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[null,"1.","Record Nr.",null,"UNINA990000152550403321"]
[null,null,"Titolo",null,"OBJECT oriented computer systems engineering / Derrick Morris ... [e altri]"]
[null,null,"Pubbl/distr/stampa",null,"London [etc.] : Springer, copyr. 1996"]
[null,null,"ISBN",null,"3-540-76020-2"]
[null,null,"Descrizione fisica",null,"IX, 337 p. : ill. ; 23 cm"]
[null,null,"Collana",null,"Applied computing"]
[null,null,"Disciplina",null,"004.21"]
[null,null,"Locazione",null,"FINBC"]
[null,null,"Collocazione",null,"13 F 61 25"]
[null,null,"Lingua di pubblicazione",null,"Italiano"]
[null,null,"Formato",null,"Materiale a stampa"]
[null,null,null,"Livello bibliografico","Monografia"]
[null,"2.","Record Nr.",null,"UNINA9910454319803321"]
[null,null,"Titolo",null,"Radiation effects and soft errors in integrated circuits and electronic devices [[electronic resource] /] / editors, R.D. Schrimpf, D.M. Fleetwood"]
[null,null,"Pubbl/distr/stampa",null,"Singapore ; ; New Jersey, : World Scientific Pub., c2004"]
[null,null,"ISBN",null,"1-281-93459-3"]
[{"$nulls":4},"9786611934590"]
[{"$nulls":4},"981-279-470-0"]
[null,null,"Descrizione fisica",null,"1 online resource (349 p.)"]
[null,null,"Collana",null,"Selected topics in electronics and systems ; ; vol. 34"]
[null,null,"Disciplina",null,"621.3815"]
[null,null,"Soggetti",null,"Electronic circuits - Effect of radiation on"]
[{"$nulls":4},"Integrated circuits - Effect of radiation on"]
[{"$nulls":4},"Electronic books."]
[null,null,"Lingua di pubblicazione",null,"Inglese"]
[null,null,"Formato",null,"Materiale a stampa"]
[null,null,null,"Livello bibliografico","Monografia"]
[null,null,null,"Note generali","Also published in the International Journal of High Speed Electronics and Systems, v. 14, no. 2 (2004) p. 285-623."]
[null,null,null,"Nota di bibliografia","Includes bibliographical references."]
[null,null,"Nota di contenuto",null,"CONTENTS               ; Preface              ; Single Event Effects in Avionics and on the Ground                                                         ; 1. Introduction                      ; 2. Similarities between SEE in Avionics and on the Ground                                                                ; 3. Differences Between SEE in Avionics and on the Ground                                                               ; 4. Atmospheric and Ground Level Environments                                                   ; 5. SEE Data in devices"]
[{"$nulls":4},"6. Summary                 Soft Errors in Commercial Integrated Circuits                                                    ; 1. Introduction                      ; 2. Scaling trends for memory devices                                           ; 3. Seating trend for peripheral logic devices                                                    ; 4. Conclusion                    ; Single-Event Effects in lll-V Semiconductor Electronics                                                              ; 1. Introduction"]
[{"$nulls":4},"2. Single-Event Effects in lll-V Electronic Devices                                                          3. Summary and Conclusions                                 ; Investigation of Single-Event Transients in Fast Integrated Circuits with a Pulsed Laser                                                                                               ; 1. Basic Mechanisms of a SET                                   ; 2. SET Laser Testing                           ; 3. Experimental set-up for SET laser testing                                                   ; 4. Results"]
[{"$nulls":4},"5. Conclusions                     System Level Single Event Upset Mitigation Strategies                                                            ; 1. Introduction                      "]
[{"$nulls":4},"; 2. Systems Engineering for Energetic Particle Environment Compatibility                                                                              ; 3. Fault Tolerant Systems Strategies                                           ; Radiation-Tolerant Design for High Performance Mixed-Signal Circuits"]
[{"$nulls":4},"1. Introduction                      2. Radiation Mechanisms in Mixed-Signal Integrated Circuits                                                                  ; 3. Process Component and Layout Choices for Hardened-by-Design Circuits                                                                              ; 4. Total Dose Hardening                              ; 5. Single-Event Effect Hardening                                       ; 6. Dose-Rate Effect Hardening                                    ; 7. Conclusion"]
[{"$nulls":4},"A Total-Dose Hardening-By-Design Approach for High-Speed Mixed-Signal CMOS Integrated Circuits"]
[null,null,null,"Sommario/riassunto","This book provides a detailed treatment of radiation effects in electronic devices, including effects at the material, device, and circuit levels. The emphasis is on transient effects caused by single ionizing particles (single-event effects and soft errors) and effects produced by the cumulative energy deposited by the radiation (total ionizing dose effects). Bipolar (Si and SiGe), metal-oxide-semiconductor (MOS), and compound semiconductor technologies are discussed. In addition to considering the specific issues associated with high-performance devices and technologies, the book includes t"]