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[null,"1.","Record Nr.",null,"UNINA9910777891703321"]
[null,null,"Titolo",null,"Anger-related disorders [[electronic resource] ] : a practitioner's guide to comparative treatments / / Eva L. Feindler, editor"]
[null,null,"Pubbl/distr/stampa",null,"New York, N.Y., : Springer, c2006"]
[null,null,"ISBN",null,"1-280-74471-5"]
[{"$nulls":4},"9786610744718"]
[{"$nulls":4},"0-8261-4047-5"]
[null,null,"Descrizione fisica",null,"1 online resource (398 p.)"]
[null,null,"Collana",null,"Springer series on comparative treatments for psychological disorders"]
[null,null,"Disciplina",null,"616.89142"]
[null,null,"Soggetti",null,"Anger - Treatment"]
[{"$nulls":4},"Psychotherapy"]
[null,null,"Lingua di pubblicazione",null,"Inglese"]
[null,null,"Formato",null,"Materiale a stampa"]
[null,null,null,"Livello bibliografico","Monografia"]
[null,null,null,"Note generali","Description based upon print version of record."]
[null,null,null,"Nota di bibliografia","Includes bibliographical references and index."]
[null,null,"Nota di contenuto",null,"Cover; TOC Contents; Contributors; Series Editor's Note; Acknowledgments; Foreword; Questions for Contributors; CH Chapter 1 Anger-Related Disorders: Basic Issues, Models, and Diagnostic Considerations; CH Chapter 2 The Case of Anthony; CH Chapter 3 Evidence for Effective Treatment of Anger-Related Disorders; CH Chapter 4 Cultural and Gender Considerations in the Assessment and Treatment of Anger-Related Disorders; CH Chapter 5 Psychoanalytic Treatment of Anger and Aggression"]
[{"$nulls":4},"CH Chapter 6 Anger Management for Adults: A Menu-Driven Cognitive-Behavioral Approach to the Treatment of Anger Disorders CH Chapter 7 Dialectical Behavior Therapy for Anger-Related Disorders; CH Chapter 8 Couples and Family Treatment of Anger Difficulties; CH Chapter 9 Psychopharmacological Considerations in Anger Management; CH Chapter 10 Emotion-Focused Therapy for Anger; CH Chapter 11 Treating Anger with Wisdom and Compassion: A Buddhist Approach; CH Chapter 12 An Adlerian Approach to the Treatment of Anger Disorders"]
[{"$nulls":4},"CH Chapter 13 Assimilative Psychodynamic Psychotherapy: An Integrative Approach to Anger Disorders CH Chapter 14 Multiple Perspectives on the Conceptualization and Treatment of Anger-Related Disorders; Appendix A Comparative Treatments of Anger-Related Disorders; References; IDX Index"]
[null,null,null,"Sommario/riassunto","In this ground-breaking exploration, Eva Fiendler investigates how and "]
[{"$nulls":4},"why anger is viewed as a secondary emotion by most clinical theories and practitioners and seeks to answer the following questions: * What are anger-related disorders? * What do they have in common and how are they different? * How do we treat the various anger-related disorders? Drawing on one case study, top-notch contributors each present a different method of treatment for anger related disorders. By taking in to consideration the variety of perspectives and treatments available for anger related disorders, this book pr"]
[null,"2.","Record Nr.",null,"UNINA9911019536103321"]
[null,null,"Autore",null,"Bubert H (Henning)"]
[null,null,"Titolo",null,"Surface and Thin Film Analysis : A Compendium of Principles, Instrumentation and Applications"]
[null,null,"Pubbl/distr/stampa",null,"Hoboken, : Wiley, 2011"]
[null,null,"ISBN",null,"1-280-55760-5"]
[{"$nulls":4},"9786610557608"]
[{"$nulls":4},"3-527-60016-7"]
[null,null,"Edizione",null,"[2nd ed.]"]
[null,null,"Descrizione fisica",null,"1 online resource (559 p.)"]
[null,null,"Disciplina",null,"530.4275"]
[{"$nulls":4},"541.33"]
[null,null,"Soggetti",null,"Thin films - Analysis - Surfaces"]
[{"$nulls":4},"Electron spectroscopy"]
[{"$nulls":4},"Spectrum analysis"]
[null,null,"Lingua di pubblicazione",null,"Inglese"]
[null,null,"Formato",null,"Materiale a stampa"]
[null,null,null,"Livello bibliografico","Monografia"]
[null,null,null,"Note generali","Description based upon print version of record."]
