{"text_format":"2","workbook":"xls","n_sheets":1,"sheets":["report2"],"not_rendered":{"charts":0,"images":0,"macros":0,"external_links":1,"defined_names":1,"comments":0,"pivot_tables":0},"unopened":[],"bounds":{"document_bytes":16777216,"sheet_cells":100000,"run_cost":"one","rows_first":2000,"rows_last":500,"rows_between":2000,"halvings":0,"cell_chars":16384,"cell_head_chars":4096},"cells_cut":0,"cells_raw":0,"read":"whole","date_system":"1900","formulas":"cached_only"}

{"sheet":"report2","index":0,"n_rows":19,"n_cols":5,"rows_kept":19,"cut":false,"hidden":false,"merged":[[0,2,0,3],[0,4,0,5],[1,2,1,3],[1,4,1,5],[2,2,2,3],[2,4,2,5],[3,2,3,3],[5,2,5,3],[6,2,6,3],[7,2,7,3],[8,2,8,3],[9,2,9,3],[11,2,11,3],[12,2,12,3],[16,2,16,3]],"flags":["formulas_cached_only"]}
[null,"1.","Record Nr.",null,"UNINA9910785116003321"]
[null,null,"Autore",null,"Moreira José <1975->"]
[null,null,"Titolo",null,"An engineer's guide to automated testing of high-speed interfaces / / José Moreira, Hubert Werkmann"]
[null,null,"Pubbl/distr/stampa",null,"Boston : , : Artech House, , ©2010"]
[{"$nulls":4},"[Piscataqay, New Jersey] : , : IEEE Xplore, , [2010]"]
[null,null,"ISBN",null,"1-60783-984-9"]
[null,null,"Descrizione fisica",null,"1 online resource (590 p.)"]
[null,null,"Collana",null,"Artech House microwave library"]
[null,null,"Disciplina",null,"621.381548"]
[null,null,"Soggetti",null,"Very high speed integrated circuits"]
[{"$nulls":4},"Automatic test equipment"]
[null,null,"Lingua di pubblicazione",null,"Inglese"]
[null,null,"Formato",null,"Materiale a stampa"]
[null,null,null,"Livello bibliografico","Monografia"]
[null,null,null,"Note generali","Description based upon print version of record."]
[null,null,null,"Nota di bibliografia","Includes bibliographical references and index."]
[null,null,"Nota di contenuto",null,"An Engineer's Guide to Automated Testing of High-Speed Interfaces; Contents; Preface; Acknowledgments; 1 Introduction; 2 High-Speed Digital BasicsThis; 3 High-Speed Interface Standards; 4 ATE Instrumentation for DigitalApplications; 5 Tests and Measurements; 6 Production Testing; 7 Support Instrumentation; 8 Test Fixture Design; 9 Advanced ATE Topics; A Introduction to the Gaussian Distribution and Analytical Computation of the BER; B The Dual Dirac Model and RJ/DJ Separation; C Pseudo-Random Bit Sequences and Other Data Patterns; D Coding, Scrambling, Disparity,and CRC"]
[{"$nulls":4},"E Time Domain Reflectometry andTime Domain Transmission(TDR/TDT)F S-Parameters; G Engineering CAD Tools; H Test Fixture Evaluation andCharacterization; I Jitter Injection Calibration; About the Authors; Index"]
[null,null,null,"Sommario/riassunto","Providing a complete introduction to the state-of-the-art in high-speed digital testing with automated test equipment (ATE), this practical resource is the first book to focus exclusively on this increasingly important topic. Featuring clear examples, this one-stop reference covers all critical aspects of the subject, from high-speed digital basics, ATE instrumentation for digital applications, and test and measurements, to production testing, support instrumentation and text fixture design. This in-depth volume also discusses advanced ATE topics, such as multiplexing of ATE pin channels and testing of high-speed bi-directional interfaces with fly-by approaches."]