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[null,"1.","Record Nr.",null,"UNINA9910300389603321"]
[null,null,"Autore",null,"Haschke Michael"]
[null,null,"Titolo",null,"Laboratory Micro-X-Ray Fluorescence Spectroscopy : Instrumentation and Applications / / by Michael Haschke"]
[null,null,"Pubbl/distr/stampa",null,"Cham : , : Springer International Publishing : , : Imprint : Springer, , 2014"]
[null,null,"ISBN",null,"3-319-04864-3"]
[null,null,"Edizione",null,"[1st ed. 2014.]"]
[null,null,"Descrizione fisica",null,"1 online resource (367 p.)"]
[null,null,"Collana",null,"Springer Series in Surface Sciences, , 0931-5195 ; ; 55"]
[null,null,"Disciplina",null,"537.5352"]
[null,null,"Soggetti",null,"Spectrum analysis"]
[{"$nulls":4},"Microscopy"]
[{"$nulls":4},"Materials—Surfaces"]
[{"$nulls":4},"Thin films"]
[{"$nulls":4},"Physical measurements"]
[{"$nulls":4},"Measurement"]
[{"$nulls":4},"Surfaces (Physics)"]
[{"$nulls":4},"Interfaces (Physical sciences)"]
[{"$nulls":4},"Spectroscopy and Microscopy"]
[{"$nulls":4},"Surfaces and Interfaces, Thin Films"]
[{"$nulls":4},"Measurement Science and Instrumentation"]
[{"$nulls":4},"Spectroscopy/Spectrometry"]
[{"$nulls":4},"Surface and Interface Science, Thin Films"]
[null,null,"Lingua di pubblicazione",null,"Inglese"]
[null,null,"Formato",null,"Materiale a stampa"]
[null,null,null,"Livello bibliografico","Monografia"]
[null,null,null,"Note generali","Description based upon print version of record."]
[null,null,null,"Nota di bibliografia","Includes bibliographical references and index."]
[null,null,"Nota di contenuto",null,"XRF-Basics -- Main Components of X-Ray Spectrometers -- Special Requirements for µ-XRF -- Quantification -- Sample Preparation -- Relations to Other Analytical Methods -- Applications."]
[null,null,null,"Sommario/riassunto","Micro-X-ray fluorescence offers the possibility for a position- sensitive and non-destructive analysis that can be used for the analysis of non-homogeneous materials and layer systems. This analytical technique has shown a dynamic development in the last 15 years and is used for the analysis of small particles, inclusions, of elemental distributions for a wide range of different applications both in research and quality control. The first experiments were performed on synchrotrons but there is a requirement for laboratory instruments which offers a fast and immediate access for analytical results. The book discuss the main "]
[{"$nulls":4},"components of a µ-XRF instrument and the different measurement modes, it gives an overview about the various instruments types, considers the special requirements for quantification of non-homogeneous materials and presents a wide range of application for single point and multi-point analysis as well as for distribution analysis in one, two and three dimensions."]