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[null,"1.","Record Nr.",null,"UNINA9910144717503321"]
[null,null,"Autore",null,"DiNardo N. John"]
[null,null,"Titolo",null,"Nanoscale characterization of surfaces and interfaces / / N. John DiNardo"]
[null,null,"Pubbl/distr/stampa",null,"Weinheim, [Germany] : , : VCH, , 1994"]
[{"$nulls":4},"©1994"]
[null,null,"ISBN",null,"1-281-84293-1"]
[{"$nulls":4},"9786611842932"]
[{"$nulls":4},"3-527-61595-4"]
[{"$nulls":4},"3-527-61594-6"]
[null,null,"Descrizione fisica",null,"1 online resource (176 p.)"]
[null,null,"Disciplina",null,"530.427"]
[{"$nulls":4},"620.44"]
[null,null,"Soggetti",null,"Surfaces (Physics)"]
[{"$nulls":4},"Scanning tunneling microscopy"]
[{"$nulls":4},"Nanotechnology"]
[null,null,"Lingua di pubblicazione",null,"Inglese"]
[null,null,"Formato",null,"Materiale a stampa"]
[null,null,null,"Livello bibliografico","Monografia"]
[null,null,null,"Note generali","Description based upon print version of record."]
[null,null,null,"Nota di bibliografia","Includes bibliographical references."]
[null,null,"Nota di contenuto",null,"Nanoscale Characterization of Surfaces and Interfaces; Nanoscale Characterization of Surfaces and Interfaces; List of Symbols and Abbreviations; 1 Introduction; 2 Scanning Tunneling Microscopy (STM); 2.1 Historical Perspective; 2.2 Theory; 2.2.1 Electron Tunneling and STM Imaging; 2.2.2 Scanning Tunneling Spectroscopy (STS); 2.2.3 Inelastic Tunneling Spectroscopy; 2.2.4 Ballistic Electron Emission Microscopy (BEEM); 2.3 Instrumentation; 2.3.1 Microscope Design: STM Heads; 2.3.2 Tips; 2.3.3 Vibration and Shock Isolation; 2.3.4 Electronics; 2.3.5 Microcomputer Control"]
[{"$nulls":4},"2.6.2 Surface Diffusion2.6.3 Stepped Surfaces; 2.6.4 Adsorbate-Induced Reconstructions of Metal Surfaces; 2.6.5 Growth of Metallic Adlayers; 2.6.6 Resistivity in Polycrystalline Metals - Scanning Tunneling Potentiometry; 2.7 Insulators; 2.8 Layered Compounds .; 2.9 Charge Density Wave Systems; 2.10 Superconductors; 2.11 Molecular Films, Adsorbates, and Surface Chemistry; 2.11.1 Molecular Imaging; 2.11.2 Adsorption and Surface Chemistry; 2.12 Electrochemistry at Liquid-Solid Interfaces; 2.1 3 Biological Systems; 2.14 Metrological Applications; 3 Atomic Force Microscopy"]
[{"$nulls":4},"3.1 Atomic Force Imaging3.1.1 Graphite; 3.1.2 Insulators; 3.1.3 Metals; "]
[{"$nulls":4},"3.1.4 Films; 3.1.5 Polymer Surfaces and Metal Films on Polymer Substrates; 3.1.6 Biological Molecules; 3.1.7 Adsorption Dynamics of Biological Molecules in Real Time; 3.2 Nanoscale Surface Forces; 3.3 Nanotribology; 3.4 Non-Contact Imaging; 3.4.1 Van der Waals Forces; 3.4.2 Electrostatic Forces; 3.4.3 Magnetic Forces; 4 Manipulation of Atoms and Atom Clusters on the Nanoscale; 4.1 Transfer of Atoms and Atom Clusters Between Tip and Sample; 4.2 Tip-Induced Lateral Motion of Atoms on Surfaces"]
[{"$nulls":4},"4.3 Nanoscale Modification by Tip-Induced Local Electron-Stimulated Desorption4.4 Nanoscale Chemical Modification; 4.5 High-Temperature Nanofabrication; 4.6 Nanoscale Surface Modification Using the AFM; 4.7 Towards Nanoscale Devices; 5 Spin-offs of STM - Non-Contact Nanoscale Probes; 5.1 Scanning Near-Field Optical Microscope (SNOM); 5.2 Photon Scanning Tunneling Microscope (PSTM); 5.3 Scanning Thermal Profiler (STP); 5.4 Scanning Chemical Potential Microscope (SCPM); 5.5 Optical Absorption Microscope (OAM); 5.6 Scanning Ion Conductance Microscope (SICM); 6 Acknowledgements; 7 References"]
[null,null,null,"Sommario/riassunto","Derived from the highly acclaimed series Materials Science and Technology, this book provides in-depth coverage of STM, AFM, and related non-contact nanoscale probes along with detailed applications, such as the manipulation of atoms and clusters on a nanometer scale. The methods are described in terms of the physics and the technology of the methods and many high-quality images demonstrate the power of these techniques in the investigation of surfaces and the processes which occur on them.Topics include:Semiconductor Surfaces and Interfaces * Insulators * Layered Compounds * Charg"]
[null,"2.","Record Nr.",null,"UNINA9911006524703321"]
[null,null,"Titolo",null,"Marine acoustics : direct and inverse problems / / James L. Buchanan ... [et al.]"]
[null,null,"Pubbl/distr/stampa",null,"Philadelphia, Pa., : Society for Industrial and Applied Mathematics (SIAM, 3600 Market Street, Floor 6, Philadelphia, PA 19104), 2004"]
[null,null,"ISBN",null,"0-89871-798-1"]
[{"$nulls":4},"1-60119-020-4"]
[null,null,"Descrizione fisica",null,"1 electronic text (xii, 336 p. : ill.) : digital file"]
[null,null,"Disciplina",null,"620.2/5"]
[null,null,"Soggetti",null,"Underwater acoustics"]
[null,null,"Lingua di pubblicazione",null,"Inglese"]
[null,null,"Formato",null,"Materiale a stampa"]
[null,null,null,"Livello bibliografico","Monografia"]
[null,null,null,"Note generali","Bibliographic Level Mode of Issuance: Monograph"]
[null,null,null,"Nota di bibliografia","Includes bibliographical references (p. 299-331) and index."]
[null,null,"Nota di contenuto",null,"Preface -- Chapter 1: The Mechanics of Continua -- Chapter 2: Direct Scattering Problems -- Chapter 3: Inverse Scattering in Ocean Environments -- Chapter 4: Oceans Over Elastic Basements -- Chapter 5: Shallow Oceans Over Poroelastic Seabeds -- Chapter 6: Homogenization of the Seabed and other Asymptotic Methods -- Index."]
[null,null,null,"Sommario/riassunto","This book presents current research trends in the field of underwater acoustic wave direct and inverse problems. Until very recently, little has been published concerning model-based inversions of the boundaries and material constants of finite-sized targets located either in the water column or the sediments. This text is the first to investigate inverse problems in an ocean environment with a heavy emphasis placed on the description and resolution of the forward scattering problem."]