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[null,"1.","Record Nr.",null,"UNINA9910703023203321"]
[null,null,"Titolo",null,"A new method to characterize degradation of first surface aluminum reflectors [[electronic resource] ] : preprint / / Florian Sutter ... [and others]"]
[null,null,"Pubbl/distr/stampa",null,"Golden, CO : , : National Renewable Energy Laboratory, , [2010]"]
[null,null,"Descrizione fisica",null,"1 online resource (8 pages) : illustrations"]
[null,null,"Collana",null,"Conference paper ; ; NREL/CP-5500-49164"]
[null,null,"Soggetti",null,"Optical instruments - Research"]
[{"$nulls":4},"Specular reflectance - Measurement"]
[{"$nulls":4},"Reflectance"]
[{"$nulls":4},"Solar concentrators - Research"]
[null,null,"Lingua di pubblicazione",null,"Inglese"]
[null,null,"Formato",null,"Materiale a stampa"]
[null,null,null,"Livello bibliografico","Monografia"]
[null,null,null,"Note generali","Title from title screen (viewed June 23, 2011)."]
[{"$nulls":4},"\"October 2010.\""]
[{"$nulls":4},"\"Presented at SolarPACES 2010, Perpignan, France, September 21-24, 2010.\""]
[null,null,null,"Nota di bibliografia","Includes bibliographical references (page 8)."]
[null,null,null,"Sommario/riassunto","This paper reports the development of a new optical instrument capable of characterizing the aging process of enhanced first surface aluminum reflectors for concentrating solar power (CSP) application. The device measures the specular reflectance at three acceptance angles and the wavelengths with spatial resolution using a digital camera's CMOS sensor. It can be used to measure the corrosion growth rate during outdoor and accelerated exposure tests. These results will allow a correlation between the degraded mirror surface and its specular reflectance."]