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[null,"1.","Record Nr.",null,"UNINA9911006718403321"]
[null,null,"Autore",null,"Chiang Young J"]
[null,null,"Titolo",null,"Product Design and Testing for Automotive Engineering"]
[null,null,"Pubbl/distr/stampa",null,"Warrendale : , : SAE International, , 2024"]
[{"$nulls":4},"©2024"]
[null,null,"ISBN",null,"9781523163342"]
[{"$nulls":4},"1523163348"]
[{"$nulls":4},"9781468607727"]
[{"$nulls":4},"1468607723"]
[{"$nulls":4},"9781468607697"]
[{"$nulls":4},"1468607693"]
[null,null,"Edizione",null,"[1st ed.]"]
[null,null,"Descrizione fisica",null,"1 online resource (398 pages)"]
[null,null,"Collana",null,"Design of Experiments for Product Reliability Growth with Automotive Applications Series ; ; v.2"]
[null,null,"Soggetti",null,"Reliability (Engineering)"]
[{"$nulls":4},"Engineering design"]
[null,null,"Lingua di pubblicazione",null,"Inglese"]
[null,null,"Formato",null,"Materiale a stampa"]
[null,null,null,"Livello bibliografico","Monografia"]
[null,null,"Nota di contenuto",null,"Front Cover -- Title Page -- Copyright Page -- From the Publisher -- Contents -- Preface -- Acronyms -- Nomenclature -- Introduction -- Chapter 7: Tolerancing for Assembly and Manufacturing -- 7.1 Tolerance Design -- 7.1.1 Analytic Methods -- 7.1.2 Linear Dimensional Chain -- 7.1.3 Vector-Loop Model -- 7.1.4 Tolerance Analysis Example: One-Way Clutch Assembly -- 7.1.5 Tolerance Allocation -- 7.1.6 Average, Variance, Skewness, and Kurtosis -- 7.2 Dimensional Management -- 7.2.1 Cost Function for Part Fabrication -- 7.2.2 Fabrication Capability -- 7.2.3 Control Plan Methodology -- 7.3 Deterministic Tolerance Design -- 7.3.1 Worst-Limit Method -- 7.3.2 One-Way Clutch Example by DOEs -- 7.3.3 Deterministic Tolerance Synthesis -- 7.3.4 Loss Function by Deterministic Tolerance Design -- 7.4 Statistical Tolerance Design by RSS Method -- 7.4.1 Tolerance Analysis Using RSS Formulae -- 7.4.2 Modified Root-Mean-Squared Method -- 7.4.3 Tolerance Allocation by Machining Capability -- 7.4.4 Tolerance Allocation by Cost-Benefit Equation -- 7.4.5 Nonlinear Case: Capability Study on One-Way Clutch -- 7.4.5.1 Capability Study on Gap -- 7.4.5.2 Capability Study on Angular Position -- 7.5 Statistical Tolerance Design by Monte Carlo Simulations -- 7.5.1 "]
[{"$nulls":4},"Concerns of Dimensional Control over Normality Assumption -- 7.5.2 Monte Carlo Simulations -- 7.5.3 Characterizing Dimensions Using Statistical Distributions -- 7.5.3.1 Random Number Generation -- 7.5.3.2 Dimensional Characterization with No Tolerance Data -- 7.5.3.3 Dimensional Characterization with a Known Statistical Distribution -- 7.5.4 Example: Actuating Mechanism -- 7.5.5 Example: Electric Circuits -- 7.5.6 Histogram -- 7.6 Mean Shift -- 7.6.1 Tolerance Due to Mean Shift -- 7.6.2 Mean Shift Due to Tool Wear Using Monte Carlo Simulation -- 7.7 Hole and Shaft Effects."]
