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[null,"1.","Record Nr.",null,"UNINA9910139565703321"]
[null,null,"Titolo",null,"Measurement errors in surveys [[electronic resource] /] / edited by Paul P. Biemer ... [et al.]"]
[null,null,"Pubbl/distr/stampa",null,"Hoboken, N.J., : Wiley-Interscience, c2004"]
[null,null,"ISBN",null,"1-283-33235-3"]
[{"$nulls":4},"9786613332356"]
[{"$nulls":4},"1-118-15038-4"]
[{"$nulls":4},"1-118-15037-6"]
[null,null,"Descrizione fisica",null,"1 online resource (804 p.)"]
[null,null,"Collana",null,"Wiley series in probability and statistics"]
[null,null,"Disciplina",null,"511.43"]
[null,null,"Soggetti",null,"Error analysis (Mathematics)"]
[{"$nulls":4},"Surveys"]
[{"$nulls":4},"Anàlisi d'error (Matemàtica)"]
[{"$nulls":4},"Enquestes"]
[{"$nulls":4},"Electronic books."]
[{"$nulls":4},"Llibres electrònics"]
[null,null,"Lingua di pubblicazione",null,"Inglese"]
[null,null,"Formato",null,"Materiale a stampa"]
[null,null,null,"Livello bibliografico","Monografia"]
[null,null,null,"Note generali","Description based upon print version of record."]
[null,null,null,"Nota di bibliografia","Includes bibliographical references (p. [687]-733) and index."]
[null,null,"Nota di contenuto",null,"section A. The questionnaire -- section B. Respondents and responses -- section C. Interviewers and other means of data collection -- section D. Measurement errors in the interview process -- section E. Modeling measurement errors and their effects on estimation and data analysis."]
[null,null,null,"Sommario/riassunto","WILEY-INTERSCIENCE PAPERBACK SERIES The Wiley-Interscience Paperback Series consists of selected books that have been made more accessible to consumers in an effort to increase global appeal and general circulation. With these new unabridged softcover volumes, Wiley hopes to extend the lives of these works by making them available to future generations of statisticians, mathematicians, and scientists. \"\"This book will be an aid to survey statisticians and to research workers who must work with survey data.\"\"-Short Book Reviews, International Statistical Institute Measurement Errors i"]