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[null,"1.","Record Nr.",null,"UNIORUON00513159"]
[null,null,"Autore",null,"SEEGER, Horst"]
[null,null,"Titolo",null,"Opern-Lexikon / Horst Seeger"]
[null,null,"Pubbl/distr/stampa",null,"Wilhelmshaven, : Heinrichshofen's Verlag, 1979"]
[null,null,"ISBN",null,"37-959027-1-1"]
[null,null,"Edizione",null,"[1. Aufl]"]
[null,null,"Descrizione fisica",null,"598 p. ; 23 cm"]
[null,null,"Disciplina",null,"780.3"]
[null,null,"Soggetti",null,"OPERA IN MUSICA"]
[{"$nulls":4},"MUSICA - Enciclopedie e dizionari"]
[null,null,"Lingua di pubblicazione",null,"Tedesco"]
[null,null,"Formato",null,"Materiale a stampa"]
[null,null,null,"Livello bibliografico","Monografia"]
[null,"2.","Record Nr.",null,"UNINA9911019210903321"]
[null,null,"Autore",null,"Brandon David"]
[null,null,"Titolo",null,"Microstructural Characterization of Materials"]
[null,null,"Pubbl/distr/stampa",null,"Hoboken, : Wiley, 2008"]
[null,null,"ISBN",null,"9786612342943"]
[{"$nulls":4},"9781282342941"]
[{"$nulls":4},"1282342940"]
[{"$nulls":4},"9780470727126"]
[{"$nulls":4},"0470727128"]
[{"$nulls":4},"9780470727133"]
[{"$nulls":4},"0470727136"]
[null,null,"Edizione",null,"[2nd ed.]"]
[null,null,"Descrizione fisica",null,"1 online resource (554 p.)"]
[null,null,"Collana",null,"Quantitative software engineering series Microstructural characterization of materials"]
[null,null,"Disciplina",null,"620.1/1299"]
[null,null,"Soggetti",null,"Electronic books. -- local"]
[{"$nulls":4},"Materials -- Microscopy"]
[{"$nulls":4},"Microstructure"]
[{"$nulls":4},"Materials - Microscopy"]
[{"$nulls":4},"Materials Science"]
[{"$nulls":4},"Chemical & Materials Engineering"]
[{"$nulls":4},"Engineering & Applied Sciences"]
[null,null,"Lingua di pubblicazione",null,"Inglese"]
[null,null,"Formato",null,"Materiale a stampa"]
[null,null,null,"Livello bibliografico","Monografia"]
[null,null,null,"Note generali","Description based upon print version of record."]
[null,null,"Nota di contenuto",null,"Microstructural Characterization of Materials; Contents; Preface to the Second Edition; Preface to the First Edition; 1 The Concept of Microstructure; 1.1 Microstructural Features; 1.1.1 Structure-Property Relationships; 1.1.2 Microstructural Scale; 1.1.3 Microstructural Parameters; 1.2 Crystallography and Crystal Structure; 1.2.1 Interatomic Bonding in Solids; 1.2.2 Crystalline and Amorphous Phases; 1.2.3 The Crystal Lattice; Summary; Bibliography; Worked Examples; Problems; 2 Diffraction Analysis of Crystal Structure; 2.1 Scattering of Radiation by Crystals"]
[{"$nulls":4},"2.1.1 The Laue Equations and Bragg's Law2.1.2 Allowed and Forbidden Reflections; 2.2 Reciprocal Space; 2.2.1 The Limiting Sphere Construction; 2.2.2 Vector Representation of Bragg's Law; 2.2.3 The Reciprocal Lattice; 2.3 X-Ray Diffraction Methods; 2.3.1 The X-Ray "]
[{"$nulls":4},"Diffractometer; 2.3.2 Powder Diffraction-Particles and Polycrystals; 2.3.3 Single Crystal Laue Diffraction; 2.3.4 Rotating Single Crystal Methods; 2.4 Diffraction Analysis; 2.4.1 Atomic Scattering Factors; 2.4.2 Scattering by the Unit Cell; 2.4.3 The Structure Factor in the Complex Plane"]
