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[null,null,"Titolo",null,"VLSI-SoC: At the Crossroads of Emerging Trends : 21st IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2013, Istanbul, Turkey, October 6-9, 2013, Revised Selected Papers / / edited by Alex Orailoglu, H. Fatih Ugurdag, Luís Miguel Silveira, Martin Margala, Ricardo Reis"]
[null,null,"Pubbl/distr/stampa",null,"Cham : , : Springer International Publishing : , : Imprint : Springer, , 2015"]
[null,null,"ISBN",null,"3-319-23799-3"]
[null,null,"Edizione",null,"[1st ed. 2015.]"]
[null,null,"Descrizione fisica",null,"1 online resource (XIV, 267 p. 177 illus.)"]
[null,null,"Collana",null,"IFIP Advances in Information and Communication Technology, , 1868-422X ; ; 461"]
[null,null,"Disciplina",null,"621.395"]
[null,null,"Soggetti",null,"Computer engineering"]
[{"$nulls":4},"Computer networks"]
[{"$nulls":4},"Computers"]
[{"$nulls":4},"Computer-aided engineering"]
[{"$nulls":4},"Computer Engineering and Networks"]
[{"$nulls":4},"Computer Hardware"]
[{"$nulls":4},"Computer-Aided Engineering (CAD, CAE) and Design"]
[null,null,"Lingua di pubblicazione",null,"Inglese"]
[null,null,"Formato",null,"Materiale a stampa"]
[null,null,null,"Livello bibliografico","Monografia"]
[null,null,null,"Note generali","Bibliographic Level Mode of Issuance: Monograph"]
[null,null,null,"Nota di bibliografia","Includes bibliographical references and index."]
[null,null,null,"Sommario/riassunto","This book contains extended and revised versions of the best papers presented at the 21st IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2013, held in Istanbul, Turkey, in October 2013. The 11 papers included in the book were carefully reviewed and selected from the 48 full papers presented at the conference. An extended version of a previously unpublished high-quality paper from VLSI-SoC 2012 is also included. The papers cover a wide range of topics in VLSI technology and advanced research. They address the current trend toward increasing chip integration and technology process advancements bringing about stimulating new challenges both at the physical and system-design levels, as well as in the test of these systems."]