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[null,"1.","Record Nr.",null,"UNINA9910626129303321"]
[null,null,"Titolo",null,"... IEEE International Conference on Identity, Security and Behavior Analysis (ISBA)"]
[null,null,"Pubbl/distr/stampa",null,"[Piscataway, NJ] : , : [IEEE]"]
[null,null,"ISSN",null,"2640-0790"]
[null,null,"Disciplina",null,"006.248"]
[null,null,"Soggetti",null,"Biometric identification"]
[{"$nulls":4},"Data encryption (Computer science)"]
[{"$nulls":4},"Pattern recognition systems"]
[{"$nulls":4},"Conference papers and proceedings."]
[null,null,"Lingua di pubblicazione",null,"Inglese"]
[null,null,"Formato",null,"Materiale a stampa"]
[null,null,null,"Livello bibliografico","Periodico"]
[null,"2.","Record Nr.",null,"UNINA9910690742203321"]
[null,null,"Titolo",null,"Journal of research of the National Institute of Standards and Technology"]
[null,null,"Pubbl/distr/stampa",null,"[Gaithersburg, MD], : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology"]
[null,null,"Descrizione fisica",null,"1 online resource"]
[null,null,"Disciplina",null,"681.2"]
[null,null,"Soggetti",null,"Standardization"]
[{"$nulls":4},"Physical measurements"]
[{"$nulls":4},"Measurement"]
[{"$nulls":4},"Research Design"]
[{"$nulls":4},"Science"]
[{"$nulls":4},"Technology"]
[{"$nulls":4},"Weights and Measures"]
[{"$nulls":4},"30.03 methods, techniques and organization of exact scientific research"]
[{"$nulls":4},"50.00 technical sciences: general"]
[{"$nulls":4},"Technologie"]
[{"$nulls":4},"Standaardisatie"]
[{"$nulls":4},"Periodical"]
[{"$nulls":4},"Online resources."]
[{"$nulls":4},"Periodicals."]
[null,null,"Lingua di pubblicazione",null,"Inglese"]
[null,null,"Formato",null,"Materiale a stampa"]
[null,null,null,"Livello bibliografico","Periodico"]
[null,null,null,"Sommario/riassunto","Reports NIST research and development in those disciplines of the physical and engineering sciences in which the Institute is active. These include physics, chemistry, engineering, mathematics, and computer sciences. Papers cover a broad range of subjects, with major emphasis on measurement methodology and the basic technology underlying standardization."]