[{"$nulls":4},"2.4.4 Interpretation of Diffracted Intensities2.4.5 Errors and Assumptions; 2.5 Electron Diffraction; 2.5.1 Wave Properties of Electrons; 2.5.2 Ring Patterns, Spot Patterns and Laue Zones; 2.5.3 Kikuchi Patterns and Their Interpretation; Summary; Bibliography; Worked Examples; Problems; 3 Optical Microscopy; 3.1 Geometrical Optics; 3.1.1 Optical Image Formation; 3.1.2 Resolution in the Optical Microscope; 3.1.3 Depth of Field and Depth of Focus; 3.2 Construction of the Microscope; 3.2.1 Light Sources and Condenser Systems; 3.2.2 The Specimen Stage; 3.2.3 Selection of Objective Lenses"]
[{"$nulls":4},"3.2.4 Image Observation and Recording3.3 Specimen Preparation; 3.3.1 Sampling and Sectioning; 3.3.2 Mounting and Grinding; 3.3.3 Polishing and Etching Methods; 3.4 Image Contrast; 3.4.1 Reflection and Absorption of Light; 3.4.2 Bright-Field and Dark-Field Image Contrast; 3.4.3 Confocal Microscopy; 3.4.4 Interference Contrast and Interference Microscopy; 3.4.5 Optical Anisotropy and Polarized Light; 3.4.6 Phase Contrast Microscopy; 3.5 Working with Digital Images; 3.5.1 Data Collection and The Optical System; 3.5.2 Data Processing and Analysis; 3.5.3 Data Storage and Presentation"]
[{"$nulls":4},"3.5.4 Dynamic Range and Digital Storage3.6 Resolution, Contrast and Image Interpretation; Summary; Bibliography; Worked Examples; Problems; 4 Transmission Electron Microscopy; 4.1 Basic Principles; 4.1.1 Wave Properties of Electrons; 4.1.2 Resolution Limitations and Lens Aberrations; 4.1.3 Comparative Performance of Transmission and Scanning Electron Microscopy; 4.2 Specimen Preparation; 4.2.1 Mechanical Thinning; 4.2.2 Electrochemical Thinning; 4.2.3 Ion Milling; 4.2.4 Sputter Coating and Carbon Coating; 4.2.5 Replica Methods; 4.3 The Origin of Contrast; 4.3.1 Mass-Thickness Contrast"]
[{"$nulls":4},"4.3.2 Diffraction Contrast and Crystal Lattice Defects"]
[null,null,null,"Sommario/riassunto","Microstructural characterization is usually achieved by allowing some form of probe to interact with a carefully prepared specimen. The most commonly used probes are visible light, X-ray radiation, a high-energy electron beam, or a sharp, flexible needle. These four types of probe form the basis for optical microscopy, X-ray diffraction, electron microscopy, and scanning probe microscopy.<br /> <br /> <i>Microstructural Characterization of Materials, 2nd Edition</i> is an introduction to the expertise involved in assessing the microstructure of engineering materials and to the experimental met"]
[null,"3.","Record Nr.",null,"UNINA9911019744903321"]
[null,null,"Autore",null,"Laplante Phillip A"]
[null,null,"Titolo",null,"Real-time systems design and analysis / / Phillip A. Laplante"]
[null,null,"Pubbl/distr/stampa",null,"Hoboken, N.J., : Wiley, 2004"]
[null,null,"ISBN",null,"9786610368099"]
[{"$nulls":4},"9781280368097"]
[{"$nulls":4},"1280368098"]
[{"$nulls":4},"9780470342657"]
[{"$nulls":4},"047034265X"]
[{"$nulls":4},"9780471648284"]
[{"$nulls":4},"0471648280"]
[{"$nulls":4},"9780471648291"]
[{"$nulls":4},"0471648299"]
[null,null,"Edizione",null,"[3rd ed.]"]
[null,null,"Descrizione fisica",null,"1 online resource (529 p.)"]
[null,null,"Disciplina",null,"004/.33"]
[null,null,"Soggetti",null,"Real-time data processing"]
[{"$nulls":4},"System design"]
[null,null,"Lingua di pubblicazione",null,"Inglese"]
[null,null,"Formato",null,"Materiale a stampa"]
[null,null,null,"Livello bibliografico","Monografia"]
[null,null,null,"Note generali","Description based upon print version of record."]
[null,null,null,"Nota di bibliografia","Includes bibliographical references (p. 475-485) and index."]
