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[null,"1.","Record Nr.",null,"UNISALENTO991001369179707536"]
[null,null,"Autore",null,"Lascar, Daniel"]
[null,null,"Titolo",null,"Stability in model theory / Daniel Lascar ; transl. J. E. Wallington"]
[null,null,"Pubbl/distr/stampa",null,"Harlow : Longman, 1987"]
[null,null,"ISBN",null,"0582994632"]
[null,null,"Descrizione fisica",null,"193 p. ; 24 cm."]
[null,null,"Collana",null,"Pitman monographs and surveys in pure and applied mathematics, ISSN 02693666 ; 36"]
[null,null,"Classificazione",null,"AMS 03C"]
[{"$nulls":4},"AMS 03C05"]
[{"$nulls":4},"QA9.7.L3713"]
[null,null,"Disciplina",null,"511.8"]
[null,null,"Soggetti",null,"Model theory"]
[{"$nulls":4},"Stability"]
[null,null,"Lingua di pubblicazione",null,"Inglese"]
[null,null,"Formato",null,"Materiale a stampa"]
[null,null,null,"Livello bibliografico","Monografia"]
[null,null,null,"Note generali","Orig. French ed., Belgium 1986"]
[null,"2.","Record Nr.",null,"UNISA996575535103316"]
[null,null,"Titolo",null,"2020 IEEE 38th VLSI Test Symposium (VTS) / / Institute of Electrical and Electronics Engineers (IEEE)"]
[null,null,"Pubbl/distr/stampa",null,"Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers (IEEE), , 2020"]
[null,null,"ISBN",null,"1-7281-5359-X"]
[null,null,"Descrizione fisica",null,"1 online resource (various pagings) : illustrations"]
[null,null,"Disciplina",null,"621"]
[null,null,"Soggetti",null,"Integrated circuits - Very large scale integration - Testing"]
[null,null,"Lingua di pubblicazione",null,"Inglese"]
[null,null,"Formato",null,"Materiale a stampa"]
[null,null,null,"Livello bibliografico","Monografia"]