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[null,"1.","Record Nr.",null,"UNINA9910466018103321"]
[null,null,"Autore",null,"Moreira José <1975->"]
[null,null,"Titolo",null,"An engineer's guide to automated testing of high-speed interfaces / / José Moreira, Hubert Werkmann"]
[null,null,"Pubbl/distr/stampa",null,"Norwood, Massachusetts : , : Artech House, , [2016]"]
[{"$nulls":4},"[Piscataqay, New Jersey] : , : IEEE Xplore, , [2016]"]
[null,null,"ISBN",null,"1-60807-986-4"]
[null,null,"Edizione",null,"[Second edition.]"]
[null,null,"Descrizione fisica",null,"1 online resource (709 pages) : illustrations"]
[null,null,"Collana",null,"Artech House microwave library"]
[null,null,"Disciplina",null,"621.3815"]
[null,null,"Soggetti",null,"Integrated circuits - Testing"]
[{"$nulls":4},"Automatic test equipment"]
[{"$nulls":4},"Very high speed integrated circuits"]
[{"$nulls":4},"Electronic books."]
[null,null,"Lingua di pubblicazione",null,"Inglese"]
[null,null,"Formato",null,"Materiale a stampa"]
[null,null,null,"Livello bibliografico","Monografia"]
[null,null,null,"Nota di bibliografia","Includes bibliographical references at the end of each chapters and index."]
[null,null,"Nota di contenuto",null,"Preface to the Second Edition; Preface to the First Edition; 1 Introduction; 1.1 Characterization and Design Verification; 1.2 Production Testing; 1.3 Accuracy and Correlation; 1.4 The ATE Test Fixture; 1.5 The Future; 2 High-Speed Digital Basics; 2.1 High-Speed Digital Signaling; 2.2 Time and Frequency-Domains; 2.3 Bit Error Rate; 2.4 Jitter; 2.5 Classification of High-Speed I/O Interfaces; 2.6 Hardware Building Blocks and Concepts; 2.7 Multilevel Signaling; 3 High-Speed Interface Standards; 3.1 PCI Express; 3.2 XDR DRAM; 3.3 GDDR SDRAM; 3.4 MIPI Standards."]
[{"$nulls":4},"3.5 Other High-Speed Digital Interface Standards4 ATE Instrumentation for DigitalApplications; 4.1 ATE Timing Architectures; 4.2 Digital Pin Electronics ATE Card; 4.3 Sampler/Digitizer ATE Card; 4.4 Parametric Measurements with Sampled Data; 4.5 Power Supplies; 5 Tests and Measurements; 5.1 Bit and Pattern Alignment; 5.2 Functional Test; 5."]
[null,null,null,"Sommario/riassunto","This second edition of An Engineer#x92;s Guide to Automated Testing of High-Speed Interfaces provides updates to reflect current state-of-the-art high-speed digital testing with automated test equipment technology (ATE). Featuring clear examples, this one-stop reference covers all critical aspects of automated testing, including an introduction to high-speed digital basics, a discussion of industry standards, ATE and bench instrumentation for digital applications, and "]
[{"$nulls":4},"test and measurement techniques for characterization and production environment. Engineers learn how to apply automated test equipment for testing high-speed digital I/O interfaces and gain a better understanding of PCI-Express 4, 100Gb Ethernet, and MIPI while exploring the correlation between phase noise and jitter. This updated resource provides expanded material on 28/32 Gbps NRZ testing and wireless testing that are becoming increasingly more pertinent for future applications. This book explores the current trend of merging high-speed digital testing within the fields of photonic and wireless testing."]