[null,null,"Nota di contenuto",null,"REAL-TIME SYSTEMS DESIGN AND ANALYSIS; CONTENTS; Preface to the Third Edition; 1 Basic Real-Time Concepts; 1.1 Terminology; 1.1.1 Systems Concepts; 1.1.2 Real-Time Definitions; 1.1.3 Events and Determinism; 1.1.4 CPU Utilization; 1.2 Real-Time System Design Issues; 1.3 Example Real-Time Systems; 1.4 Common Misconceptions; 1.5 Brief History; 1.5.1 Theoretical Advances; 1.5.2 Early Systems; 1.5.3 Hardware Developments; 1.5.4 Early Software; 1.5.5 Commercial Operating System Support; 1.6 Exercises; 2 Hardware Considerations; 2.1 Basic Architecture; 2.2 Hardware Interfacing; 2.2.1 Latching"]
[{"$nulls":4},"2.2.2 Edge versus Level Triggered2.2.3 Tristate Logic; 2.2.4 Wait States; 2.2.5 Systems Interfaces and Buses; 2.3 Central Processing Unit; 2.3.1 Fetch and Execute Cycle; 2.3.2 Microcontrollers; 2.3.3 Instruction Forms; 2.3.4 Core Instructions; 2.3.5 Addressing Modes; 2.3.6 RISC versus CISC; 2.4 Memory; 2.4.1 Memory Access; 2.4.2 Memory Technologies; 2.4.3 Memory Hierarchy; 2.4.4 Memory Organization; 2.5 Input/Output; 2.5.1 Programmed Input/Output; 2.5.2 Direct Memory Access; 2.5.3 Memory-Mapped Input/Output; 2.5.4 Interrupts; 2.6 "]
[{"$nulls":4},"Enhancing Performance; 2.6.1 Locality of Reference; 2.6.2 Cache"]
[{"$nulls":4},"2.6.3 Pipelining2.6.4 Coprocessors; 2.7 Other Special Devices; 2.7.1 Applications-Specific Integrated Circuits; 2.7.2 Programmable Array Logic/Programmable Logic Array; 2.7.3 Field-Programmable Gate Arrays; 2.7.4 Transducers; 2.7.5 Analog/Digital Converters; 2.7.6 Digital/Analog Converters; 2.8 Non-von-Neumann Architectures; 2.8.1 Parallel Systems; 2.8.2 Flynn's Taxonomy for Parallelism; 2.9 Exercises; 3 Real-Time Operating Systems; 3.1 Real-Time Kernels; 3.1.1 Pseudokernels; 3.1.2 Interrupt-Driven Systems; 3.1.3 Preemptive-Priority Systems; 3.1.4 Hybrid Systems"]
[{"$nulls":4},"3.1.5 The Task-Control Block Model3.2 Theoretical Foundations of Real-Time Operating Systems; 3.2.1 Process Scheduling; 3.2.2 Round-Robin Scheduling; 3.2.3 Cyclic Executives; 3.2.4 Fixed-Priority Scheduling-Rate-Monotonic Approach; 3.2.5 Dynamic-Priority Scheduling: Earliest-Deadline-First Approach; 3.3 Intertask Communication and Synchronization; 3.3.1 Buffering Data; 3.3.2 Time-Relative Buffering; 3.3.3 Ring Buffers; 3.3.4 Mailboxes; 3.3.5 Queues; 3.3.6 Critical Regions; 3.3.7 Semaphores; 3.3.8 Other Synchronization Mechanisms; 3.3.9 Deadlock; 3.3.10 Priority Inversion"]
[{"$nulls":4},"3.4 Memory Management3.4.1 Process Stack Management; 3.4.2 Run-Time Ring Buffer; 3.4.3 Maximum Stack Size; 3.4.4 Multiple-Stack Arrangements; 3.4.5 Memory Management in the Task-Control-Block Model; 3.4.6 Swapping; 3.4.7 Overlays; 3.4.8 Block or Page Management; 3.4.9 Replacement Algorithms; 3.4.10 Memory Locking; 3.4.11 Working Sets; 3.4.12 Real-Time Garbage Collection; 3.4.13 Contiguous File Systems; 3.4.14 Building versus Buying Real-Time Operating Systems; 3.4.15 Selecting Real-Time Kernels; 3.5 Case Study: POSIX; 3.5.1 Threads; 3.5.2 POSIX Mutexes and Condition Variables"]
[{"$nulls":4},"3.5.3 POSIX Semaphores"]
[null,null,null,"Sommario/riassunto","The leading guide to real-time systems design-revised and updatedThis third edition of Phillip Laplante's bestselling, practical guide to building real-time systems maintains its predecessors' unique holistic, systems-based approach devised to help engineers write problem-solving software. Dr. Laplante incorporates a survey of related technologies and their histories, complete with time-saving practical tips, hands-on instructions, C code, and insights into decreasing ramp-up times.Real-Time Systems Design and Analysis, Third Edition is essential for students and practicing sof"]