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[null,"1.","Record Nr.",null,"UNINA990001334690403321"]
[null,null,"Autore",null,"Conference on abelian groups and modules : <1994"]
[null,null,"Titolo",null,"Abelian groups and modules : proceedings of the Padova conference, Padova, Italy, june 23-july 1, 1994 / edited by Alberto Facchini, Claudia Menini"]
[null,null,"Pubbl/distr/stampa",null,"Dordrecht (NL) : Kluwer, c1995"]
[null,null,"ISBN",null,"0-7923-3756-5"]
[null,null,"Descrizione fisica",null,"xx, 522 p. ; 234 cm"]
[null,null,"Collana",null,"Mathematics and its applications ; 343"]
[null,null,"Disciplina",null,"512.2"]
[null,null,"Locazione",null,"MA1"]
[null,null,"Collocazione",null,"C-55-(343"]
[null,null,"Lingua di pubblicazione",null,"Inglese"]
[null,null,"Formato",null,"Materiale a stampa"]
[null,null,null,"Livello bibliografico","Monografia"]
[null,"2.","Record Nr.",null,"UNISA996575519503316"]
[null,null,"Titolo",null,"2020 IEEE 26th International Symposium on On-Line Testing and Robust System Design (IOLTS) / / Institute of Electrical and Electronics Engineers"]
[null,null,"Pubbl/distr/stampa",null,"[Place of publication not identified] : , : Institute of Electrical and Electronics Engineers, , 2020"]
[null,null,"ISBN",null,"1-7281-8187-9"]
[null,null,"Descrizione fisica",null,"1 online resource"]
[null,null,"Disciplina",null,"519.5"]
[null,null,"Soggetti",null,"Robust statistics"]
[null,null,"Lingua di pubblicazione",null,"Inglese"]
[null,null,"Formato",null,"Materiale a stampa"]
[null,null,null,"Livello bibliografico","Monografia"]
[null,null,null,"Sommario/riassunto","On Line Testing and Robust Electronic System Design."]