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[null,"1.","Record Nr.",null,"UNINA9910830286103321"]
[null,null,"Autore",null,"Randa James"]
[null,null,"Titolo",null,"Precision measurement of microwave thermal noise / / James Randa"]
[null,null,"Pubbl/distr/stampa",null,"Hoboken, New Jersey : , : John Wiley & Sons, , [2023]"]
[{"$nulls":4},"©2023"]
[null,null,"ISBN",null,"9781119910107"]
[{"$nulls":4},"1-119-91011-0"]
[{"$nulls":4},"1-119-91010-2"]
[{"$nulls":4},"1-119-91012-9"]
[null,null,"Descrizione fisica",null,"1 online resource (179 pages)"]
[null,null,"Disciplina",null,"621.3813"]
[null,null,"Soggetti",null,"Dispositius de microones"]
[{"$nulls":4},"Microones - Mesuraments"]
[{"$nulls":4},"Microwave devices"]
[{"$nulls":4},"Microwave measurements"]
[null,null,"Lingua di pubblicazione",null,"Inglese"]
[null,null,"Formato",null,"Materiale a stampa"]
[null,null,null,"Livello bibliografico","Monografia"]
[null,null,null,"Nota di bibliografia","Includes bibliographical references and index."]
[null,null,"Nota di contenuto",null,"Cover -- Title Page -- Copyright -- Contents -- Preface -- Chapter 1 Background -- 1.1 Nyquist's Theorem and Noise Temperature -- 1.1.1 Nyquist's Theorem -- 1.1.2 Limits and Numbers -- 1.1.3 Definition of Noise Temperature -- 1.1.4 Excess Noise Ratio and T0 -- 1.2 Microwave Networks -- 1.2.1 Notation -- 1.2.2 Noise Correlation Matrix and Bosma's Theorem -- 1.2.3 Power Ratios -- 1.2.4 Noise‐Temperature Translation Through a Passive Device -- References -- References -- Chapter 2 Noise‐Temperature Standards -- 2.1 Introduction -- 2.2 Ambient Standards -- 2.3 Hot (Oven) Standards -- 2.4 Cryogenic Standards -- 2.4.1 Coaxial Standards -- 2.4.2 Waveguide Standards -- 2.5 Other Standards and Noise Sources -- 2.5.1 Tunable Primary Standards -- 2.5.2 \"Equivalent Hot Standard\" Based on RF Power -- 2.5.3 Secondary Standards -- 2.5.4 Synthetic Primary Standards -- References -- Chapter 3 Noise‐Temperature Measurement -- 3.1 Background -- 3.2 Total‐Power Radiometer -- 3.2.1 Idealized Case -- 3.2.2 Nonideal Case -- 3.2.3 Radiometer Equation for Isolated Total‐Power Radiometer -- 3.2.4 Total‐Power Radiometer Design -- 3.2.5 Radiometer Testing -- 3.3 Total‐Power Radiometer Uncertainties -- 3.3.1 Type‐A Uncertainties -- 3.3.2 Type‐B "]
[{"$nulls":4},"Uncertainties -- 3.3.3 Sample Results -- 3.4 Other Radiometer Designs -- 3.4.1 Switching or Dicke Radiometer -- 3.4.2 Digital Radiometer -- 3.5 Measurements through Adapters -- 3.6 Traceability and Inter‐laboratory Comparisons -- References -- Chapter 4 Amplifier Noise -- 4.1 Noise Figure, Effective Input Noise Temperature -- 4.2 Noise‐Temperature Definition Revisited -- 4.3 Noise Figure Measurement, Simple Case -- 4.4 Definition of Noise Parameters -- 4.4.1 Circuit Treatment of Noisy Amplifier -- 4.4.2 Wave Representation of Noise Parameters -- 4.5 Measurement of Noise Parameters -- 4.5.1 General Measurement Setup."]
[{"$nulls":4},"4.5.2 Fit to Noise‐Figure Parameterization -- 4.5.3 Fit to Noise‐Temperature or Power Parameterization -- 4.5.4 Possible Variations When Using the Wave Formulation -- 4.5.5 Choice of Input Terminations -- 4.5.6 Commercial Systems, Source‐Pull Measurements -- 4.5.7 Frequency-Variation Method -- 4.6 Uncertainty Analysis for Noise‐Parameter Measurements -- 4.6.1 Simple Considerations -- 4.6.2 Full Analysis -- 4.6.3 Input Uncertainties -- 4.6.4 General Features and Sample Results -- 4.7 Simulations and Strategies -- References -- Chapter 5 On‐Wafer Noise Measurements -- 5.1 Introduction -- 5.2 On‐Wafer Microwave Formalism -- 5.2.1 Traveling Waves vs. Pseudo Waves -- 5.2.2 On‐Wafer Reference Planes -- 5.3 Noise‐Temperature Measurements -- 5.4 On‐Wafer Noise‐Parameter Measurements -- 5.4.1 General -- 5.4.2 Radiometer‐Based Systems -- 5.4.3 Commercial Systems and Reference‐Plane Considerations -- 5.4.4 \"Enhanced\" or Model‐Assisted Measurements -- 5.5 Uncertainties -- 5.5.1 Differences from Packaged Amplifiers -- 5.5.2 General Features and Properties -- 5.5.3 Measurement Strategies -- References -- Chapter 6 Noise‐Parameter Checks and Verification -- 6.1 Measurement of Passive or Previously Measured Devices -- 6.2 Physical Bounds and Model Predictions -- 6.3 Tandem or Hybrid Measurements -- References -- Chapter 7 Cryogenic Amplifiers -- 7.1 Background -- 7.1.1 Introduction -- 7.1.2 Vacuum‐Fluctuation Contribution -- 7.2 Measurement of the Matched Noise Figure -- 7.2.1 Cold‐Attenuator Method -- 7.2.2 Internal Hot-Cold Method -- 7.2.3 Full‐Characterization Measurements -- 7.3 Noise‐Parameter Measurement -- References -- Chapter 8 Multiport Amplifiers -- 8.1 Introduction -- 8.2 Formalism and Noise Matrix -- 8.3 Definition of Noise Figure for Multiports -- 8.4 Degradation of Signal‐to‐Noise Ratio."]
[{"$nulls":4},"8.5 Three‐Port Example - Differential Amplifier with Reflectionless Terminations -- 8.5.1 Motivation -- 8.5.2 Characteristic Noise Temperature, Gains, and Effective Input Noise Temperature -- 8.5.3 Noise Figure -- 8.5.4 Practical Applications -- 8.6 Four‐Port Example with Reflectionless Terminations -- References -- Chapter 9 Remote Sensing Connection -- 9.1 Introduction -- 9.2 Theory for Standard Radiometer -- 9.3 Standard‐Radiometer Measurements -- 9.3.1 Determination of α -- 9.3.2 Determination of Illumination Efficiency, ηIE -- 9.3.2.1 Measurements of a Standard Target -- 9.4 Standard‐Target Design -- 9.5 Target Reflectivity Effects -- 9.5.1 Effect of Target Reflectivity -- 9.5.2 Measurement of Target Reflectivity -- References -- Index -- EULA."]