[{"$nulls":4},"7.7.1 International Standards for Holes and Shafts -- 7.7.2 Virtual Condition -- 7.7.3 Resultant Condition -- 7.7.4 Equal Bilateral Tolerance of Pin and Hole -- 7.7.5 Tolerance Stack-Up with Material Conditions -- 7.8 Identification of Dimensions by Method of Moments Estimator (MME) -- 7.8.1 Moment-Generating Functions -- 7.8.2 Blend of Method of Moments and Monte Carlo Simulation -- 7.9 Identification of Dimensions by MLE -- 7.9.1 Log-Likelihood Function and Likelihood Equations for Normal Distribution -- 7.9.2 Log-Likelihood Function and Likelihood Equations for Weibull Distribution -- 7.9.3 Identification of Dimensions Using Minitab -- 7.10 Finite Element Tolerance Analysis with Skin Model Shapes -- 7.11 Homogenous Transformations for Tolerance Analysis -- 7.11.1 Homogeneous Transformations in 3D Space -- 7.11.2 Translational and Rotational Matrices for Both Kinematic and Tolerance Variations -- 7.11.3 Stochastic Contact Variations -- 7.12 Perturbation Analysis and Direct Linearization Method (DLM) -- 7.13 T-Map Algorithm -- 7.14 Tolerance Design Procedure and Software -- 7.14.1 Variation Simulation Analysis (VSA) -- 7.14.2 CETOL 6σ -- 7.14.3 3DCS -- 7.14.4 ANATOLEFLEX -- 7.15 Overview of GD&amp -- T -- 7.15.1 Datum -- 7.15.2 Dimensions -- 7.15.3 Tolerancing -- 7.15.4 Material Conditions -- 7.15.5 Surface Textures -- 7.15.6 Units -- References -- Chapter 8: Lognormal Transformations in DOE -- 8.1 Reliability DOEs -- 8.1.1 Logarithmic Transformations -- 8.1.2 Data Types -- 8.1.3 Data Censoring -- 8.1.4 Type I Censoring -- 8.2 Lognormal Distribution -- 8.2.1 Lognormal PDF -- 8.2.2 Lognormal CDF -- 8.2.3 Characteristics of Lognormal Distribution -- 8.2.4 Multiplicative Property of Two Lognormal Distributions -- 8.2.5 Curve Fitting to the Lognormally Distributed Data -- 8.2.6 Standardized Residuals for Lognormal Distribution."]
[{"$nulls":4},"8.3 DOE-LN by Means of DOE-t or DOE-F -- 8.3.1 Logarithmic Transformation -- 8.3.2 Example: Tool Life Subjected to Turning Operations -- 8.4 Maximum-Likelihood Method for DOE-LN -- 8.4.1 Coupling between Process Acceleration Model and Lognormal Distribution Model -- 8.4.2 MLE -- 8.4.3 Null Hypothesis for Maximum-Likelihood Method -- 8.4.4 Maximum-Likelihood Method with Test-to-Failure, Suspended, and Interval Data -- 8.4.5 Maximum-Likelihood Regression with Test-to-Failure and Right-Suspended Data -- 8.4.6 Standardized Residuals for Lognormal Distribution -- 8.5 Statistical Inference Using LR by χ 2 Distribution -- 8.5.1 Statistical Inference by χ 2 Distribution -- 8.5.2 Acceptance Sampling Plans by Chi-Squared Statistic -- 8.6 Reduction in Product Variability -- 8.6.1 Robust Engineering Design -- 8.6.2 Logarithmic Transformation of Sample Variances for Variability Study -- 8.6.3 Noises -- 8.7 MLE for DOE-LN Parameters -- 8.7.1 Lognormal Distribution Solution by DOE-t -- 8.7.2 Lognormal Distribution Solution by MLE -- 8.8 Example: Insulation Aging of Electric Motor Windings -- 8.8.1 Insulation Aging of Electric Motor Windings via DOE-t -- 8.8.2 Insulation Aging of Electric Motor Windings via MLE -- 8.9 MLE for DOE-LN Parameters with Incomplete Data -- 8.10 Alternate Viable Transformations -- 8.10.1 Individual Distribution Identification -- 8.10.2 Box-Cox "]
[{"$nulls":4},"Transformations -- 8.10.3 Adjustment to ln or log Transformation -- 8.10.4 Y 1/2 Transformation -- 8.10.5 Sin −1 (Y δ) Transformation -- 8.10.6 Sinh Transformation -- 8.10.7 Sinh-Arcsinh Transformation -- 8.10.8 Signal-to-Noise Ratio -- 8.11 Finite Lognormal Mixture Distribution -- 8.12 Statistical Inference from Fisher Information -- 8.12.1 FIM for DOEs in Lognormal Distribution -- 8.12.2 Bounds on Estimated Lognormal Parameters by FIM -- 8.12.3 Bounds on Estimated Lognormal Parameter σ y by FIM."]
