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[null,"1.","Record Nr.",null,"UNISA996385834503316"]
[null,null,"Autore",null,"Paterson William <1658-1719.>"]
[null,null,"Titolo",null,"An abstract, of a letter from a person of eminency and worth in Caledonia [[electronic resource] ] : to a friend at Boston in New-England"]
[null,null,"Pubbl/distr/stampa",null,"Edinburgh, : Printed by John Reid, 1699"]
[null,null,"Descrizione fisica",null,"2, 4 p"]
[null,null,"Soggetti",null,"Broadsides17th century.Scotland"]
[{"$nulls":4},"New Caledonia (Colony)"]
[null,null,"Lingua di pubblicazione",null,"Inglese"]
[null,null,"Formato",null,"Materiale a stampa"]
[null,null,null,"Livello bibliografico","Monografia"]
[null,null,null,"Note generali","Caption title."]
[{"$nulls":4},"Letter attributed to Paterson by Wing."]
[{"$nulls":4},"P. 2 (1st grouping) dated: Fort St. Andrew, February, 18th. 1698,9."]
[{"$nulls":4},"Includes: Caledonia. The declaration of the council (4 p.)."]
[{"$nulls":4},"P. 4 signed: Hugh Ross secretary. New Edinburgh, December 28, 1698."]
[{"$nulls":4},"Contains an optimistic appraisal of the colony at Darien, predicting it would become \"the best and surest mart in America.\""]
[{"$nulls":4},"Reproduction of original in the John Carter Brown Library."]
[null,null,null,"Sommario/riassunto","eebo-0097"]
[null,"2.","Record Nr.",null,"UNINA9910823656403321"]
[null,null,"Autore",null,"Yurchuk Ekaterina"]
[null,null,"Titolo",null,"Electrical characterisation of ferroelectric field effect transistors based on ferroelectric HfO2 thin films / / Ekaterina Yurchuk"]
[null,null,"Pubbl/distr/stampa",null,"Berlin : , : Logos Verlag, , [2015]"]
[null,null,"ISBN",null,"3-8325-9478-7"]
[null,null,"Descrizione fisica",null,"1 online resource (x, 170 pages)"]
[null,null,"Collana",null,"Research at NaMLab"]
[null,null,"Disciplina",null,"661.0514"]
[null,null,"Soggetti",null,"Hafnium"]
[{"$nulls":4},"Ferroelectric crystals"]
[null,null,"Lingua di pubblicazione",null,"Inglese"]
[null,null,"Formato",null,"Materiale a stampa"]
[null,null,null,"Livello bibliografico","Monografia"]
[null,null,null,"Note generali","PublicationDate: 20150630"]
[null,null,null,"Sommario/riassunto","Long description: Ferroelectric field effect transistor (FeFET) memories based on a new type of ferroelectric material (silicon doped hafnium oxide) were studied within the scope of the present work. Utilisation of silicon doped hafnium oxide (Si:HfO raisebox-0.5ex scriptsize 2) thin films instead of conventional perovskite ferroelectrics as a functional layer in FeFETs provides compatibility to the CMOS process as well as improved device scalability. The influence of different process parameters on the properties of Si:HfO raisebox-0.5ex scriptsize 2 thin films was analysed in order to gain better insight into the occurrence of ferroelectricity in this system. A subsequent examination of the potential of this material as well as its possible limitations with the respect to the application in non-volatile memories followed. The Si:HfO raisebox-0.5ex scriptsize 2-based ferroelectric transistors that were fully integrated into the state-of-the-art high-k metal gate CMOS technology were studied in this work for the first time. The memory performance of these devices scaled down to 28 nm gate length was investigated. Special attention was paid to the charge trapping phenomenon shown to significantly affect the device behaviour."]