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[null,"1.","Record Nr.",null,"UNINA9910916497803321"]
[null,null,"Autore",null,"Wittkower, Rudolf"]
[null,null,"Titolo",null,"Allegoria e migrazione dei simboli / Rudolf Wittkower ; introduzione di Giovanni Romano"]
[null,null,"Pubbl/distr/stampa",null,"Torino, : G. Einaudi, 1987"]
[null,null,"ISBN",null,"88-06-59351-0"]
[{"$nulls":4},"88-06-59351-X"]
[null,null,"Descrizione fisica",null,"LII, 353 p. : ill. ; 22 cm"]
[null,null,"Collana",null,"Biblioteca di storia dell'arte. N. S ; 8"]
[null,null,"Disciplina",null,"704.946"]
[null,null,"Locazione",null,"FLFBC"]
[null,null,"Collocazione",null,"DAM A20 WITR 01"]
[null,null,"Lingua di pubblicazione",null,"Italiano"]
[null,null,"Formato",null,"Materiale a stampa"]
[null,null,null,"Livello bibliografico","Monografia"]
[null,null,null,"Note generali","Trad. di Marcello Ciccuto"]
[null,"2.","Record Nr.",null,"UNINA9910146829703321"]
[null,null,"Titolo",null,"2005 IEEE International Test Conference (ITC) : 8-10 November, 2005, Austin, TX"]
[null,null,"Pubbl/distr/stampa",null,"[Place of publication not identified], : Institute of Electrical and Electronics Engineers, 2005"]
[null,null,"ISBN",null,"9781509097678"]
[{"$nulls":4},"1509097678"]
[null,null,"Disciplina",null,"621.3815/48"]
[null,null,"Soggetti",null,"Integrated circuits - Testing"]
[{"$nulls":4},"Semiconductors - Testing"]
[{"$nulls":4},"Electronics"]
[{"$nulls":4},"Electrical Engineering"]
[{"$nulls":4},"Electrical & Computer Engineering"]
[{"$nulls":4},"Engineering & Applied Sciences"]
[null,null,"Lingua di pubblicazione",null,"Inglese"]
[null,null,"Formato",null,"Materiale a stampa"]
[null,null,null,"Livello bibliografico","Monografia"]
[null,null,null,"Note generali","Bibliographic Level Mode of Issuance: Monograph"]