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[null,"1.","Record Nr.",null,"UNISA990001519220203316"]
[null,null,"Autore",null,"COPPOLA, Goffredo"]
[null,null,"Titolo",null,"Cirene e il nuova Callimaco / Goffredo Coppola"]
[null,null,"Pubbl/distr/stampa",null,"Bologna : Zanichelli, 1934"]
[null,null,"Descrizione fisica",null,"287 p. ; 26 cm"]
[null,null,"Collocazione",null,"V.1.B. 442(VIII C 854)"]
[null,null,"Lingua di pubblicazione",null,"Italiano"]
[null,null,"Formato",null,"Materiale a stampa"]
[null,null,null,"Livello bibliografico","Monografia"]
[null,"2.","Record Nr.",null,"UNINA9910831178403321"]
[null,null,"Titolo",null,"X-ray characterization of materials [[electronic resource] /] / Eric Lifshin (ed.)"]
[null,null,"Pubbl/distr/stampa",null,"Weinheim ; ; New York, : Wiley-VCH, 1999"]
[null,null,"ISBN",null,"1-281-76425-6"]
[{"$nulls":4},"9786611764258"]
[{"$nulls":4},"3-527-61374-9"]
[{"$nulls":4},"3-527-61375-7"]
[null,null,"Descrizione fisica",null,"1 online resource (280 p.)"]
[null,null,"Disciplina",null,"620.11272"]
[{"$nulls":4},"778.33"]
[null,null,"Soggetti",null,"X-ray spectroscopy"]
[{"$nulls":4},"Materials - Analysis"]
[{"$nulls":4},"Surfaces (Technology) - Analysis"]
[{"$nulls":4},"X-rays - Industrial applications"]
[null,null,"Lingua di pubblicazione",null,"Inglese"]
[null,null,"Formato",null,"Materiale a stampa"]
[null,null,null,"Livello bibliografico","Monografia"]
[null,null,null,"Note generali","Description based upon print version of record."]
[null,null,null,"Nota di bibliografia","Includes bibliographical references and index."]
[null,null,"Nota di contenuto",null,"X-ray Characterization of Materials; Contents; List of Symbols and Abbreviations.; 1 X-Ray Diffraction; 2 Application of Synchrotron X-Radiation to Problems in Materials Science; 3 X-Ray Fluorescence Analysis; 4 Small-Angle Scattering of X-Rays and Neutrons; Index"]
[null,null,null,"Sommario/riassunto","Linking of materials properties with microstructures is a fundamental theme in materials science, for which a detailed knowledge of the modern characterization techniques is essential. Since modern materials such as high-temperature alloys, engineering thermoplastics and multilayer semiconductor films have many elemental constituents distributed in more than one phase, characterization is essential to the systematic development of such new materials and understanding how they behave in practical applications. X-ray techniques play a major role in providing information on the elemental composit"]