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[null,null,"Autore",null,"Chen Toly <1969->"]
[null,null,"Titolo",null,"Production Planning and Control in Semiconductor Manufacturing : Big Data Analytics and Industry 4.0 Applications / / by Tin-Chih Toly Chen"]
[null,null,"Pubbl/distr/stampa",null,"Cham : , : Springer International Publishing : , : Imprint : Springer, , 2023"]
[null,null,"ISBN",null,"9783031140655"]
[{"$nulls":4},"9783031140648"]
[null,null,"Edizione",null,"[1st ed. 2023.]"]
[null,null,"Descrizione fisica",null,"1 online resource (106 pages)"]
[null,null,"Collana",null,"SpringerBriefs in Applied Sciences and Technology, , 2191-5318"]
[null,null,"Disciplina",null,"006.42"]
[{"$nulls":4},"338.4762138152"]
[null,null,"Soggetti",null,"Industrial engineering"]
[{"$nulls":4},"Production engineering"]
[{"$nulls":4},"Internet of things"]
[{"$nulls":4},"Production management"]
[{"$nulls":4},"Cooperating objects (Computer systems)"]
[{"$nulls":4},"Semiconductors"]
[{"$nulls":4},"Industrial and Production Engineering"]
[{"$nulls":4},"Internet of Things"]
[{"$nulls":4},"Production"]
[{"$nulls":4},"Cyber-Physical Systems"]
[null,null,"Lingua di pubblicazione",null,"Inglese"]
[null,null,"Formato",null,"Materiale a stampa"]
[null,null,null,"Livello bibliografico","Monografia"]
[null,null,"Nota di contenuto",null,"Chapter 1. Big Data Analytics for Semiconductor Manufacturing -- Chapter 2. Industry 4.0 for Semiconductor Manufacturing -- Chapter 3. Cycle Time Prediction and Output Projection -- Chapter 4. Defect Pattern Analysis, Yield Learning Modeling and Yield Prediction -- Chapter 5. Job Sequencing and Scheduling."]
[null,null,null,"Sommario/riassunto","This book systematically analyzes the applicability of big data analytics and Industry 4.0 from the perspective of semiconductor manufacturing management. It reports in real examples and presents case studies as supporting evidence. In recent years, technologies of big data analytics and Industry 4.0 have been frequently applied to the management of semiconductor manufacturing. However, related research results are mostly scattered in various journal issues or conference proceedings, and there is an urgent need for a systematic integration of these "]
[{"$nulls":4},"results. In addition, many related discussions have placed too much emphasis on the theoretical framework of information systems rather than on the needs of semiconductor manufacturing management. This book addresses these issues."]