{"text_format":"2","workbook":"xls","n_sheets":1,"sheets":["report2"],"not_rendered":{"charts":0,"images":0,"macros":0,"external_links":1,"defined_names":1,"comments":0,"pivot_tables":0},"unopened":[],"bounds":{"document_bytes":16777216,"sheet_cells":100000,"run_cost":"one","rows_first":2000,"rows_last":500,"rows_between":2000,"halvings":0,"cell_chars":16384,"cell_head_chars":4096},"cells_cut":0,"cells_raw":0,"read":"whole","date_system":"1900","formulas":"cached_only"}

{"sheet":"report2","index":0,"n_rows":22,"n_cols":5,"rows_kept":22,"cut":false,"hidden":false,"merged":[[0,2,0,3],[0,4,0,5],[1,2,1,3],[1,4,1,5],[2,2,2,3],[3,2,3,3],[10,2,10,3],[11,2,11,3],[12,2,12,3],[13,2,13,3],[14,2,14,3],[18,2,18,3]],"flags":["formulas_cached_only"]}
[null,"1.","Record Nr.",null,"UNINA9911019099703321"]
[null,null,"Titolo",null,"Electron microscopy : principles and fundamentals / / edited by S. Amelinckx ... [et al.]"]
[null,null,"Pubbl/distr/stampa",null,"Weinheim [Germany], : VCH, a Wiley Co., 1997"]
[null,null,"ISBN",null,"9786611842550"]
[{"$nulls":4},"9781281842558"]
[{"$nulls":4},"1281842559"]
[{"$nulls":4},"9783527614561"]
[{"$nulls":4},"3527614567"]
[{"$nulls":4},"9783527614554"]
[{"$nulls":4},"3527614559"]
[null,null,"Descrizione fisica",null,"1 online resource (529 p.)"]
[null,null,"Disciplina",null,"502.825"]
[null,null,"Soggetti",null,"Electron microscopy"]
[null,null,"Lingua di pubblicazione",null,"Inglese"]
[null,null,"Formato",null,"Materiale a stampa"]
[null,null,null,"Livello bibliografico","Monografia"]
[null,null,null,"Note generali","Description based upon print version of record."]
[null,null,null,"Nota di bibliografia","Includes bibliographical references and index."]
[null,null,"Nota di contenuto",null,"Electron Microscopy Principles and Fundamentals; Contents; Introduction; 1 Stationary Beam Methods; 1.1 Transmission Electron Microscopy; 1.1.1 Diffraction Contrast Transmission Electron Microscopy; 1.1.2 High-Resolution Electron Microscopy; 1.2 Reflection Electron Microscopy; 1.3 Electron Energy-Loss Spectroscopy Imaging; 1.4 High Voltage Electron Microscopy; 1.5 Convergent Beam Electron Diffraction; 1.6 Low-Energy Electron Microscopy; 1.7 Lorentz Microscopy; 1.8 Electron Holography Methods; 1.9 Spin-Polarized Low-Energy; 2 Scanning Beam Methods; 2.1 Scanning Reflection Electron Microscopy"]
[{"$nulls":4},"2.2 Scanning Transmission Electron Microscopy2.3 Scanning-Transmission Electron Microscopy : Z Contrast; 2.4 Scanning Auger Microscopy (SAM) and Imaging X-Ray Photoelectron Microscopy (XPS); 2.5 Scanning Microanalysis; 2.6 Imaging Secondary Ion Mass Spectrometry; 2.7 Scanning Electron Microscopy with Polarization Analysis (SEMPA); Index"]
[null,null,null,"Sommario/riassunto","Derived from the successful three-volume Handbook of Microscopy, this book provides a broad survey of the physical fundamentals and principles of all modern techniques of electron microscopy. This reference work on the method most often used for the characterization "]
[{"$nulls":4},"of surfaces offers a competent comparison of the feasibilities of the latest developments in this field of research.Topics include:* Stationary Beam Methods: Transmission Electron Microscopy/ Electron Energy Loss Spectroscopy/ Convergent Electron Beam Diffraction/ Low Energy Electron Microscopy/ Electron Holographic Met"]