[{"$nulls":4},"8.12.4 Confidence Bounds on Function lnL ln () -- 8.12.5 Bounds on Estimated Functional Coefficients and Parameters -- 8.12.6 Bounds on Estimated Model Parameter σ y for Ball Grid Array Packaging -- References -- Chapter 9: Weibull Reliability and DOEs -- 9.1 Product Reliability as Measured by Noncompliance -- 9.1.1 Hazard Rate -- 9.1.2 Reliability and Unreliability -- 9.2 Product Reliability Growth Based on the Weibull Distributions -- 9.2.1 Shape Factor β -- 9.2.2 Scale Factor η -- 9.2.3 Guaranteed Value t 0 -- 9.2.4 Mean and Standard Deviation -- 9.2.5 Median and Mode -- 9.2.6 Two-Parameter Weibull Distribution -- 9.2.7 Standard Weibull Distribution -- 9.2.8 SEV Distribution -- 9.2.9 Standard SEV Distribution -- 9.2.10 Largest Extreme-Value Distribution -- 9.3 Reliability Demonstration Testing (RDT) -- 9.3.1 Statistics of RDT -- 9.3.2 Substantiation Test -- 9.3.3 Cumulative Fault Frequency (CFF) -- 9.3.4 Weibull RDT -- 9.3.5 Reliability, Confidence, and Sample Size Based on the Weibull Distribution -- 9.3.6 Decision-Making Rule with Statistical Thinking -- 9.4 Calculating Weibull Parameters by the Maximum-Likelihood Method -- 9.4.1 MLE of Weibull Parameters with Test-to-Failure Data -- 9.4.2 MLE of Weibull Parameters with Incomplete Data -- 9.4.3 MLE of Weibull Parameters with Interval Data -- 9.4.4 Unbiased Estimate of Shape Factor -- 9.5 Confidence Level for Product Life Prediction -- 9.5.1 Tolerance Interval -- 9.5.2 Lower and Upper Bounds of Lifetime by MLE -- 9.5.3 Lower Bound of Lifetime -- 9.5.4 Upper Bound of Lifetime -- 9.5.5 Upper and Lower Bounds of Estimated Parameters -- 9.5.6 CI for the Predicted Lifetime by the Bootstrap Method -- 9.6 Estimating Weibull Parameters by Method of Moments -- 9.7 Assessing Weibull Parameters by MRR -- 9.7.1 Estimating Weibull Parameters with MRR -- 9.7.2 MRR (Confidence = 50%) -- 9.7.3 Weibull Plot."]
[{"$nulls":4},"9.7.4 Upper and Lower Limits of General Ranking -- 9.7.5 Comparison of the Estimators -- 9.8 Reliability DOE-W -- 9.8.1 Coupling between DOE Model and Weibull Distribution -- 9.8.2 Finite Mixture Distribution in Two-Parameter Weibull Statistics -- 9.8.3 MLE for a Homogeneous Two-Parameter Weibull Distribution -- 9.8.4 Hypotheses in DOEs -- 9.8.5 LR Test -- 9.8.6 Standardized Residual for Weibull Distribution -- 9.9 Product Life Prediction Examples Using DOE-W -- 9.9.1 Product Life Prediction Using 2 V 5-1 Design with Right-Suspended Data -- 9.9.2 Product Life Prediction for Design with Right-Censored Data and Interval Data -- 9.10 Multi-Objective Optimization with Pareto Optimality Based on DOE-W -- 9.10.1 Central Composite Design for Evaluating Product Life with Right-Censored Data -- 9.10.2 ANOVA for Examining Flow Rate -- 9.10.3 Pareto Frontier for Design Optimization -- 9.11 Exponential Distribution -- 9.12 MLE of Hazard Rate of Exponential Distribution -- 9.12.1 MLE of λ with No Censored Data -- 9.12.2 MLE of Hazard Rate λ with Type I Right-Censored Data -- 9.12.3 Standardized Residual for Exponential Distribution -- 9.12.4 CIs for the Exponential Hazard Rate -- 9.12.5 Product Life Prediction Based on Exponential Distribution -- References -- Chapter 10: Product Reliability Growth -- 10.1 DFR Tests -- 10.1.1 Compliance Tests -- 10.1.2 Production Tests -- 10.1.3 Acceptance Test Commissioning Measurements -- 10.1.4 Service and Repair Tests -- 10.1.5 Regression "]
[{"$nulls":4},"Tests -- 10.2 Kaplan-Meier Product Limit Estimator -- 10.3 RG Analysis -- 10.3.1 Product Failure Rate -- 10.3.2 RG: Homogeneous Poisson Process (HPP) -- 10.3.3 RG: Non-HPP (NHPP) -- 10.3.4 RG-Weibull Density Function -- 10.3.5 Effectiveness of a Corrective Action -- 10.3.6 RG Management -- 10.4 Qualitative Accelerated Life Tests -- 10.4.1 FMVT -- 10.4.2 FSLT -- 10.4.3 ESS Test -- 10.4.4 HALT."]
[{"$nulls":4},"10.4.5 HASS."]
[null,null,null,"Sommario/riassunto","This book, 'Product Design and Testing for Automotive Engineering: Volume II,' authored by Young J. Chiang, is a comprehensive guide focusing on enhancing the reliability of automotive engineering through advanced design and testing methodologies. It is part of the SAE Design of Experiments (DOE) for Product Reliability Growth series. The book delves into statistical tolerance design, which impacts manufacturing and material selection, and employs methods such as maximum likelihood estimators and Monte Carlo simulations for assembly strategies. Key topics include reliability design of experiments using Weibull and exponential distributions, and the integration of physics of failure with statistical methods like Weibull statistics. The book is aimed at engineers, researchers, and automotive professionals, providing them with tools to predict and improve product reliability, optimize part and system designs, and refine lifecycle predictions through accelerated life tests."]