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[null,"1.","Record Nr.",null,"UNINA990009188030403321"]
[null,null,"Autore",null,"Raubitschek, Antony E."]
[null,null,"Titolo",null,"The school of hellas : essays on Greek History, Archeology and Literature / A. E. Raubitschek ; edited by Dirk Obbink and Paul A. Vander Waerdt"]
[null,null,"Pubbl/distr/stampa",null,"New York ; Oxford : Oxford University Press, 1991"]
[null,null,"ISBN",null,"0-19-505691-4"]
[null,null,"Descrizione fisica",null,"XV, 384 p. : ill. ; 25 cm"]
[null,null,"Disciplina",null,"938"]
[null,null,"Locazione",null,"FLFBC"]
[null,null,"Collocazione",null,"938 RAU 1"]
[null,null,"Lingua di pubblicazione",null,"Tedesco"]
[{"$nulls":4},"Inglese"]
[null,null,"Formato",null,"Materiale a stampa"]
[null,null,null,"Livello bibliografico","Monografia"]
[null,"2.","Record Nr.",null,"UNINA9910464434903321"]
[null,null,"Autore",null,"Whitehouse D. J (David J.)"]
[null,null,"Titolo",null,"Handbook of surface and nanometrology / / David J. Whitehouse"]
[null,null,"Pubbl/distr/stampa",null,"Boca Raton : , : CRC Press, , 2011"]
[null,null,"ISBN",null,"0-429-14069-X"]
[{"$nulls":4},"1-4200-8202-7"]
[null,null,"Edizione",null,"[2nd ed.]"]
[null,null,"Descrizione fisica",null,"1 online resource (982 p.)"]
[null,null,"Disciplina",null,"620/.440287"]
[null,null,"Soggetti",null,"Surfaces (Technology) - Measurement"]
[{"$nulls":4},"Nanostructured materials"]
[{"$nulls":4},"Metrology"]
[{"$nulls":4},"Electronic books."]
[null,null,"Lingua di pubblicazione",null,"Inglese"]
[null,null,"Formato",null,"Materiale a stampa"]
[null,null,null,"Livello bibliografico","Monografia"]
[null,null,null,"Note generali","Rev. ed. of: Handbook of surface metrology. c1994."]
[{"$nulls":4},"A Taylor & Francis book."]
[null,null,null,"Nota di bibliografia","Includes bibliographical references and index."]
[null,null,"Nota di contenuto",null,"Front cover; Dedication; Contents; Preface; Acknowledgments; Chapter 1. Introduction-Surface and Nanometrology; Chapter 2. Characterization; Chapter 3. Processing, Operations, and Simulations; Chapter 4. Measurement Techniques; Chapter 5. Standardization-Traceability-Uncertainty; Chapter 6. Surfaces and Manufacture; Chapter 7. Surface Geometry and Its Importance in Function; Chapter 8. Surface Geometry, Scale of Size Effects, Nanometrology; Chapter 9. General Comments; Glossary; Back cover"]
[null,null,null,"Sommario/riassunto","David Whitehouse, known as the father of digital metrology, helped pioneer the use of nanotechnology in surface science and surface metrology, and he continues to move the field forward. In this heavily revised and expanded edition, he addresses the many paradigm shifts occurring in the field. He explains the incorporation of physics to develop optimum solutions for manufacture and performance, and provides mechanical engineers with accessible explanations of essential concepts along with the higher mathematics that is now required of those working in the field. Emphasis is placed on systems w"]