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[null,"1.","Record Nr.",null,"UNINA9910717034003321"]
[null,null,"Autore",null,"Hsia Tao-tai <1921-2020, >"]
[null,null,"Titolo",null,"Freedom of emigration of Chinese citizens under Chinese law"]
[null,null,"Pubbl/distr/stampa",null,"[Washington, D.C.] : , : Far Eastern Law Division, Law Library, , 1994"]
[null,null,"Edizione",null,"[Updated April 1994.]"]
[null,null,"Descrizione fisica",null,"1 online resource (9 pages)"]
[null,null,"Soggetti",null,"Emigration and immigration law - China"]
[{"$nulls":4},"Freedom of movement - China"]
[null,null,"Lingua di pubblicazione",null,"Inglese"]
[null,null,"Formato",null,"Materiale a stampa"]
[null,null,null,"Livello bibliografico","Monografia"]
[null,null,null,"Note generali","\"Tao-tai Hsia and Wendy I. Zeldin\"--Page 9."]
[{"$nulls":4},"\"Originally LL 91-11, May 1991.\""]
[null,null,null,"Nota di bibliografia","Includes bibliographical references."]
[null,"2.","Record Nr.",null,"UNINA9911019210903321"]
[null,null,"Autore",null,"Brandon David"]
[null,null,"Titolo",null,"Microstructural Characterization of Materials"]
[null,null,"Pubbl/distr/stampa",null,"Hoboken, : Wiley, 2008"]
[null,null,"ISBN",null,"9786612342943"]
[{"$nulls":4},"9781282342941"]
[{"$nulls":4},"1282342940"]
[{"$nulls":4},"9780470727126"]
[{"$nulls":4},"0470727128"]
[{"$nulls":4},"9780470727133"]
[{"$nulls":4},"0470727136"]
[null,null,"Edizione",null,"[2nd ed.]"]
[null,null,"Descrizione fisica",null,"1 online resource (554 p.)"]
[null,null,"Collana",null,"Quantitative software engineering series Microstructural characterization of materials"]
[null,null,"Disciplina",null,"620.1/1299"]
[null,null,"Soggetti",null,"Electronic books. -- local"]
[{"$nulls":4},"Materials -- Microscopy"]
[{"$nulls":4},"Microstructure"]
[{"$nulls":4},"Materials - Microscopy"]
[{"$nulls":4},"Materials Science"]
[{"$nulls":4},"Chemical & Materials Engineering"]
[{"$nulls":4},"Engineering & Applied Sciences"]
[null,null,"Lingua di pubblicazione",null,"Inglese"]
[null,null,"Formato",null,"Materiale a stampa"]
[null,null,null,"Livello bibliografico","Monografia"]
[null,null,null,"Note generali","Description based upon print version of record."]
[null,null,"Nota di contenuto",null,"Microstructural Characterization of Materials; Contents; Preface to the Second Edition; Preface to the First Edition; 1 The Concept of Microstructure; 1.1 Microstructural Features; 1.1.1 Structure-Property Relationships; 1.1.2 Microstructural Scale; 1.1.3 Microstructural Parameters; 1.2 Crystallography and Crystal Structure; 1.2.1 Interatomic Bonding in Solids; 1.2.2 Crystalline and Amorphous Phases; 1.2.3 The Crystal Lattice; Summary; Bibliography; Worked Examples; Problems; 2 Diffraction Analysis of Crystal Structure; 2.1 Scattering of Radiation by Crystals"]
[{"$nulls":4},"2.1.1 The Laue Equations and Bragg's Law2.1.2 Allowed and Forbidden Reflections; 2.2 Reciprocal Space; 2.2.1 The Limiting Sphere Construction; 2.2.2 Vector Representation of Bragg's Law; 2.2.3 The Reciprocal Lattice; 2.3 X-Ray Diffraction Methods; 2.3.1 The X-Ray "]
[{"$nulls":4},"Diffractometer; 2.3.2 Powder Diffraction-Particles and Polycrystals; 2.3.3 Single Crystal Laue Diffraction; 2.3.4 Rotating Single Crystal Methods; 2.4 Diffraction Analysis; 2.4.1 Atomic Scattering Factors; 2.4.2 Scattering by the Unit Cell; 2.4.3 The Structure Factor in the Complex Plane"]
[{"$nulls":4},"2.4.4 Interpretation of Diffracted Intensities2.4.5 Errors and Assumptions; 2.5 Electron Diffraction; 2.5.1 Wave Properties of Electrons; 2.5.2 Ring Patterns, Spot Patterns and Laue Zones; 2.5.3 Kikuchi Patterns and Their Interpretation; Summary; Bibliography; Worked Examples; Problems; 3 Optical Microscopy; 3.1 Geometrical Optics; 3.1.1 Optical Image Formation; 3.1.2 Resolution in the Optical Microscope; 3.1.3 Depth of Field and Depth of Focus; 3.2 Construction of the Microscope; 3.2.1 Light Sources and Condenser Systems; 3.2.2 The Specimen Stage; 3.2.3 Selection of Objective Lenses"]
[{"$nulls":4},"3.2.4 Image Observation and Recording3.3 Specimen Preparation; 3.3.1 Sampling and Sectioning; 3.3.2 Mounting and Grinding; 3.3.3 Polishing and Etching Methods; 3.4 Image Contrast; 3.4.1 Reflection and Absorption of Light; 3.4.2 Bright-Field and Dark-Field Image Contrast; 3.4.3 Confocal Microscopy; 3.4.4 Interference Contrast and Interference Microscopy; 3.4.5 Optical Anisotropy and Polarized Light; 3.4.6 Phase Contrast Microscopy; 3.5 Working with Digital Images; 3.5.1 Data Collection and The Optical System; 3.5.2 Data Processing and Analysis; 3.5.3 Data Storage and Presentation"]
[{"$nulls":4},"3.5.4 Dynamic Range and Digital Storage3.6 Resolution, Contrast and Image Interpretation; Summary; Bibliography; Worked Examples; Problems; 4 Transmission Electron Microscopy; 4.1 Basic Principles; 4.1.1 Wave Properties of Electrons; 4.1.2 Resolution Limitations and Lens Aberrations; 4.1.3 Comparative Performance of Transmission and Scanning Electron Microscopy; 4.2 Specimen Preparation; 4.2.1 Mechanical Thinning; 4.2.2 Electrochemical Thinning; 4.2.3 Ion Milling; 4.2.4 Sputter Coating and Carbon Coating; 4.2.5 Replica Methods; 4.3 The Origin of Contrast; 4.3.1 Mass-Thickness Contrast"]
[{"$nulls":4},"4.3.2 Diffraction Contrast and Crystal Lattice Defects"]
[null,null,null,"Sommario/riassunto","Microstructural characterization is usually achieved by allowing some form of probe to interact with a carefully prepared specimen. The most commonly used probes are visible light, X-ray radiation, a high-energy electron beam, or a sharp, flexible needle. These four types of probe form the basis for optical microscopy, X-ray diffraction, electron microscopy, and scanning probe microscopy.<br /> <br /> <i>Microstructural Characterization of Materials, 2nd Edition</i> is an introduction to the expertise involved in assessing the microstructure of engineering materials and to the experimental met"]