{"text_format":"2","workbook":"xls","n_sheets":1,"sheets":["report2"],"not_rendered":{"charts":0,"images":0,"macros":0,"external_links":1,"defined_names":1,"comments":0,"pivot_tables":0},"unopened":[],"bounds":{"document_bytes":16777216,"sheet_cells":100000,"run_cost":"one","rows_first":2000,"rows_last":500,"rows_between":2000,"halvings":0,"cell_chars":16384,"cell_head_chars":4096},"cells_cut":0,"cells_raw":0,"read":"whole","date_system":"1900","formulas":"cached_only"}

{"sheet":"report2","index":0,"n_rows":13,"n_cols":5,"rows_kept":13,"cut":false,"hidden":false,"merged":[[0,2,0,3],[0,4,0,5],[1,2,1,3],[1,4,1,5],[2,2,2,3],[3,2,3,3],[4,2,4,3],[5,2,5,3],[7,2,7,3],[8,2,8,3],[11,2,11,3]],"flags":["formulas_cached_only"]}
[null,"1.","Record Nr.",null,"UNINA9910872434503321"]
[null,null,"Titolo",null,"Memory Technology, Design and Testing, 1996: IEEE International Workshop On"]
[null,null,"Pubbl/distr/stampa",null,"[Place of publication not identified], : IEEE Computer Society Press, 1996"]
[null,null,"Descrizione fisica",null,"1 online resource"]
[null,null,"Disciplina",null,"004.5"]
[null,null,"Soggetti",null,"Random access memory"]
[{"$nulls":4},"Semiconductor storage devices - Testing"]
[null,null,"Lingua di pubblicazione",null,"Inglese"]
[null,null,"Formato",null,"Materiale a stampa"]
[null,null,null,"Livello bibliografico","Monografia"]
[null,null,null,"Note generali","Bibliographic Level Mode of Issuance: Monograph"]
[null,null,"Nota di contenuto",null,"Memory Technology, Design and Testing -- Future trends in flash memories -- Recent developments in dram testing -- Built in self testing for detection of coupling faults in semiconductor memories -- A built in self test scheme for 256Meg sdram -- Proposed on-chip test structure to quantify trap densities within flash meories -- A concurrent placement and routing strategy for improving the quality of application specific memory designs -- Flash memory quality and reliability issues -- A low power current sensing scheme for cmos sram."]
[null,null,null,"Sommario/riassunto","The keynote speech on future trends in flash memories is followed by 16 additional review and research papers. Among the topics are built-in self-testing for detecting of coupling faults in semiconductor memories, a low-power current sensing scheme for CMOS SRAM, scanning capacitance microscopy analysis of DRAM trench capacitors, the thermal monitoring of memories, and a true testprocessor-per-pin algorithmic pattern generator. No subject index. Annotation copyrighted by Book News, Inc., Portland, OR."]