{"text_format":"2","workbook":"xls","n_sheets":1,"sheets":["report2"],"not_rendered":{"charts":0,"images":0,"macros":0,"external_links":1,"defined_names":4,"comments":0,"pivot_tables":0},"unopened":[],"bounds":{"document_bytes":16777216,"sheet_cells":100000,"run_cost":"one","rows_first":2000,"rows_last":500,"rows_between":2000,"halvings":0,"cell_chars":16384,"cell_head_chars":4096},"cells_cut":0,"cells_raw":0,"read":"whole","date_system":"1900","formulas":"cached_only"}

{"sheet":"report2","index":0,"n_rows":67,"n_cols":5,"rows_kept":67,"cut":false,"hidden":false,"merged":[[0,2,0,3],[0,4,0,5],[1,2,1,3],[1,4,1,5],[2,2,2,3],[3,2,3,3],[4,2,4,3],[5,2,5,3],[6,2,6,3],[7,2,7,3],[9,2,9,3],[9,4,9,5],[10,2,10,3],[10,4,10,5],[11,2,11,3],[11,4,11,5],[12,2,12,3],[13,2,13,3],[14,2,14,3],[15,2,15,3],[16,2,16,3],[17,2,17,3],[18,2,18,3],[19,2,19,3],[21,2,21,3],[21,4,21,5],[22,2,22,3],[22,4,22,5],[23,2,23,3],[23,4,23,5],[24,2,24,3],[25,2,25,3],[26,2,26,3],[27,2,27,3],[29,2,29,3],[30,2,30,3],[35,2,35,3],[35,4,35,5],[36,2,36,3],[36,4,36,5],[37,2,37,3],[37,4,37,5],[38,2,38,3],[39,2,39,3],[40,2,40,3],[41,2,41,3],[42,2,42,3],[43,2,43,3],[44,2,44,3],[60,2,60,3],[61,2,61,3],[64,2,64,3]],"flags":["formulas_cached_only"]}
[null,"1.","Record Nr.",null,"UNIPARTHENOPE000024708"]
[null,null,"Titolo",null,"Economics : Britain and the EEC / Harry G. Johnson ... [et al.] ; edited by M. A. G. van Meerhaeghe"]
[null,null,"Pubbl/distr/stampa",null,"London Harlow : Longmans, 1969"]
[null,null,"Titolo uniforme",null,"Economics"]
[null,null,"Descrizione fisica",null,"VIII, 111 p. ; 22 cm"]
[null,null,"Collocazione",null,"424/16"]
[null,null,"Lingua di pubblicazione",null,"Inglese"]
[null,null,"Formato",null,"Materiale a stampa"]
[null,null,null,"Livello bibliografico","Monografia"]
[null,"2.","Record Nr.",null,"UNISALENTO991001777669707536"]
[null,null,"Autore",null,"Jayme, Erik"]
[null,null,"Titolo",null,"La compravendita internazionale di beni mobili nei rapporti tra Italia e Germania / a cura di Erik Jayme ; con la collaborazione di Cristiana Fioravanti e Sabine Isenburg Epple"]
[null,null,"Pubbl/distr/stampa",null,"Padova : CEDAM, 1990"]
[null,null,"ISBN",null,"8813170874"]
[null,null,"Descrizione fisica",null,"XII, 219 p. ; 23 cm."]
[null,null,"Classificazione",null,"CM-XIV/B"]
[null,null,"Disciplina",null,"340.972"]
[null,null,"Soggetti",null,"Beni mobili - Vendita - Diritto internazionale privato"]
[null,null,"Lingua di pubblicazione",null,"Italiano"]
[null,null,"Formato",null,"Materiale a stampa"]
[null,null,null,"Livello bibliografico","Monografia"]
[null,"3.","Record Nr.",null,"UNINA9910712857703321"]
[null,null,"Autore",null,"Unger E (Eliezer)"]
[null,null,"Titolo",null,"Duralumin / / by E. Unger and E. Schmidt"]
[null,null,"Pubbl/distr/stampa",null,"[Washington, D.C.] : , : National Advisory Committee for Aeronautics, , 1920"]
[null,null,"Descrizione fisica",null,"1 online resource (10 pages, 3 unnumbered pages) : illustrations"]
[null,null,"Collana",null,"Technical notes / National Advisory Committee for Aeronautics ; ; No. 8"]
[null,null,"Soggetti",null,"Aluminum alloys"]
[{"$nulls":4},"Duralumin"]
[null,null,"Lingua di pubblicazione",null,"Inglese"]
[null,null,"Formato",null,"Materiale a stampa"]
[null,null,null,"Livello bibliografico","Monografia"]
[null,null,null,"Note generali","\"Translated from Technische Berichte Vol. III - Section 6 by Starr Truscott.\""]
[{"$nulls":4},"\"July, 1920.\""]
[{"$nulls":4},"No Federal Depository Library Program (FDLP) item number."]
