{"text_format":"2","workbook":"xls","n_sheets":1,"sheets":["report2"],"not_rendered":{"charts":0,"images":0,"macros":0,"external_links":1,"defined_names":1,"comments":0,"pivot_tables":0},"unopened":[],"bounds":{"document_bytes":16777216,"sheet_cells":100000,"run_cost":"one","rows_first":2000,"rows_last":500,"rows_between":2000,"halvings":0,"cell_chars":16384,"cell_head_chars":4096},"cells_cut":0,"cells_raw":0,"read":"whole","date_system":"1900","formulas":"cached_only"}

{"sheet":"report2","index":0,"n_rows":33,"n_cols":5,"rows_kept":33,"cut":false,"hidden":false,"merged":[[0,2,0,3],[0,4,0,5],[1,2,1,3],[1,4,1,5],[2,2,2,3],[2,4,2,5],[3,2,3,3],[4,2,4,3],[10,2,10,3],[11,2,11,3],[12,2,12,3],[19,2,19,3],[20,2,20,3],[23,2,23,3]],"flags":["formulas_cached_only"]}
[null,"1.","Record Nr.",null,"UNINA9911007158903321"]
[null,null,"Autore",null,"Quigley Jon M."]
[null,null,"Titolo",null,"SAE International's dictionary of testing, verification, and validation / / by Jon M. Quigley, PMP, CTFL"]
[null,null,"Pubbl/distr/stampa",null,"Warrendale, Pennsylvania : , : SAE International, , 2023"]
[null,null,"ISBN",null,"9781523158041"]
[{"$nulls":4},"1523158042"]
[{"$nulls":4},"9781468605914"]
[{"$nulls":4},"1468605917"]
[{"$nulls":4},"9781468605921"]
[{"$nulls":4},"1468605925"]
[null,null,"Edizione",null,"[1st ed.]"]
[null,null,"Descrizione fisica",null,"1 online resource (1 PDF (viii, 453 pages)) : illustrations ; ; cm"]
[null,null,"Soggetti",null,"Quality assurance"]
[{"$nulls":4},"Engineering"]
[{"$nulls":4},"Technology - Testing"]
[{"$nulls":4},"TECHNOLOGY & ENGINEERING / Quality Control"]
[{"$nulls":4},"TECHNOLOGY & ENGINEERING / Engineering (General)"]
[{"$nulls":4},"Industrial quality control"]
[{"$nulls":4},"Engineering: general"]
[null,null,"Lingua di pubblicazione",null,"Inglese"]
[null,null,"Formato",null,"Materiale a stampa"]
[null,null,null,"Livello bibliografico","Monografia"]
[null,null,null,"Nota di bibliografia","Includes bibliographical references (pages 421-434) and index."]
[null,null,"Nota di contenuto",null,"Front Cover -- Title Page -- Copyright Page -- Contents -- Preface -- A -- Accelerated Testing -- Acceleration Factor -- Acceptance Criteria -- Acceptance Testing -- Accessibility Testing -- Accuracy -- Active Design of Experiments (ADoE) -- Actor-Observer Bias -- Actual Result -- Ad Hoc Review -- Ad Hoc Testing -- Adaptability -- Adaptation -- Advanced Driver Assistance System (ADAS) -- Agile -- Agile Testing -- Aging Tests -- Alpha Testing -- Anomaly -- Altitude Test -- Amp Meter -- Analyzability -- Anechoic Chamber -- API Testing -- Application Binary Interface -- Architectures -- Artifacts -- Artificial Intelligence (AI) -- Attack Vectors -- Audit -- Augmented Reality -- Authority Bias -- Automated Testing -- Automated Testware -- Automotive Safety Integrity Level -- Autosar -- Availability -- B -- B10 -- Back-to-Back Testing -- Basis Path Testing -- Basis Set -- Behavior -- Belief Bias -- Belief Revision -- Benchmark Test -- Berkson's "]
[{"$nulls":4},"Paradox -- Beta Testing -- Bias -- Big Bang Testing -- Binary Portability Testing -- Black-Box Testing -- Blocked Test Case -- Bottom-Up Testing -- Boundary Condition -- Boundary Testing -- Boundary Testing-Three Point -- Boundary Testing-Two Point -- Boundary Value -- Boundary Value Analysis -- Boundary Value Coverage -- Brake Rotor and Drum Modal Frequencies Verification -- Branch Coverage -- Branch Testing -- Bug -- Bulk Current Injection (BCI) -- Burndown Chart -- Business Process-Based Testing -- C -- Calibration -- Caliper -- Capability Maturity Model for Software -- Capture/Replay Tool -- Cauchy Distribution -- Cause-Effect Analysis -- Cause-Effect Diagram -- Central Tendency -- Change Management (Product) -- Changeability -- Checklist-Based Review -- Chemical Exposure -- Classification Tree -- Classification Tree Method -- Client Server Applications -- Closed-Loop Testing -- Cloud-Based Testing."]
