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[null,"1.","Record Nr.",null,"UNISALENTO991000680719707536"]
[null,null,"Autore",null,"Commissione italiana per l'anno internazionale del bambino"]
[null,null,"Titolo",null,"Il bambino nella realtà sociale : conferenza nazionale dell'infanzia : Roma, 13-15 marzo 1980 / Commissione italiana per l'anno internazionale del bambino, contributi dei gruppi di lavoro"]
[null,null,"Pubbl/distr/stampa",null,"Roma : Istituto poligrafico e Zecca dello stato, 1980"]
[null,null,"Descrizione fisica",null,"93 p. ; 24 cm"]
[null,null,"Disciplina",null,"370.19"]
[null,null,"Soggetti",null,"Bambini - Assistenza e previdenza - Congressi"]
[{"$nulls":4},"Bambini - Comportamento sociale - Congressi"]
[{"$nulls":4},"Bambini e comunicazioni di massa - Congressi"]
[null,null,"Lingua di pubblicazione",null,"Italiano"]
[null,null,"Formato",null,"Materiale a stampa"]
[null,null,null,"Livello bibliografico","Monografia"]
[null,"2.","Record Nr.",null,"UNINA9911006600003321"]
[null,null,"Autore",null,"Pham Hoang"]
[null,null,"Titolo",null,"Reliability modeling, analysis and optimization / / Hoang Pham"]
[null,null,"Pubbl/distr/stampa",null,"Hackensack, NJ, : World Scientific, c2006"]
[null,null,"ISBN",null,"9786611908973"]
[{"$nulls":4},"9781281908971"]
[{"$nulls":4},"1281908975"]
[{"$nulls":4},"9789812707147"]
[{"$nulls":4},"981270714X"]
[null,null,"Descrizione fisica",null,"1 online resource (506 p.)"]
[null,null,"Collana",null,"Series on quality, reliability and engineering statistics ; ; vol. 9"]
[null,null,"Disciplina",null,"620/.00452"]
[null,null,"Soggetti",null,"Computer software - Reliability"]
[{"$nulls":4},"Reliability (Engineering)"]
[{"$nulls":4},"Reliability (Engineering) - Mathematical models"]
[null,null,"Lingua di pubblicazione",null,"Inglese"]
[null,null,"Formato",null,"Materiale a stampa"]
[null,null,null,"Livello bibliografico","Monografia"]
[null,null,null,"Note generali","Description based upon print version of record."]
[null,null,null,"Nota di bibliografia","Includes bibliographical references and index."]
[null,null,"Nota di contenuto",null,"Contents; Preface; List of Contributors; I. RELIABILITY MODELING; 1. Numerical Computation of the Marginal Distributions of a Semi-Markov Process C. Cocozza-Thivent and R. Eymard; 1. Introduction; 2. Equations for the Marginal Distributions; 2.1. The general case; 2.2. Case of an initial distribution given by a density; 2.3. Case of a Dirac initial distribution; 2.4. Resolution of particular cases using convolution tools; 3. An Approximation Using a Finite Volume Method; 4. Numerical Examples; 4.1. Case of an alternating renewal process; 4.2. Examples with more than two states; 5. Conclusion"]
[{"$nulls":4},"References2. Optimal Checkpointing Interval for Task Duplication with Spare Processing S. Nakagawa, Y. Okuda and S. Yamada; 1. Introduction; 2. Double Modular Redundant System; 3. Roll-Forward and Rollback Recoveries; 4. Optimal Checkpointing Interval; 5. Numerical Examples; 6. Conclusions; References; 3. Monitoring Inter-ArrivalTimes with Statistical Control Charts P. R. Sharma, M. Xie and T. N. Goh; 1. Introduction; 2. Overview: Some Useful Control Charts; 2.1. CQC-charts; 2.2. Exponential CUSUM charts; 2.3. CQC -charts; 3. Comparison Based on ARL and ATS Performance"]
[{"$nulls":4},"5. Discrete-Time Economic Manufacturing Quantity Model with Stochastic Machine Breakdown and Repair B. C. Giri and T. Dohi1. Introduction; 2. Brief Literature Review; 3. The General Model; 3.1. "]
[{"$nulls":4},"Notation; 3.2. Basic assumption; 3.3. Model formulation; 4. The Case of Geometric Failure and Geometric Repair; 5. The Model under General Failure and Constant Repair; 6. The Case of Geometric Failure and Constant Repair; 7. Numerical Illustration; 8. Concluding Remarks; Acknowledgments; References; 6. Applying Accelerated Life Models to HALT Testing F. Guérin, P. Lantieri and B. Dumon; 1. Introduction"]
[{"$nulls":4},"2. Maturity Design Testing: HALT2.1. Thermal step stress test; 2.2. Rapid thermal transitions stress test; 3. Accelerated Life Testing; 3.1. Test plan definition; 3.2. Common lifetime distributions; 3.2.1. Exponential distribution; 3.2.2. Weibull distribution; 3.3. Accelerated life test models; 3.3.1. Arrhenius model; 3.3.2. Eyring model; 3.3.3. Inverse power model; 4. Applying Accelerated Life Models to HALT Testing; 4.1. Thermal step stress test; 4.2. Combined step stress test (temperature and voltage); 4.3. Rapid thermal transitions stress test; 4.4. Voltage step stress test; 5. Conclusion"]
[{"$nulls":4},"References"]
[null,null,null,"Sommario/riassunto","\"As our modern information-age society grows in complexity both in terms of embedded systems and applications, the problems and challenges in reliability become ever more complex. Bringing together many of the leading experts in the field, this volume presents a broad picture of current research on system modeling and optimization in reliability and its applications. The book comprises twenty-three chapters organized into four parts: Reliability Modeling, Software Quality Engineering, Software Reliability, and Maintenance and Inspection Policies. These sections cover a wide range of important topics, including system reliability modeling, optimization, software reliability and quality, maintenance theory and inspection, reliability failure analysis, sampling plans and schemes, software development processes and improvement, stochastic process modeling, statistical distributions and analysis, fault-tolerant performance, software measurements and cost effectiveness, queueing theory and applications, system availability, reliability of repairable systems, testing sampling inspection, software capability maturity model, accelerated life modeling, statistical control, and HALT testing.\""]