[null,"4.","Record Nr.",null,"UNINA9910373924903321"]
[null,null,"Autore",null,"Quinten Michael"]
[null,null,"Titolo",null,"A Practical Guide to Surface Metrology / / by Michael Quinten"]
[null,null,"Pubbl/distr/stampa",null,"Cham : , : Springer International Publishing : , : Imprint : Springer, , 2019"]
[null,null,"ISBN",null,"3-030-29454-4"]
[null,null,"Edizione",null,"[1st ed. 2019.]"]
[null,null,"Descrizione fisica",null,"1 online resource (XXV, 230 p. 156 illus., 100 illus. in color.)"]
[null,null,"Collana",null,"Springer Series in Measurement Science and Technology, , 2198-7807"]
[null,null,"Disciplina",null,"681.25"]
[null,null,"Soggetti",null,"Physical measurements"]
[{"$nulls":4},"Measurement"]
[{"$nulls":4},"Materials science"]
[{"$nulls":4},"Surfaces (Physics)"]
[{"$nulls":4},"Interfaces (Physical sciences)"]
[{"$nulls":4},"Thin films"]
[{"$nulls":4},"Materials—Surfaces"]
[{"$nulls":4},"Engineering—Materials"]
[{"$nulls":4},"Lasers"]
[{"$nulls":4},"Photonics"]
[{"$nulls":4},"Measurement Science and Instrumentation"]
[{"$nulls":4},"Characterization and Evaluation of Materials"]
[{"$nulls":4},"Surface and Interface Science, Thin Films"]
[{"$nulls":4},"Surfaces and Interfaces, Thin Films"]
[{"$nulls":4},"Materials Engineering"]
[{"$nulls":4},"Optics, Lasers, Photonics, Optical Devices"]
[null,null,"Lingua di pubblicazione",null,"Inglese"]
[null,null,"Formato",null,"Materiale a stampa"]
[null,null,null,"Livello bibliografico","Monografia"]
[null,null,null,"Nota di bibliografia","Includes bibliographical references and index."]
[null,null,"Nota di contenuto",null,"Preface -- Introduction to Surfaces and Surface Metrology -- Tactile Surface Metrology -- Capacitive And Inductive Surface Metrology -- Optical Surface Metrology- Physical Basics -- Optical Surface Metrology - Methods  -- Imaging Methods - Multisensor - Systems - A Versatile Approach To Surface Metrology -- Appendix -- Index."]
[null,null,null,"Sommario/riassunto","This book offers a genuinely practical introduction to the most commonly encountered optical and non-optical systems used for the metrology and characterization of surfaces, including guidance on best practice, calibration, advantages and disadvantages, and interpretation "]
[{"$nulls":4},"of results. It enables the user to select the best approach in a given context. Most methods in surface metrology are based upon the interaction of light or electromagnetic radiation (UV, NIR, IR), and different optical effects are utilized to get a certain optical response from the surface; some of them record only the intensity reflected or scattered by the surface, others use interference of EM waves to obtain a characteristic response from the surface. The book covers techniques ranging from microscopy (including confocal, SNOM and digital holographic microscopy) through interferometry (including white light, multi-wavelength, grazing incidence and shearing) to spectral reflectometry and ellipsometry. The non-optical methods comprise tactile methods (stylus tip, AFM) as well as capacitive and inductive methods (capacitive sensors, eddy current sensors). The book provides: Overview of the working principles Description of advantages and disadvantages Currently achievable numbers for resolutions, repeatability, and reproducibility Examples of real-world applications A final chapter discusses examples where the combination of different surface metrology techniques in a multi-sensor system can reasonably contribute to a better understanding of surface properties as well as a faster characterization of surfaces in industrial applications. The book is aimed at scientists and engineers who use such methods for the measurement and characterization of surfaces across a wide range of fields and industries, including electronics, energy, automotive and medical engineering."]