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[null,"1.","Record Nr.",null,"UNISA990000638720203316"]
[null,null,"Autore",null,"ELLIOTT, Peter D.T.A."]
[null,null,"Titolo",null,"Probablistic number theory / P.D.T.A. Elliot"]
[null,null,"Pubbl/distr/stampa",null,"Berlin : Springer-Verlag, c1979-1980"]
[null,null,"Descrizione fisica",null,"v. ; 23 cm"]
[null,null,"Collana",null,"Die grundlehren der matamatischen Wissenschaften"]
[null,null,"Disciplina",null,"512.7"]
[null,null,"Collocazione",null,"510 GLM"]
[null,null,"Lingua di pubblicazione",null,"Inglese"]
[null,null,"Formato",null,"Materiale a stampa"]
[null,null,null,"Livello bibliografico","Monografia"]
[null,"2.","Record Nr.",null,"UNINA9910411649003321"]
[null,null,"Titolo",null,"ECS journal of solid state science and technology"]
[null,null,"Pubbl/distr/stampa",null,"Pennington, NJ, : Electrochemical Society, 2012-"]
[{"$nulls":4},"Bristol, UK, : IOP Publishing Limited on behalf of The Electrochemical Society"]
[null,null,"ISSN",null,"2162-8777"]
[null,null,"Disciplina",null,"541"]
[null,null,"Soggetti",null,"Solid state chemistry"]
[{"$nulls":4},"Electronics - Materials"]
[{"$nulls":4},"Electrochemistry"]
[{"$nulls":4},"Periodicals."]
[null,null,"Lingua di pubblicazione",null,"Inglese"]
[null,null,"Formato",null,"Materiale a stampa"]
[null,null,null,"Livello bibliografico","Periodico"]
[null,null,null,"Note generali","Refereed/Peer-reviewed"]
[null,null,null,"Sommario/riassunto","Covers fundamental and applied areas of solid state science and technology including experimental and theoretical aspects of the chemistry and physics of materials and devices."]
[{"$nulls":4},"Technical areas of interest are: carbon nanostructures and devices; dielectric science and materials; electronic materials and processing; electronic and photonic devices and systems; luminescence and display materials, devices, and processing; and physical sensors. Of particular interest are the areas of solid state materials and device processing as they relate to the establishment of electrical, optical, physical and chemical properties, the relationship of material properties to device properties, the process science and technology of materials and devices, and the characterization of bulk materials, thin films, interfaces, surfaces, and devices."]