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[null,"1.","Record Nr.",null,"UNINA990006995930403321"]
[null,null,"Autore",null,"Caramaschi, Enzo"]
[null,null,"Titolo",null,"Critiques scientistes et critiques inpressionnistes: : taine, brunetiere, gourmont / Enzo Caramaschi"]
[null,null,"Pubbl/distr/stampa",null,"Pisa : Goliardica, 1963"]
[null,null,"Descrizione fisica",null,"160 p. ; 20 cm"]
[null,null,"Collana",null,"Studi e testi ; 26"]
[null,null,"Locazione",null,"BAT"]
[null,null,"Collocazione",null,"BIB. BAT.4874"]
[null,null,"Lingua di pubblicazione",null,"Francese"]
[null,null,"Formato",null,"Materiale a stampa"]
[null,null,null,"Livello bibliografico","Monografia"]
[null,"2.","Record Nr.",null,"UNINA9910787114903321"]
[null,null,"Autore",null,"Steenhuis Harm-Jan"]
[null,null,"Titolo",null,"International operations : how multiple environments impact productivity and location decisions / / Harm-Jan Steenhuis"]
[null,null,"Pubbl/distr/stampa",null,"New York, New York (222 East 46th Street, New York, NY 10017) : , : Business Expert Press, , 2015"]
[null,null,"ISBN",null,"1-60649-579-8"]
[null,null,"Edizione",null,"[First edition.]"]
[null,null,"Descrizione fisica",null,"1 online resource (178 p.)"]
[null,null,"Collana",null,"Supply and operations management collection, , 2156-8200"]
[null,null,"Disciplina",null,"658.049"]
[null,null,"Soggetti",null,"International business enterprises"]
[null,null,"Lingua di pubblicazione",null,"Inglese"]
[null,null,"Formato",null,"Materiale a stampa"]
[null,null,null,"Livello bibliografico","Monografia"]
[null,null,null,"Note generali","Part of: 2014 digital library."]
[null,null,null,"Nota di bibliografia","Includes bibliographical references (pages 151-160) and index."]
[null,null,"Nota di contenuto",null,"1. Introduction -- 2. National culture -- 3. Country development and attracting business -- 4. Advantages of location -- 5. Internationalization -- 6. International practices and operations networks -- 7. Transferring operations -- 8. Conclusion -- References -- Index."]
[null,null,null,"Sommario/riassunto","Provides a comprehensive discussion of the factors that affect international operations. International operations can involve sales and production activities. Companies are often too optimistic about the productivity of international sales, that is, overestimate the development of international markets. Companies are also often too optimistic about the productivity of international production, that is, underestimate the costs and efforts involved. This leads to disappointing results or divestment of international operations."]
[null,"3.","Record Nr.",null,"UNINA9910741182503321"]
[null,null,"Autore",null,"Radamson Henry H"]
[null,null,"Titolo",null,"Analytical Methods and Instruments for Micro- and Nanomaterials / / by Henry H. Radamson, Anders Hallén, Ilya Sychugov, Alexander Azarov"]
[null,null,"Pubbl/distr/stampa",null,"Cham : , : Springer International Publishing : , : Imprint : Springer, , 2023"]
[null,null,"ISBN",null,"9783031264344"]
[{"$nulls":4},"3031264347"]
[null,null,"Edizione",null,"[1st ed. 2023.]"]
[null,null,"Descrizione fisica",null,"1 online resource (291 pages)"]
[null,null,"Collana",null,"Lecture Notes in Nanoscale Science and Technology, , 2195-2167 ; ; 23"]
[null,null,"Disciplina",null,"620.115"]
[null,null,"Soggetti",null,"Materials - Analysis"]
[{"$nulls":4},"Nanoscience"]
[{"$nulls":4},"Spectrum analysis"]
[{"$nulls":4},"Optical materials"]
[{"$nulls":4},"Nanotechnology"]
[{"$nulls":4},"Characterization and Analytical Technique"]
[{"$nulls":4},"Nanophysics"]
[{"$nulls":4},"Spectroscopy"]
[{"$nulls":4},"Optical Materials"]
[null,null,"Lingua di pubblicazione",null,"Inglese"]
[null,null,"Formato",null,"Materiale a stampa"]
[null,null,null,"Livello bibliografico","Monografia"]
[null,null,"Nota di contenuto",null,"Part one: Material Characterization using Photons and Electrons -- X-ray diffraction techniques -- Micro-photoluminescence (µ-PL) -- Spectroscopy techniques -- Electron Microscopy -- Part two: Material Characterization using Ions -- Rutherford backscattering Spectroscopy -- Secondary ion mass spectroscopy -- Part three: Electrical Measurements -- Electrical Characterization techniques -- Part four: Scanning Probe Techniques -- Scanning Probe Microscopies (SPMs)."]
[null,null,null,"Sommario/riassunto","This book describes analytical instruments widely used to characterize the nanostructured materials. It provides information about how to assess material quality, defects, the state of surfaces and interfaces, element distributions, strain, lattice distortion, and electro-optical properties of materials and devices. The information provided by this book can be used as a back-up for material processing, material design and debugging of device performance. The basic principles and methodology of each analysis technique is described in separate "]
[{"$nulls":4},"chapters, adding historic perspectives and recent developments. The data analysis, from simple to advanced level, is introduced by numerous examples, mostly taken from the authors' fields of research; semiconductor materials, metals and oxides. The book serves as a valuable guide for scientists and students working in materials science, physics, and engineering, who wish to become acquainted with the most important analytical techniques for nanomaterials. ."]