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[null,"1.","Record Nr.",null,"UNINA9910147245603321"]
[null,null,"Titolo",null,"ANSI N42.31-2003 : American National Standard for Measurement Procedures for Resolution and Efficiency of Wide-Band Gap Semiconductor Detectors of Ionizing Radiation / / IEEE"]
[null,null,"Pubbl/distr/stampa",null,"New York : , : IEEE, , [2003]"]
[null,null,"Descrizione fisica",null,"1 online resource (vii, 33 pages) : illustrations"]
[null,null,"Disciplina",null,"539.2"]
[null,null,"Soggetti",null,"Ionizing radiation"]
[null,null,"Lingua di pubblicazione",null,"Inglese"]
[null,null,"Formato",null,"Materiale a stampa"]
[null,null,null,"Livello bibliografico","Monografia"]
[null,null,null,"Note generali","Includes index."]
[null,null,null,"Sommario/riassunto","Standard measurement and test procedures are established for wide-bandgap semiconductor detectors such as cadmium telluride (CdTe), cadmium-zinc-telluride (CdZnTe), and mercuric iodide (HgI2) that can be used at room temperature for the detection and quantitative characterization of gamma-rays, X-rays, and charged particles. Standard terminology and descriptions of the principal features of the detectors are included. Included in this standard is an annex on interfering electromagnetic noise, which is a factor in such measurements."]