{"text_format":"2","workbook":"xls","n_sheets":1,"sheets":["report2"],"not_rendered":{"charts":0,"images":0,"macros":0,"external_links":1,"defined_names":1,"comments":0,"pivot_tables":0},"unopened":[],"bounds":{"document_bytes":16777216,"sheet_cells":100000,"run_cost":"one","rows_first":2000,"rows_last":500,"rows_between":2000,"halvings":0,"cell_chars":16384,"cell_head_chars":4096},"cells_cut":0,"cells_raw":0,"read":"whole","date_system":"1900","formulas":"cached_only"}

{"sheet":"report2","index":0,"n_rows":18,"n_cols":5,"rows_kept":18,"cut":false,"hidden":false,"merged":[[0,2,0,3],[0,4,0,5],[1,2,1,3],[1,4,1,5],[2,2,2,3],[2,4,2,5],[3,2,3,3],[5,2,5,3],[7,2,7,3],[8,2,8,3],[9,2,9,3],[10,2,10,3],[11,2,11,3],[12,2,12,3],[13,2,13,3],[15,2,15,3]],"flags":["formulas_cached_only"]}
[null,"1.","Record Nr.",null,"UNINA9910554240903321"]
[null,null,"Autore",null,"Bohm Joachim"]
[null,null,"Titolo",null,"Einführung in die Kristallographie / / Joachim Bohm, Detlef Klimm, Manfred Mühlberg, Björn Winkler"]
[null,null,"Pubbl/distr/stampa",null,"Berlin ; ; Boston : , : De Gruyter, , [2020]"]
[{"$nulls":4},"©2021"]
[null,null,"ISBN",null,"9783110460247"]
[{"$nulls":4},"3110460246"]
[null,null,"Edizione",null,"[20., erweiterte Auflage]"]
[null,null,"Descrizione fisica",null,"1 online resource (XVI, 516 p.)"]
[null,null,"Collana",null,"De Gruyter Studium"]
[null,null,"Disciplina",null,"530"]
[null,null,"Soggetti",null,"Technology & Engineering / Materials Science / General"]
[null,null,"Lingua di pubblicazione",null,"Tedesco"]
[null,null,"Formato",null,"Materiale a stampa"]
[null,null,null,"Livello bibliografico","Monografia"]
[null,null,"Nota di contenuto",null,"Frontmatter -- Inhalt -- Vorwort -- Einleitung -- 1. Kristallstrukturlehre und Kristallmorphologie -- 2. Kristallchemie -- 3. Beugungsmethoden und Kristallstrukturbestimmung -- 4. Kristallisation–Kristallwachstum–Kristallzüchtung -- 5. Kristallphysik -- 6. Defekte in Kristallen (Realstrukturen) -- Beantwortung der Fragen -- Literatur -- Stichwortverzeichnis"]
[null,null,null,"Sommario/riassunto","Die 20., stark überarbeitete Auflage dieses bewährten Standardwerks behandelt grundlegend und umfassend sämtliche Teilgebiete der Kristallographie, wobei u. a.aktuelle Beugungsmethoden mit Neutronen und Synchrotronstrahlung erstmalig beschrieben werden."]
[{"$nulls":4},"The 20th edition of this proven standard work has been completely revised to cover all areas of crystallography in a fundamental and comprehensive way. For the first time, it includes a discussion of current diffraction methods and synchrotron radiation."]