[{"$nulls":4},"Clustering Illusion -- CMMI (Capability Maturity Model Integration) -- Capability Levels -- Maturity Level -- Code Complete -- Code Coverage -- Code Inspection -- Code Review -- Code Walkthrough -- Combinatorial Explosion -- Combinatorial Testing -- Combined Environmental Testing -- Commercial Off the Shelf (COTS) -- Communication Testing -- Comparison Testing -- Compatibility -- Compatibility Testing -- Compile -- Compiler -- Complexity -- Compliance Testing -- Component Integration Testing -- Component Specification -- Component Testing -- Compound Condition Testing -- Computational Fluid Dynamics (CFD) -- Computer-Aided Software Testing -- Computer Simulation -- Concurrency Testing -- Condition -- Condition Coverage -- Condition Determination Testing -- Condition Testing -- Conditioning -- Confidence Interval -- Configuration Accounting -- Configuration Audit -- Configuration Control -- Configuration Identification -- Configuration Item -- Configuration Management -- Configuration Management Plan -- Confirmation Bias -- Confirmation Testing -- Conformance Testing -- Confounding -- Confusion Matrix -- Conjunctive Fallacy -- Context-Driven Testing -- Continuing Conformance Testing -- Contractual Testing -- Contradiction Testing -- Control Flow Testing -- Control Plan -- Corner Cases -- Corrective Actions -- Corrosion Testing -- Co-Simulation -- Cost-Benefit Analysis -- Cost of Quality -- Costs of Detection -- Costs of External Failure -- Costs of Internal Failure -- Costs of Prevention -- Courtesy Bias -- Coverage Tool -- Cross-Continuity Test -- Curse of Knowledge -- Customer Evaluation -- Cyclomatic Complexity -- D -- Daily Build -- Data-Driven Testing -- Data Flow -- Data Flow Testing -- Debugger -- Debugging Tools -- Decision Condition Testing -- Decision Coverage -- Decision Table -- Decision Testing -- Deembrittlement Verification Test."]
[{"$nulls":4},"Defect -- Defect Arrival Rate -- Defect Closing Rate -- Defect Containment -- Defect Density -- Defect Detection Percentage -- Defect Management -- Defect Masking -- Defect Taxonomy -- Dependency Testing -- Dependent Failures -- Design-Based Testing -- Design of Experiments (DoE) -- Destructive Testing -- Development Models -- Deviations -- Device under Test -- DFMEA -- Digital Model -- Digital Twin -- Documentation Testing -- Domain Testing -- Driver-in-Loop Simulator -- Drop Test -- Dunning-Kruger Effect -- DVP&amp -- R (Design Verification Plan and Report) -- Dynamic Analysis Tool -- Dynamic Testing -- Dynamometer Testing -- E -- Edges -- Efficiency Testing -- Electromagnetic Compatibility (EMC) -- Electromagnetic Immunity -- Electrostatic Discharge (ESD) -- Elementary Comparison Testing (ECT) -- Elephant Foot Testing -- Embedded Software -- Embedded Systems -- Emulation -- Emulator -- End-of-Line Test -- End-to-End Testing -- Endurance Testing -- "]
[{"$nulls":4},"Environmental Simulation Tools -- Environmental Testing -- Equivalence Partition Coverage -- Equivalence Partitioning -- Error Guessing -- Error Seeding -- Executable Statement -- Exercised -- Exhaustive Testing -- Exit Criteria -- Expectation Bias -- Expected Result -- Experienced-Based Testing -- Exploratory Testing -- Extensibility -- F -- F-Number -- Facilitator -- Failure -- Failure Mechanism -- Failure Mode -- Failure Mode Effects Analysis -- Fatigue Failure -- Fault Injection Testing -- Fault Insertion -- Fault Report -- Fault Seeding -- Fault Severity -- Feature-Driven Development -- Feature Interaction Testing -- Feature Tuning/Calibration -- Fiberboard Testing -- Fleet Testing -- Focusing Effect -- Framing Effect -- Frozen Test Basis -- Function Coverage -- Function Generator -- Function Point -- Functional Decomposition -- Functional Fixedness -- Functional Requirement -- Functional Safety."]
