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[null,"1.","Record Nr.",null,"UNINA9910463021903321"]
[null,null,"Titolo",null,"Adhesion aspects in MEMS-NEMS / / edited by S. H. Kim, M. T. Dugger and K. L. Mittal"]
[null,null,"Pubbl/distr/stampa",null,"Leiden ; ; Boston : , : Brill"]
[{"$nulls":4},"Biggleswade : , : Extenza Turpin [distributor], , 2010"]
[null,null,"ISBN",null,"0-429-08792-6"]
[{"$nulls":4},"1-61583-947-X"]
[{"$nulls":4},"90-04-19095-3"]
[null,null,"Descrizione fisica",null,"1 online resource (424 p.)"]
[null,null,"Disciplina",null,"621.381"]
[null,null,"Soggetti",null,"Microelectromechanical systems"]
[{"$nulls":4},"Nanoelectromechanical systems"]
[{"$nulls":4},"Adhesion"]
[{"$nulls":4},"Surfaces (Technology)"]
[{"$nulls":4},"Electronic books."]
[null,null,"Lingua di pubblicazione",null,"Inglese"]
[null,null,"Formato",null,"Materiale a stampa"]
[null,null,null,"Livello bibliografico","Monografia"]
[null,null,null,"Note generali","Description based upon print version of record."]
[null,null,null,"Nota di bibliografia","Includes bibliographical references."]
[null,null,"Nota di contenuto",null,"pt. 1. Understanding through continuum theory -- pt. 2. Computer simulation of interfaces -- pt. 3. Adhesion and friction measurements -- pt. 4. Adhesion in practical applications -- pt. 5. Adhesion mitigation strategies."]
[null,null,null,"Sommario/riassunto","Phenomena associated with the adhesion interaction of surfaces have been a critical aspect of micro- and nanosystem development and performance since the first MicroElectroMechanicalSystems(MEMS) were fabricated. These phenomena are ubiquitous in nature and are present in all systems, however MEMS devices are particularly sensitive to their effects owing to their small size and limited actuation force that can be generated. Extension of MEMS technology concepts to the nanoscale and development of NanoElectroMechanicalSystems(NEMS) will result in systems even more strongly influenced by surface"]
[null,"2.","Record Nr.",null,"UNICAMPANIAVAN00021276"]
[null,null,"Autore",null,"Miall, Andrew D."]
[null,null,"Titolo",null,"Principles of sedimentary basin analysis / Andrew D. Miall"]
[null,null,"Pubbl/distr/stampa",null,"Berlin, : Springer, 2000"]
[null,null,"ISBN",null,"35-406-5790-8"]
[null,null,"Edizione",null,"[3. ed]"]
[null,null,"Descrizione fisica",null,"XXI, 616 p. : ill. ; 28 cm"]
[null,null,"Disciplina",null,"552.5"]
[null,null,"Lingua di pubblicazione",null,"Inglese"]
[null,null,"Formato",null,"Materiale a stampa"]
[null,null,null,"Livello bibliografico","Monografia"]