[null,null,"Nota di contenuto",null,"Surface and Thin Film Analysis: A Compendium of Principles, Instrumentation, and Applications; Contents; Preface to the First Edition; Preface to the Second Edition; List of Contributors; 1: Introduction; Part One: Electron Detection; 2: X-Ray Photoelectron Spectroscopy (XPS); 2.1 Principles; 2.2 Instrumentation; 2.2.1 Vacuum Requirements; 2.2.2 X-Ray Sources; 2.2.3 Synchrotron Radiation; 2.2.4 Electron Energy Analyzers; 2.2.5 Spatial Resolution; 2.3 Spectral Information and Chemical Shifts; 2.4 Quantification, Depth Profiling, and Imaging; 2.4.1 Quantification; 2.4.2 Depth Profiling"]
[{"$nulls":4},"2.4.3 Imaging2.5 The A uger Parameter; 2.6 Applications; 2.6.1 Catalysis; 2.6.2 Polymers; 2.6.3 Corrosion and Passivation; 2.6.4 Adhesion; 2.6.5 Superconductors; 2.6.6 Semiconductors; 2.7 Ultraviolet Photoelectron Spectroscopy (UPS); References; 3: Auger Electron Spectroscopy (AES); 3.1 Principles; 3.2 Instrumentation; 3.2.1 Vacuum Requirements; 3.2.2 Electron Sources; 3.2.3 Electron-Energy Analyzers; 3.3 Spectral Information; 3.4 Quantification and Depth Profiling; 3.4.1 Quantification; 3.4.2 Depth Profiling; 3.5 Applications; 3.5.1 Grain Boundary Segregation; 3.5.2 Semiconductor Technology"]
[{"$nulls":4},"3.5.3 Thin Films and Interfaces3.5.4 Surface Segregation; 3.6 Scanning A uger Microscopy (SAM); References; 4: Electron Energy-Loss Spectroscopy (EELS) and Energy-Filtering Transmission Electron "]
[{"$nulls":4},"Microscopy (EFTEM); 4.1 Principles; 4.2 Instrumentation; 4.3 Qualitative Spectral Information; 4.3.1 Low-Loss Excitations; 4.3.2 Ionization Losses; 4.3.3 Fine Structures; 4.4 Quantification; 4.5 Imaging of Element Distribution; 4.6 Summary; References; 5: Low-Energy Electron Diffraction (LEED); 5.1 Principles and History; 5.2 Instrumentation; 5.3 Qualitative Information; 5.3.1 LEED Pattern"]
[{"$nulls":4},"5.3.2 Spot Profile Analysis5.3.3 Applications and Restrictions; 5.4 Quantitative Structural Information; 5.4.1 Principles; 5.4.2 Experimental Techniques; 5.4.3 Computer Programs; 5.4.4 Applications and Restrictions; 5.5 Low-Energy Electron Microscopy; 5.5.1 Principles of Operation; 5.5.2 Applications and Restrictions; References; 6: Other Electron-Detecting Techniques; 6.1 Ion (Excited) Auger Electron Spectroscopy (IAES); 6.2 Ion Neutralization Spectroscopy (INS); 6.3 Inelastic Electron Tunneling Spectroscopy (IETS); Reference; Part Two: Ion Detection"]
[{"$nulls":4},"7: Static Secondary Ion Mass Spectrometry (SSIMS)7.1 Principles; 7.2 Instrumentation; 7.2.1 Ion Sources; 7.2.2 Mass Analyzers; 7.2.2.1 Quadrupole Mass Spectrometers; 7.2.2.2 Time-of-Flight Mass Spectrometry (TOF-MS); 7.3 Quantification; 7.4 Spectral Information; 7.5 Applications; 7.5.1 Oxide Films; 7.5.2 Interfaces; 7.5.3 Polymers; 7.5.4 Biosensors; 7.5.5 Surface Reactions; 7.5.6 Imaging; 7.5.7 Ultra-Shallow Depth Profiling; References; 8: Dynamic Secondary Ion Mass Spectrometry (SIMS); 8.1 Principles; 8.1.1 Compensation of Preferential Sputtering; 8.1.2 Atomic Mixing"]
[{"$nulls":4},"8.1.3 Implantation of Primary Ions"]
[null,null,null,"Sommario/riassunto","Surveying and comparing all techniques relevant for practical applications, this second edition of a bestseller is a vital guide to this hot topic in nano- and surface technology. Completely revised and updated, sections include electron, ion and photon detection, as well as scanning microscopy, while new chapters have been added to cover such recently developed techniques as SNOM, SERS, and laser ablation. Over 500 references and a list of equipment suppliers make this a rapid reference for materials scientists, analytical chemists, and those working in the biotechnological industry."]