[{"$nulls":4},"Functional Specification -- Functional Testing -- Fungus -- Fuzzing Inputs -- G -- Gauge Repeatability and Reproducibility -- Gaussian Distribution -- Genetic Algorithm -- Golden Unit -- Gorilla Testing -- Gray-Box Testing -- Ground Truth Data -- GUI -- H -- Hacker -- Hacking -- Halo Effect -- Halstead Number -- HALT -- Hardness Testing O-Rings -- Hardware-Based Fault Injection Testing -- Hardware Platform -- Hardware-Software Integration Testing -- HASS -- High-Order Tests -- Hijacking -- HIL Testing -- Hindsight Bias -- Histogram -- Homologation Testing -- Horns Effect -- Horsepower Testing -- Hostile Attribution Bias -- Hot Hand Fallacy -- Humidity -- Hybrid Fault Injection Testing -- Hyper D -- I -- ICE -- Illusion of Control -- Illusion of Validity -- Illusory Correlation -- Impact Analysis -- Impact Bias -- Incident Logging -- Incident Management Life Cycle -- Incident Report -- In-Circuit Emulator -- Incremental Integration Testing -- Incremental Testing -- Independent Test and Verification -- Independent Test Group (ITG) -- Infant Mortality -- Information Bias -- Infrared Testing -- Ingroup Bias -- Insensitivity to Sample Size -- Inspection -- Installation Testing -- Instrumentation -- Integration Coverage -- Integration Testing -- Intermittent -- Invalid Partitions -- IRR -- Irrelevant Failures -- Iterative Development -- K -- Key Control Characteristics -- Key Product Characteristics -- KLOC -- L -- Labcar -- Law of the Instrument -- Level of Effort -- Life Cycle Model (Product) -- Load Dump -- Load Testing -- Localization Testing -- Loop Testing -- M -- Machine Learning -- Maintainability -- Mean -- Mean Time between Failure -- Mean Time to Failure -- Measurement -- Measurement System Analysis (MSA) -- Mechanical Shock -- Mechanical Vibration -- Median -- Microcontroller -- Mileage Accumulation -- Milestone -- Mode."]
[{"$nulls":4},"Model-Based Development -- Model-Based Testing -- Modeling Tool -- Moderator -- Module Testing -- Monkey Testing -- Monte Carlo Simulation -- Mutation Testing -- N -- Negative Testing -- Negativity Bias -- Neglect of Probability -- Network Testing -- Neural Networks -- Nonfunctional Testing -- Normal Distribution -- Normalcy Bias -- O -- OBD Testing -- Object-Oriented Applications -- Ontology-Based Simulation -- Open-Loop Testing -- Operating System -- Operational Acceptance Testing -- Operational Environment -- Optimism Bias -- Oracles -- Oscilloscope -- Ostrich Effect -- Outcome Bias -- Outgassing -- Overconfidence Effect -- Overstress -- P -- Pairwise Testing -- Parameter -- Pareidolia -- Pareto Chart -- Parkinson's Law of Triviality -- Pass/Fail Criteria -- Path Coverage -- Path Testing -- P-Diagram -- Pen Tester -- Penetration Testing -- Perception Testing -- Performance Testing -- Pessimism Bias -- PFMEA -- Planning Fallacy -- Planning Poker -- Population -- Portability Testing -- Positive Testing -- Postcondition -- Pragmatic Testing -- Precondition -- "]
[{"$nulls":4},"Probability -- Probe Effect -- Process Metric -- Processor Load Testing -- Product Metric -- Product Quality Predictions -- Product Requirements Analysis -- Project Deafness -- Project Management -- Prototype -- PUGH Matrix -- Q -- Quality Assurance -- Quality Assurance Plan -- Quality Audit -- Quality Circle -- Quality Control -- Quality Management -- R -- Ramp Testing -- Range -- Range Testing (Vehicle) -- Range Testing (Wireless) -- Rayleigh Distribution -- Reactance -- Reactive Devaluation -- Real-Time Simulation -- Recovery Testing -- Regression -- Regression Testing -- Regressive Bias -- Release Candidate -- Release Notes -- Reliability -- Reliability and Confidence -- Reliability Growth Model -- Repeatable/Repeatability -- Reproducibility -- Requirements -- Requirements-Based Testing."]
[{"$nulls":4},"Re-Simulation Testing."]
[null,null,null,"Sommario/riassunto","Created to elevate expertise in testing, verification, and validation with industry-specific terminology, readers are empowered to navigate the complex world of quality assurance. From foundational concepts to advanced principles, each entry provides clarity and depth, ensuring the reader becomes well-versed in the language of precision. This dictionary is an indispensable companion for both professionals and students seeking to unravel the nuances of testing methodologies, verification techniques, and validation processes. Readers will be equipped with the tools to communicate effectively, make informed decisions, and excel in projects. In addition, references to SAE Standards are included to direct the read to additional information beyond a practical definition."]