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[null,"1.","Record Nr.",null,"UNINA9911020251203321"]
[null,null,"Autore",null,"Amerasekera E. A."]
[null,null,"Titolo",null,"ESD in silicon integrated circuits"]
[null,null,"Pubbl/distr/stampa",null,"[Place of publication not identified], : J Wiley, 2002"]
[null,null,"ISBN",null,"1-280-55472-X"]
[{"$nulls":4},"9786610554720"]
[{"$nulls":4},"0-470-85212-7"]
[{"$nulls":4},"0-470-84605-4"]
[null,null,"Edizione",null,"[2nd ed.]"]
[null,null,"Descrizione fisica",null,"1 online resource (421 pages)"]
[null,null,"Disciplina",null,"621.3815/2"]
[null,null,"Soggetti",null,"Semiconductors - Protection"]
[{"$nulls":4},"Integrated circuits - Protection"]
[{"$nulls":4},"Electrostatics"]
[{"$nulls":4},"Static eliminators"]
[{"$nulls":4},"Electrical & Computer Engineering"]
[{"$nulls":4},"Engineering & Applied Sciences"]
[{"$nulls":4},"Electrical Engineering"]
[null,null,"Lingua di pubblicazione",null,"Inglese"]
[null,null,"Formato",null,"Materiale a stampa"]
[null,null,null,"Livello bibliografico","Monografia"]
[null,null,null,"Note generali","Bibliographic Level Mode of Issuance: Monograph"]
[null,null,null,"Sommario/riassunto","Electrostatic discharge (ESD) effects in silicon integrated circuits have become a major concern as high circuit density technologies shrink to sub-micron dimensions. This update of a classic reference provides a complete and current overview of ESD and its implications in the design and development of new semiconductor technologies and integrated circuits."]