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[null,"1.","Record Nr.",null,"UNINA9911019542903321"]
[null,null,"Titolo",null,"Principles and applications of powder diffraction"]
[null,null,"Pubbl/distr/stampa",null,"[Place of publication not identified], : John Wiley and Sons Ltd, 2008"]
[null,null,"ISBN",null,"1-4443-0548-4"]
[{"$nulls":4},"1-4443-0561-1"]
[null,null,"Disciplina",null,"548/.83"]
[null,null,"Soggetti",null,"X-rays - Measurement - Diffraction"]
[{"$nulls":4},"Powders - Optical properties"]
[{"$nulls":4},"Light & Optics"]
[{"$nulls":4},"Physics"]
[{"$nulls":4},"Physical Sciences & Mathematics"]
[null,null,"Lingua di pubblicazione",null,"Inglese"]
[null,null,"Formato",null,"Materiale a stampa"]
[null,null,null,"Livello bibliografico","Monografia"]
[null,null,null,"Note generali","Bibliographic Level Mode of Issuance: Monograph"]
[null,null,"Nota di contenuto",null,"An overview of powder diffraction / Lachlan M. D. Cranswick -- Intorduction to diffraction / Abraham Clearfield -- Practical aspects / Joseph H. Reibenspies and Nattamai Bhuvanesh -- Profile analysis / Arnt Kern -- Introduction to non-laboratory radiation sources / Peter J. Chupas and Karena W. Chapman -- Phase identification and quantitative methods / Pamela Whitfield and Lyndon Mitchell -- Structure solution / Armel Le Bail -- Structure refinement / James A. Kaduk -- Other topics / E. Andrew Payzant."]