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[null,"1.","Record Nr.",null,"UNISA990001485280203316"]
[null,null,"Autore",null,"CRISTANTE, Francesca"]
[null,null,"Titolo",null,"Statistica per psicologi / di Francesca Cristante, Adriana Lis, Marco Sambin"]
[null,null,"Pubbl/distr/stampa",null,"Firenze : Giunti-Barbera, 1982"]
[null,null,"Descrizione fisica",null,"470 p. : ill. ; 23 cm"]
[null,null,"Collana",null,"Orientamenti della psicologia moderna"]
[null,null,"Disciplina",null,"158"]
[null,null,"Soggetti",null,"Psicometria"]
[null,null,"Collocazione",null,"II.3. 1860(VI Ps B coll 8/3)"]
[null,null,"Lingua di pubblicazione",null,"Italiano"]
[null,null,"Formato",null,"Materiale a stampa"]
[null,null,null,"Livello bibliografico","Monografia"]
[null,"2.","Record Nr.",null,"UNISA996202252903316"]
[null,null,"Titolo",null,"5th International Workshop on Microprocessor Test and Verification : common challenges and solutions : proceedings : Austin, Texas, September 9-10, 2004"]
[null,null,"Pubbl/distr/stampa",null,"[Place of publication not identified], : IEEE Computer Society, 2005"]
[null,null,"Disciplina",null,"004.16"]
[null,null,"Soggetti",null,"Microprocessors - Testing"]
[{"$nulls":4},"Integrated circuits - Testing"]
[{"$nulls":4},"Integrated circuits - Verification"]
[{"$nulls":4},"Systems on a chip - Testing"]
[{"$nulls":4},"Electrical & Computer Engineering"]
[{"$nulls":4},"Electrical Engineering"]
[{"$nulls":4},"Engineering & Applied Sciences"]
[null,null,"Lingua di pubblicazione",null,"Inglese"]
[null,null,"Formato",null,"Materiale a stampa"]
[null,null,null,"Livello bibliografico","Monografia"]
[null,null,null,"Note generali","Bibliographic Level Mode of Issuance: Monograph"]