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[null,"1.","Record Nr.",null,"UNISA996393607503316"]
[null,null,"Autore",null,"Baxter Richard <1615-1691.>"]
[null,null,"Titolo",null,"The certainty of the worlds of spirits [[electronic resource] ] : Fully evinced by the unquestionable histories of apparitions, operations, witchcrafts, voices, &c. Proving the immortality of souls, the malice and misery of the devils, and the damned, and the blessedness of the justified. Written for the conviction of Sadduces & infidels, by Richard Baxter"]
[null,null,"Pubbl/distr/stampa",null,"London, : printed for T. Parkhurst at the Bible and Three Crowns in Cheapside; and J. Salusbury at the Rising Sun near the Royal Exchange in Cornhill, 1691"]
[null,null,"Descrizione fisica",null,"[16], 252, [2] p"]
[null,null,"Soggetti",null,"Apparitions"]
[{"$nulls":4},"Witchcraft"]
[{"$nulls":4},"Spirits"]
[null,null,"Lingua di pubblicazione",null,"Inglese"]
[null,null,"Formato",null,"Materiale a stampa"]
[null,null,null,"Livello bibliografico","Monografia"]
[null,null,null,"Note generali","Running title reads: An historical discourse of apparitions and witches."]
[{"$nulls":4},"With a final advertisement leaf."]
[{"$nulls":4},"Reproduction of original in the Dr. Williams' Library."]
[null,null,null,"Sommario/riassunto","eebo-0037"]
[null,"2.","Record Nr.",null,"UNINA9911004822103321"]
[null,null,"Autore",null,"Leach R. K"]
[null,null,"Titolo",null,"Fundamental principles of engineering nanometrology / / by Richard K. Leach"]
[null,null,"Pubbl/distr/stampa",null,"Oxford, : Wlliam Andrew"]
[{"$nulls":4},"Amsterdam, : Elsevier Science, 2009"]
[null,null,"ISBN",null,"1-282-38196-2"]
[{"$nulls":4},"9786612381966"]
[{"$nulls":4},"1-4377-7832-1"]
[null,null,"Edizione",null,"[1st ed.]"]
[null,null,"Descrizione fisica",null,"1 online resource (349 p.)"]
[null,null,"Collana",null,"Micro and nano technologies"]
[null,null,"Disciplina",null,"620.5"]
[{"$nulls":4},"620.50287"]
[null,null,"Soggetti",null,"Nanotechnology"]
[{"$nulls":4},"Microtechnology"]
[{"$nulls":4},"Metrology"]
[null,null,"Lingua di pubblicazione",null,"Inglese"]
[null,null,"Formato",null,"Materiale a stampa"]
[null,null,null,"Livello bibliografico","Monografia"]
[null,null,null,"Note generali","Description based upon print version of record."]
[null,null,null,"Nota di bibliografia","Includes bibliographical references and index."]
[null,null,"Nota di contenuto",null,"Front Cover; Fundamental Principles ofEngineering Nanometrology; Copyright; Contents; Acknowledgements; Figures; Tables; CHAPTER 1Introduction to metrology for micro- and nanotechnology; 1.1 What is engineering nanometrology?; 1.2The contents of this book; 1.3References; CHAPTER 2 -Some basics of measurement; 2.1Introduction to measurement; 2.2Units of measurement and the SI; 2.3Length; 2.4Mass; 2.5Force; 2.6Angle; 2.7Traceability; 2.8Accuracy, precision, resolution, error and uncertainty; 2.10References; CHAPTER 3 -Precision measurement instrumentation - some design principles"]
[{"$nulls":4},"3.1Geometrical considerations3.2Kinematic design; 3.3Dynamics; 3.4The Abbe Principle; 3.5Elastic compression; 3.6Force loops; 3.7Materials; 3.8Symmetry; 3.9Vibration isolation; 3.10References; CHAPTER 4Length traceability using interferometry; 4.1Traceability in length; 4.2Gauge blocks - both a practical and traceable artefact; 4.3Introduction to interferometry; 4.4Interferometer designs; 4.5Gauge block interferometry; 4.6References; CHAPTER 5Displacement measurement; 5.1Introduction to displacement measurement; 5.2Displacement interferometry; 5.3Capacitive displacement sensors"]
[{"$nulls":4},"5.4Inductive displacement sensors5.5Optical encoders; 5.6Optical fibre sensors; 5.7Calibration of displacement sensors; 5.8References; "]
[{"$nulls":4},"CHAPTER 6 Surface topography measurement instrumentation; 6.1Introduction to surface topography measurement; 6.2Spatial wavelength ranges; 6.3Historical background of classical surface texture measuring instrumentation; 6.4Surface profile measurement; 6.5Areal surface texture measurement; 6.6Surface topography measuring instrumentation; 6.7Optical instruments; 6.8Capacitive instruments; 6.9Pneumatic instruments"]
[{"$nulls":4},"6.10Calibration of surface topography measuring instruments6.11Uncertainties in surface topography measurement; 6.12Comparisons of surface topography measuring instruments; 6.13Software measurement standards; 6.14References; CHAPTER 7Scanning probe and particle beam microscopy; 7.1Scanning probe microscopy; 7.2Scanning tunnelling microscopy; 7.3Atomic force microscopy; 7.4Scanning probe microscopy of nanoparticles; 7.5Electron microscopy; 7.6Other particle beam microscopy techniques; 7.7References; CHAPTER 8Surface topography characterization"]
[{"$nulls":4},"8.1Introduction to surface topography characterization8.2Surface profile characterization; 8.3Areal surface texture characterization; 8.4Fractal methods; 8.5Comparison of profile and areal characterization; 8.6References; CHAPTER 9Coordinate metrology; 9.1Introduction to CMMs; 9.2Sources of error on CMMs; 9.3Traceability, calibration and performance verification of CMMs; 9.4Miniature CMMs; 9.5Miniature CMM probes; 9.6Calibration of miniature CMMs; 9.7References; CHAPTER 10Mass and force measurement; 10.1Traceability of traditional mass measurement; 10.2Low-mass measurement"]
[{"$nulls":4},"10.3Low-force measurement"]
[null,null,null,"Sommario/riassunto","Fundamental Principles of Engineering Nanometrology provides a comprehensive overview of engineering metrology and how it relates to micro and nanotechnology (MNT) research and manufacturing. By combining established knowledge with the latest advances from the field, it presents a comprehensive single volume that can be used for professional reference and academic study. Provides a basic introduction to measurement and instruments  Thoroughly presents numerous measurement techniques, from static length and displacement to surface topography, mass and force"]