{"text_format":"2","workbook":"xls","n_sheets":1,"sheets":["report2"],"not_rendered":{"charts":0,"images":0,"macros":0,"external_links":1,"defined_names":1,"comments":0,"pivot_tables":0},"unopened":[],"bounds":{"document_bytes":16777216,"sheet_cells":100000,"run_cost":"one","rows_first":2000,"rows_last":500,"rows_between":2000,"halvings":0,"cell_chars":16384,"cell_head_chars":4096},"cells_cut":0,"cells_raw":0,"read":"whole","date_system":"1900","formulas":"cached_only"}

{"sheet":"report2","index":0,"n_rows":20,"n_cols":5,"rows_kept":20,"cut":false,"hidden":false,"merged":[[0,2,0,3],[0,4,0,5],[1,2,1,3],[1,4,1,5],[2,2,2,3],[3,2,3,3],[4,2,4,3],[5,2,5,3],[14,2,14,3],[15,2,15,3]],"flags":["formulas_cached_only"]}
[null,"1.","Record Nr.",null,"UNINA9910702249303321"]
[null,null,"Titolo",null,"Transmission electron microscopy (TEM) sample preparation of Si[subscript 1-x]Ge[subscript x] in c-plane sapphire substrate [[electronic resource] /] / Hyun Jung Kim ... [and others]"]
[null,null,"Pubbl/distr/stampa",null,"Hampton, Va. : , : National Aeronautics and Space Administration, Langley Research Center, , [2012]"]
[null,null,"Descrizione fisica",null,"1 online resource (ix, 29 pages) : illustrations (some color)"]
[null,null,"Collana",null,"NASA/TM ; ; 2012-217597"]
[null,null,"Soggetti",null,"Ion beams"]
[{"$nulls":4},"Sapphire"]
[{"$nulls":4},"Transmission electron microscopy"]
[{"$nulls":4},"X ray diffraction"]
[{"$nulls":4},"Single crystals"]
[{"$nulls":4},"Rhombohedrons"]
[{"$nulls":4},"Germanium"]
[{"$nulls":4},"Density measurement"]
[{"$nulls":4},"Crystal structure"]
[null,null,"Lingua di pubblicazione",null,"Inglese"]
[null,null,"Formato",null,"Materiale a stampa"]
[null,null,null,"Livello bibliografico","Monografia"]
[null,null,null,"Note generali","Title from title screen (viewed on Nov. 7, 2012)."]
[{"$nulls":4},"\"August 2012.\""]
[null,null,null,"Nota di bibliografia","Includes bibliographical references (page 29)."]