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[null,"1.","Record Nr.",null,"UNISA996203648103316"]
[null,null,"Titolo",null,"American anthropologist"]
[null,null,"Pubbl/distr/stampa",null,"Washington, D.C., : Judd & Detweiler, 1888-"]
[{"$nulls":4},"Berkeley, Calif., : University of California Press"]
[{"$nulls":4},"Hoboken, NJ, : Wiley-Blackwell"]
[null,null,"ISSN",null,"1548-1433"]
[null,null,"Disciplina",null,"301/.05"]
[null,null,"Soggetti",null,"Anthropology"]
[{"$nulls":4},"Anthropologie"]
[{"$nulls":4},"Culturele antropologie"]
[{"$nulls":4},"Antropologen"]
[{"$nulls":4},"Periodicals."]
[null,null,"Lingua di pubblicazione",null,"Inglese"]
[null,null,"Formato",null,"Materiale a stampa"]
[null,null,null,"Livello bibliografico","Periodico"]
[null,null,null,"Note generali","Imprint varies."]
[{"$nulls":4},"Vol. 1 (1888)-11 (1898) are digital versions of reprint ed.: New York, N.Y. : Kraus Reprint Corp., 1964."]
[{"$nulls":4},"Title from title screen (viewed Dec. 12, 2002)."]
[{"$nulls":4},"Refereed/Peer-reviewed"]
[null,"2.","Record Nr.",null,"UNINA9910139806103321"]
[null,null,"Titolo",null,"Light Scattering from Microstructures : Lectures of the Summer School of Laredo, University of Cantabria, Held at Laredo, Spain, Sept.11-13, 1998 / / edited by Fernando Moreno, Francisco Gonzales"]
[null,null,"Pubbl/distr/stampa",null,"Berlin, Heidelberg : , : Springer Berlin Heidelberg : , : Imprint : Springer, , 2000"]
[null,null,"ISBN",null,"3-540-46614-2"]
[null,null,"Edizione",null,"[1st ed. 2000.]"]
[null,null,"Descrizione fisica",null,"1 online resource (XII, 300 p. 121 illus.)"]
[null,null,"Collana",null,"Lecture Notes in Physics, , 0075-8450 ; ; 534"]
[null,null,"Disciplina",null,"535.43"]
[null,null,"Soggetti",null,"Nanotechnology"]
[{"$nulls":4},"Solid state physics"]
[{"$nulls":4},"Spectrum analysis"]
[{"$nulls":4},"Microscopy"]
[{"$nulls":4},"Physics"]
[{"$nulls":4},"Solid State Physics"]
[{"$nulls":4},"Spectroscopy and Microscopy"]
[{"$nulls":4},"Physics, general"]
[null,null,"Lingua di pubblicazione",null,"Inglese"]
[null,null,"Formato",null,"Materiale a stampa"]
[null,null,null,"Livello bibliografico","Monografia"]
[null,null,null,"Note generali","Bibliographic Level Mode of Issuance: Monograph"]
[null,null,null,"Nota di bibliografia","Includes bibliographical references at the end of each chapters and index."]
[null,null,"Nota di contenuto",null,"Light scattering by submicron spherical particles on semiconductor surfaces -- to Light Scattering from Microstructures -- Theory -- Heaviside Operational Calculus and Electromagnetic Image Theory -- Mathematical Methods for Data Inversion -- Mueller Matrices -- Scattering by Particles on Substrates. Numerical Methods -- Light Scattering from a Sphere Near a Plane Interface -- Electromagnetic Scattering by Cylindrical Objects on Generic Planar Substrates: Cylindrical-Wave Approach -- T-Matrix Method for Light Scattering from a Particle on or Near an Infinite Surface -- Scattering of Polarized Light -- Properties of a Polarized Light-Beam Multiply Scattered by a Rayleigh Medium -- Polarization and Depolarization of Light -- Statistics of the Scattered Light -- Polarisation Fluctuations in Light Scattered by Small Particles -- Intensity Statistics of the Light Scattered by Particles on Surfaces -- Applications -- Microstructures in Rough Metal Surfaces: Electromagnetic Mechanism in Surface-Enhanced Raman Spectroscopy -- Light Scattering by Particles and Defects on "]
[{"$nulls":4},"Surfaces: Semiconductor Wafer Inspection -- From Scattering to Waveguiding: Photonic Crystal Fibres -- The Angular Distribution of Light Emitted by Sonoluminescent Bubbles -- Light Scattering by Regular Particles on Flat Substrates."]
[null,null,null,"Sommario/riassunto","With a tutorial approach, this book covers the most impor- tant aspects of the scattering of electromagnetic radiation from structures (isolated or on a substrate) whose size is comparable to the incident wavelength. Special emphasis is placed on the electromagnetic problem of microstructures lo- cated close to an interface by reviewing the most important numerical methods for calculating the scattered field. The polarization propagation and the statistics of scattered in- tensity in microstructured targets are also presented from a didactic point of view. The final part of the book is dedi- cated to the most significant applications in both basic and applied research: surface enhanced Raman scattering, monito- ring and detection of surface contamination by particles, optical communications, particle sizing and others."]