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[null,null,"Autore",null,"Chen C. Julian"]
[null,null,"Titolo",null,"Introduction to scanning tunneling microscopy / / C. Julian Chen"]
[null,null,"Pubbl/distr/stampa",null,"Oxford : , : Oxford University Press, , 2023"]
[null,null,"ISBN",null,"0-19-773239-9"]
[{"$nulls":4},"0-19-802356-1"]
[{"$nulls":4},"1-4237-6461-7"]
[null,null,"Edizione",null,"[1st ed.]"]
[null,null,"Descrizione fisica",null,"1 online resource (469 p.)"]
[null,null,"Collana",null,"Oxford scholarship online"]
[null,null,"Disciplina",null,"502/.8/2"]
[null,null,"Soggetti",null,"Scanning tunneling microscopy"]
[null,null,"Lingua di pubblicazione",null,"Inglese"]
[null,null,"Formato",null,"Materiale a stampa"]
[null,null,null,"Livello bibliografico","Monografia"]
[null,null,null,"Note generali","Previously issued in print: 1993."]
[null,null,null,"Nota di bibliografia","Includes bibliographical references (p. 383-404) and index."]
[null,null,"Nota di contenuto",null,"Contents; List of Figures; Gallery of STM Images; 1 Overview; PART I: IMAGING MECHANISM; PART II : INSTRUMENTATION; Appendix A: Real wavefunctions; Appendix B: Green's functions; Appendix C: Spherical modified Bessel functions; Appendix D: Two-dimensional Fourier series; Appendix E: Plane groups and invariant functions; Appendix F: Elementary elasticity theory; Appendix G: A short table of Laplace transforms; Appendix H: Operational amplifiers; References; Index"]
[null,null,null,"Sommario/riassunto","A graduate-level introduction to scanning tunnelling microscopy, which explains how the method's ability to map microscopic surfaces non-destructively has found major applications in physics, surface science, materials science, biology, chemistry and engineering."]