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[null,"1.","Record Nr.",null,"UNINA9910831162003321"]
[null,null,"Titolo",null,"Advances in speckle metrology and related techniques [[electronic resource] /] / edited by Guillermo H. Kaufmann"]
[null,null,"Pubbl/distr/stampa",null,"Weinheim, : Wiley-VCH Verlag, c2011"]
[null,null,"ISBN",null,"3-527-63387-1"]
[{"$nulls":4},"1-283-14068-3"]
[{"$nulls":4},"9786613140685"]
[{"$nulls":4},"3-527-63385-5"]
[{"$nulls":4},"3-527-63386-3"]
[null,null,"Edizione",null,"[4th ed.]"]
[null,null,"Descrizione fisica",null,"1 online resource (329 p.)"]
[null,null,"Disciplina",null,"621.36"]
[null,null,"Soggetti",null,"Speckle metrology"]
[{"$nulls":4},"Optical measurements"]
[null,null,"Lingua di pubblicazione",null,"Inglese"]
[null,null,"Formato",null,"Materiale a stampa"]
[null,null,null,"Livello bibliografico","Monografia"]
[null,null,null,"Note generali","Description based upon print version of record."]
[null,null,null,"Nota di bibliografia","Includes bibliographical references and index."]
[null,null,"Nota di contenuto",null,"Advances in Speckle Metrology and Related Techniques; Contents; Preface; List of Contributors; 1 Radial Speckle Interferometry and Applications; 2 Depth-Resolved Displacement Field Measurement; 3 Single-Image Interferogram Demodulation; 4 Phase Evaluation in Temporal Speckle Pattern Interferometry Using Time-Frequency Methods; 5 Optical Vortex Metrology; 6 Speckle Coding for Optical and Digital Data Security Applications; Index"]
[null,null,null,"Sommario/riassunto","Speckle metrology includes various optical techniques that are based on the speckle fields generated by reflection from a rough surface or by transmission through a rough diffuser. These techniques have proven to be very useful in testing different materials in a non-destructive way. They have changed dramatically during the last years due to the development of modern optical components, with faster and more powerful digital computers, and novel data processing approaches. This most up-to-date overview of the topic describes new techniques developed in the field of speckle metrology over t"]