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[null,"1.","Record Nr.",null,"UNINA9910555082603321"]
[null,null,"Autore",null,"Dahoo Pierre Richard"]
[null,null,"Titolo",null,"Applications and metrology at nanometer scale 1 : smart materials, electromagnetic waves and uncertainties / / Pierre-Richard Dahoo, Philippe Pougnet, Abdelkhalak El Hami"]
[null,null,"Pubbl/distr/stampa",null,"Hoboken, New Jersey : , : John Wiley & Sons, Incorporated"]
[{"$nulls":4},"London, England : , : ISTE Ltd, , [2021]"]
[{"$nulls":4},"©2021"]
[null,null,"ISBN",null,"1-119-80814-6"]
[{"$nulls":4},"1-119-80824-3"]
[{"$nulls":4},"1-119-80822-7"]
[null,null,"Descrizione fisica",null,"1 online resource (251 pages) : illustrations"]
[null,null,"Disciplina",null,"780"]
[null,null,"Soggetti",null,"Materials"]
[{"$nulls":4},"Electronic books."]
[null,null,"Lingua di pubblicazione",null,"Inglese"]
[null,null,"Formato",null,"Materiale a stampa"]
[null,null,null,"Livello bibliografico","Monografia"]
[null,null,null,"Nota di bibliografia","Includes bibliographical references and index."]