{"text_format":"2","workbook":"xls","n_sheets":1,"sheets":["report2"],"not_rendered":{"charts":0,"images":0,"macros":0,"external_links":1,"defined_names":1,"comments":0,"pivot_tables":0},"unopened":[],"bounds":{"document_bytes":16777216,"sheet_cells":100000,"run_cost":"one","rows_first":2000,"rows_last":500,"rows_between":2000,"halvings":0,"cell_chars":16384,"cell_head_chars":4096},"cells_cut":0,"cells_raw":0,"read":"whole","date_system":"1900","formulas":"cached_only"}

{"sheet":"report2","index":0,"n_rows":22,"n_cols":5,"rows_kept":22,"cut":false,"hidden":false,"merged":[[0,2,0,3],[0,4,0,5],[1,2,1,3],[1,4,1,5],[2,2,2,3],[3,2,3,3],[4,2,4,3],[5,2,5,3],[6,2,6,3],[7,2,7,3],[8,2,8,3],[14,2,14,3],[15,2,15,3],[19,2,19,3]],"flags":["formulas_cached_only"]}
[null,"1.","Record Nr.",null,"UNINA9910479874603321"]
[null,null,"Titolo",null,"Surface Analysis Methods in Materials Science [[electronic resource] /] / edited by D.J. O'Connor, Brett A. Sexton, Roger St.C. Smart"]
[null,null,"Pubbl/distr/stampa",null,"Berlin, Heidelberg : , : Springer Berlin Heidelberg : , : Imprint : Springer, , 1992"]
[null,null,"ISBN",null,"3-662-02767-4"]
[null,null,"Edizione",null,"[1st ed. 1992.]"]
[null,null,"Descrizione fisica",null,"1 online resource (XXI, 453 p.)"]
[null,null,"Collana",null,"Springer Series in Surface Sciences, , 0931-5195 ; ; 23"]
[null,null,"Disciplina",null,"530.417"]
[null,null,"Soggetti",null,"Surfaces (Physics)"]
[{"$nulls":4},"Interfaces (Physical sciences)"]
[{"$nulls":4},"Thin films"]
[{"$nulls":4},"Materials—Surfaces"]
[{"$nulls":4},"Surface and Interface Science, Thin Films"]
[{"$nulls":4},"Surfaces and Interfaces, Thin Films"]
[null,null,"Lingua di pubblicazione",null,"Inglese"]
[null,null,"Formato",null,"Materiale a stampa"]
[null,null,null,"Livello bibliografico","Monografia"]
[null,null,null,"Note generali","Bibliographic Level Mode of Issuance: Monograph"]
[null,null,null,"Nota di bibliografia","Includes bibliographical references and index."]
[null,null,"Nota di contenuto",null,"1. Solid Surfaces, Their Structure and Composition -- 2. UHV Basics -- 3. Electron Microscope Techniques for Surface Characterization -- 4. Sputter Depth Profiling -- 5. SIMS — Secondary Ion Mass Spectrometry -- 6. Auger Spectroscopy and Scanning Auger Microscopy -- 7. X-Ray Photoelectron Spectroscopy -- 8. Fourier Transform Infrared Specroscopy of Surfaces -- 9. Rutherford Backscattering Spectrometry and Nuclear Reaction Analysis -- 10. Scanning Tunnelling Microscopy -- 11. Low Energy Ion Scattering -- 12. Reflection High Energy Electron Diffraction -- 13. Low Energy Electron Diffraction -- 14. Ultraviolet Photoelectron Spectroscopy of Solids -- 15. Spin Polarized Electron Techniques -- 16. Materials Technology -- 17. Characterization of Catalysts by Surface Analysis -- 18. Applications to Devices and Device Materials -- 19. Characterization of Oxidized Surfaces -- 20. Coated Steel -- 21. Thin Film Analysis -- 22. Identification of Adsorbed Species -- IV Appendix -- Acronyms Used in Surface and Thin Film Analysis -- Surface Science Bibliography."]
[null,null,null,"Sommario/riassunto","The idea for this book stemmed from a remark by Philip Jennings of Murdoch University in a discussion session following a regular meeting of the Australian Surface Science group. He observed that a text on surface analysis and applica­ tions to materials suitable for final year "]
[{"$nulls":4},"undergraduate and postgraduate science students was not currently available. Furthermore, the members of the Australian Surface Science group had the research experience and range of coverage of sur­ face analytical techniques and applications to provide a text for this purpose. A of techniques and applications to be included was agreed at that meeting. The list intended readership of the book has been broadened since the early discussions, particularly to encompass industrial users, but there has been no significant alter­ ation in content. The editors, in consultation with the contributors, have agreed that the book should be prepared for four major groups of readers: - senior undergraduate students in chemistry, physics, metallurgy, materials science and materials engineering; - postgraduate students undertaking research that involves the use of analytical techniques; - groups of scientists and engineers attending training courses and workshops on the application of surface analytical techniques in materials science; - industrial scientists and engineers in research and development seeking a description of available surface analytical techniques and guidance on the most appropriate techniques for particular applications. The contributors mostly come from Australia, with the notable exception of Ray Browning from Stanford University."]