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[null,"1.","Record Nr.",null,"UNINA9910827817203321"]
[null,null,"Autore",null,"Oku Takeo"]
[null,null,"Titolo",null,"Structure analysis of advanced nanomaterials : nanoworld by high-resolution electron microscopy / / Takeo Oku"]
[null,null,"Pubbl/distr/stampa",null,"Berlin, [Germany] ; ; Boston, [Massachusetts] : , : De Gruyter, , 2014"]
[{"$nulls":4},"©2014"]
[null,null,"ISBN",null,"1-5231-0054-0"]
[{"$nulls":4},"3-11-038804-9"]
[null,null,"Descrizione fisica",null,"1 online resource (180 p.)"]
[null,null,"Disciplina",null,"502.825"]
[null,null,"Soggetti",null,"Transmission electron microscopy"]
[{"$nulls":4},"High resolution electron microscopy"]
[{"$nulls":4},"Nanostructured materials"]
[{"$nulls":4},"Structural analysis (Engineering)"]
[null,null,"Lingua di pubblicazione",null,"Inglese"]
[null,null,"Formato",null,"Materiale a stampa"]
[null,null,null,"Livello bibliografico","Monografia"]
[null,null,null,"Note generali","Description based upon print version of record."]
[null,null,null,"Nota di bibliografia","Includes bibliographical references at the end of each chapters and index."]
[null,null,"Nota di contenuto",null,"Front matter -- Preface -- Contents -- 1 Introduction -- 2 Structure and principle of electron microscopes -- 3 Practice of HREM -- 4 Characterization by HREM -- 5 Electron diffraction analysis of nanostructured materials -- 6 HREM analysis of nanostructured materials -- A Appendix -- Index"]
[null,null,null,"Sommario/riassunto","High-resolution electron microscopy allows the imaging of the crystallographic structure of a sample at an atomic scale. It is a valuable tool to study nanoscale properties of crystalline materials such as superconductors, semiconductors, solar cells, zeolite materials, carbon nanomaterials or BN nanotubes."]