoscale Thermal Science Laboratory led by Dr. Xinwei Wang. Five new non-contact and non-destructive technologies are introduced: optical heating and electrical sensing technique, transient electro-thermal technique, transient photo-electro-thermal technique, pulsed laser-assisted thermal relaxation technique, and steady-state electro-Raman-thermal technique. These techniques feature significantly improved ease of implementation, super signal-to-noise ratio, and have the capacity of measuring the thermal conductivity/diffusivity of various one-dimensional structures from dielectric, semiconductive, to metallic materials\"--"]