{"text_format":"2","workbook":"xls","n_sheets":1,"sheets":["report2"],"not_rendered":{"charts":0,"images":0,"macros":0,"external_links":1,"defined_names":2,"comments":0,"pivot_tables":0},"unopened":[],"bounds":{"document_bytes":16777216,"sheet_cells":100000,"run_cost":"one","rows_first":2000,"rows_last":500,"rows_between":2000,"halvings":0,"cell_chars":16384,"cell_head_chars":4096},"cells_cut":0,"cells_raw":0,"read":"whole","date_system":"1900","formulas":"cached_only"}

{"sheet":"report2","index":0,"n_rows":33,"n_cols":5,"rows_kept":33,"cut":false,"hidden":false,"merged":[[0,2,0,3],[0,4,0,5],[1,2,1,3],[1,4,1,5],[2,2,2,3],[3,2,3,3],[4,2,4,3],[5,2,5,3],[6,2,6,3],[7,2,7,3],[8,2,8,3],[11,2,11,3],[11,4,11,5],[12,2,12,3],[12,4,12,5],[13,2,13,3],[13,4,13,5],[14,2,14,3],[15,2,15,3],[17,2,17,3],[18,2,18,3],[19,2,19,3],[20,2,20,3],[26,2,26,3],[27,2,27,3],[30,2,30,3]],"flags":["formulas_cached_only"]}
[null,"1.","Record Nr.",null,"UNISA996279559003316"]
[null,null,"Titolo",null,"ANSI/IEEE Std C37.98-1987 : IEEE Standard Seismic Testing of Relays / / Institute of Electrical and Electronics Engineers"]
[null,null,"Pubbl/distr/stampa",null,"New York, New York : , : IEEE, , 1987"]
[null,null,"ISBN",null,"0-7381-0900-2"]
[null,null,"Descrizione fisica",null,"1 online resource (39 pages)"]
[null,null,"Disciplina",null,"621.38104"]
[null,null,"Soggetti",null,"Electronic apparatus and appliances - Testing"]
[null,null,"Lingua di pubblicazione",null,"Inglese"]
[null,null,"Formato",null,"Materiale a stampa"]
[null,null,null,"Livello bibliografico","Monografia"]
[null,null,null,"Sommario/riassunto","This standard specifies the procedures to be used in the seismic testing of relays used in power system facilities. It is concerned with the determination of the seismic fragility level of relays and also gives recommendations for proof testing. The purpose is to establish procedures for determining the seismic capabilities of protective and auxiliary relays. These procedures employ what has been called fragility testing IEEE Std 344-1987."]
[null,"2.","Record Nr.",null,"UNINA9910552715803321"]
[null,null,"Autore",null,"Pelgrom Marcel J. M."]
[null,null,"Titolo",null,"Analog-to-Digital Conversion / / by Marcel J.M. Pelgrom"]
[null,null,"Pubbl/distr/stampa",null,"Cham : , : Springer International Publishing : , : Imprint : Springer, , 2022"]
[null,null,"ISBN",null,"9783030908089"]
[{"$nulls":4},"9783030908072"]
[null,null,"Edizione",null,"[4th ed. 2022.]"]
[null,null,"Descrizione fisica",null,"1 online resource (1032 pages)"]
[null,null,"Disciplina",null,"621.38159"]
[null,null,"Soggetti",null,"Electronic circuits"]
[{"$nulls":4},"Electronics"]
[{"$nulls":4},"Cooperating objects (Computer systems)"]
[{"$nulls":4},"Electronic Circuits and Systems"]
[{"$nulls":4},"Electronics and Microelectronics, Instrumentation"]
[{"$nulls":4},"Cyber-Physical Systems"]
[null,null,"Lingua di pubblicazione",null,"Inglese"]
[null,null,"Formato",null,"Materiale a stampa"]
[null,null,null,"Livello bibliografico","Monografia"]
[null,null,null,"Nota di bibliografia","Includes bibliographical references and index."]
[null,null,"Nota di contenuto",null,"Introduction -- Basics -- Sampling and Sample-and-hold circuits -- Quantization -- Accuracy -- Reference circuits -- Digital-to-analog conversion -- Nyquist Analog-to-digital conversion -- Time-interleaved structures -- Sigma-delta modulation -- Characterization and specification."]
[null,null,null,"Sommario/riassunto","This textbook is appropriate for use in graduate-level curricula in analog-to-digital conversion, as well as for practicing engineers in need of a state-of-the-art reference on data converters. It discusses various analog-to-digital conversion principles, including sampling, quantization, reference generation, Nyquist architectures and sigma-delta modulation. This book presents an overview of the state-of-the-art in this field and focuses on issues of optimizing accuracy and speed, while reducing the power level. This new, fourth edition emphasizes novel calibration concepts, the specific requirements of systems, the consequences of advanced technology and the need for a more statistical approach to accuracy. Pedagogical enhancements to this edition include additional, new exercises, solved examples to introduce all key, new concepts and warnings, remarks and hints, from a practitioner's perspective, wherever appropriate. Considerable background information and practical tips, from designing a PCB, to "]
[{"$nulls":4},"lay-out aspects, to trade-offs on system level, complement the discussion of basic principles, making this book a valuable reference for the experienced engineer. Covers relevant developments in analog-to-digital conversion, suited for both graduate-level courses and professionals; Updates the third edition of this book to address recent technology and design developments; Includes new exercises, as well as solved, step-by-step examples to help understand each new concept."]