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[null,"1.","Record Nr.",null,"UNISA990001260030203316"]
[null,null,"Autore",null,"DONATO, Franco"]
[null,null,"Titolo",null,"L'ordine nascosto dell'organizzazione urbana : un'applicazione della geometria frattale e della teoria dei sistemi auto-organizzati alla dimensione spaziale degli insediamenti / Franco Donato, Lorenza Lucci Basili ; prefazione di Elio Piroddi"]
[null,null,"Pubbl/distr/stampa",null,"Milano : F. Angeli, 1996"]
[null,null,"ISBN",null,"88-204-9413-2"]
[null,null,"Descrizione fisica",null,"232 p. : ill. ; 23 cm"]
[null,null,"Collana",null,"Ricerche di tecnologia dell'architettura / collana diretta da Raffaella Crespi e Guido Nardi ; 56"]
[null,null,"Disciplina",null,"711.0151474"]
[null,null,"Soggetti",null,"Pianificazione urbanistica - Modelli matematici"]
[{"$nulls":4},"Frattali - Applicazione all'urbanistica"]
[null,null,"Collocazione",null,"711.0151474 DON"]
[null,null,"Lingua di pubblicazione",null,"Italiano"]
[null,null,"Formato",null,"Materiale a stampa"]
[null,null,null,"Livello bibliografico","Monografia"]
[null,null,null,"Note generali","In appendice: Famiglie frattali, degli stessi AA.."]
[null,"2.","Record Nr.",null,"UNISALENTO991004091819707536"]
[null,null,"Autore",null,"Biblioteca Apostolica Vaticana"]
[null,null,"Titolo",null,"Planisferi, carte nautiche e affini dal secolo 14. al 17. esistenti nella Biblioteca apostolica Vaticana / [a cura di] Roberto Almagia"]
[null,null,"Pubbl/distr/stampa",null,"Citta del Vaticano : Biblioteca Apostolica Vaticana, 1944"]
[null,null,"Descrizione fisica",null,"XI, 156 p., LVI tav. : ill. ; 42 cm."]
[null,null,"Collana",null,"Monumenta cartographica Vaticana ; 1"]
[null,null,"Lingua di pubblicazione",null,"Italiano"]
[null,null,"Formato",null,"Materiale a stampa"]
[null,null,null,"Livello bibliografico","Monografia"]
[null,"3.","Record Nr.",null,"UNINA9910373924903321"]
[null,null,"Autore",null,"Quinten Michael"]
[null,null,"Titolo",null,"A Practical Guide to Surface Metrology / / by Michael Quinten"]
[null,null,"Pubbl/distr/stampa",null,"Cham : , : Springer International Publishing : , : Imprint : Springer, , 2019"]
[null,null,"ISBN",null,"3-030-29454-4"]
[null,null,"Edizione",null,"[1st ed. 2019.]"]
[null,null,"Descrizione fisica",null,"1 online resource (XXV, 230 p. 156 illus., 100 illus. in color.)"]
[null,null,"Collana",null,"Springer Series in Measurement Science and Technology, , 2198-7807"]
[null,null,"Disciplina",null,"681.25"]
[null,null,"Soggetti",null,"Physical measurements"]
[{"$nulls":4},"Measurement"]
[{"$nulls":4},"Materials science"]
[{"$nulls":4},"Surfaces (Physics)"]
[{"$nulls":4},"Interfaces (Physical sciences)"]
[{"$nulls":4},"Thin films"]
[{"$nulls":4},"Materials—Surfaces"]
[{"$nulls":4},"Engineering—Materials"]
[{"$nulls":4},"Lasers"]
[{"$nulls":4},"Photonics"]
[{"$nulls":4},"Measurement Science and Instrumentation"]
[{"$nulls":4},"Characterization and Evaluation of Materials"]
[{"$nulls":4},"Surface and Interface Science, Thin Films"]
[{"$nulls":4},"Surfaces and Interfaces, Thin Films"]
[{"$nulls":4},"Materials Engineering"]
[{"$nulls":4},"Optics, Lasers, Photonics, Optical Devices"]
[null,null,"Lingua di pubblicazione",null,"Inglese"]
[null,null,"Formato",null,"Materiale a stampa"]
[null,null,null,"Livello bibliografico","Monografia"]
[null,null,null,"Nota di bibliografia","Includes bibliographical references and index."]
[null,null,"Nota di contenuto",null,"Preface -- Introduction to Surfaces and Surface Metrology -- Tactile Surface Metrology -- Capacitive And Inductive Surface Metrology -- Optical Surface Metrology- Physical Basics -- Optical Surface Metrology - Methods  -- Imaging Methods - Multisensor - Systems - A Versatile Approach To Surface Metrology -- Appendix -- Index."]
[null,null,null,"Sommario/riassunto","This book offers a genuinely practical introduction to the most commonly encountered optical and non-optical systems used for the metrology and characterization of surfaces, including guidance on best practice, calibration, advantages and disadvantages, and interpretation "]
[{"$nulls":4},"of results. It enables the user to select the best approach in a given context. Most methods in surface metrology are based upon the interaction of light or electromagnetic radiation (UV, NIR, IR), and different optical effects are utilized to get a certain optical response from the surface; some of them record only the intensity reflected or scattered by the surface, others use interference of EM waves to obtain a characteristic response from the surface. The book covers techniques ranging from microscopy (including confocal, SNOM and digital holographic microscopy) through interferometry (including white light, multi-wavelength, grazing incidence and shearing) to spectral reflectometry and ellipsometry. The non-optical methods comprise tactile methods (stylus tip, AFM) as well as capacitive and inductive methods (capacitive sensors, eddy current sensors). The book provides: Overview of the working principles Description of advantages and disadvantages Currently achievable numbers for resolutions, repeatability, and reproducibility Examples of real-world applications A final chapter discusses examples where the combination of different surface metrology techniques in a multi-sensor system can reasonably contribute to a better understanding of surface properties as well as a faster characterization of surfaces in industrial applications. The book is aimed at scientists and engineers who use such methods for the measurement and characterization of surfaces across a wide range of fields and industries, including electronics, energy, automotive and medical engineering."]