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[null,"1.","Record Nr.",null,"UNINA990007862440403321"]
[null,null,"Autore",null,"De Landa, Manuel"]
[null,null,"Titolo",null,"La guerra nell' era delle macchine intelligenti / Manuel De Landa"]
[null,null,"Pubbl/distr/stampa",null,"Milano : Feltrinelli, 1996"]
[null,null,"ISBN",null,"88-07-46006-8"]
[null,null,"Descrizione fisica",null,"359 p. ; 22 cm"]
[null,null,"Collana",null,"Interzone"]
[null,null,"Disciplina",null,"355.02"]
[null,null,"Locazione",null,"DFD"]
[null,null,"Collocazione",null,"XI PZ 1"]
[null,null,"Lingua di pubblicazione",null,"Italiano"]
[null,null,"Formato",null,"Materiale a stampa"]
[null,null,null,"Livello bibliografico","Monografia"]
[null,null,null,"Note generali","Trad. di Gianni Pannofino"]
[null,"2.","Record Nr.",null,"UNINA9910872638003321"]
[null,null,"Titolo",null,"The changing philosophy of test : International Test Conference, 1990 proceedings : September 10-14, 1990, Sheraton Washington Hotel, Washington, DC"]
[null,null,"Pubbl/distr/stampa",null,"[Place of publication not identified], : IEEE Computer Society Press, 1990"]
[null,null,"Disciplina",null,"621.381/5"]
[null,null,"Soggetti",null,"Integrated circuits - Testing"]
[{"$nulls":4},"Electronic digital computers - Testing - Circuits"]
[{"$nulls":4},"Automatic test equipment - Testing"]
[{"$nulls":4},"Semiconductors"]
[{"$nulls":4},"Electrical & Computer Engineering"]
[{"$nulls":4},"Engineering & Applied Sciences"]
[{"$nulls":4},"Electrical Engineering"]
[null,null,"Lingua di pubblicazione",null,"Inglese"]
[null,null,"Formato",null,"Materiale a stampa"]
[null,null,null,"Livello bibliografico","Monografia"]
[null,null,null,"Note generali","Bibliographic Level Mode of Issuance: Monograph"]